3D memory semiconductor devices and structures with bit-line pillars

    公开(公告)号:US11482540B2

    公开(公告)日:2022-10-25

    申请号:US17681767

    申请日:2022-02-26

    Abstract: A 3D memory device, the device comprising: a plurality of memory cells, wherein each memory cell of said plurality of memory cells comprises at least one memory transistor, wherein each of said at least one memory transistor comprises a source, a drain, and a channel; a plurality of bit-line pillars, wherein each bit-line pillar of said plurality of bit-line pillars is directly connected to a plurality of said source or said drain, wherein said bit-line pillars are vertically oriented, wherein said channel is horizontally oriented, wherein said plurality of memory cells comprise a partially or fully metalized source, and/or, a partially or fully metalized drain, and wherein said plurality of bit-line pillars comprise a thermally conductive path from said plurality of memory cells to an external surface of said device.

    DESIGN AUTOMATION FOR MONOLITHIC 3D DEVICES

    公开(公告)号:US20220318477A1

    公开(公告)日:2022-10-06

    申请号:US17841619

    申请日:2022-06-15

    Abstract: A method of designing 3D Integrated Circuits including: partitioning at least one design into at least two levels, a first and second level, where the first level includes logic, the second level includes memory; and then receiving a first placement of at least portion of the second level, where the first placement includes a placement of a first memory array, where the Circuit includes a plurality of connections between the first level and second level; performing a second placement of the first level based on the first placement, the performing a second placement includes using a placer computer executed, where the placer is a part of a Computer Aided Design tool, where the logic includes a first logic circuit configured to write data to the first memory array, and where performing the second placement includes placing the first logic circuit based on the first placement of the first memory array.

    3D SEMICONDUCTOR DEVICE AND STRUCTURE WITH BONDING

    公开(公告)号:US20220216070A1

    公开(公告)日:2022-07-07

    申请号:US17705392

    申请日:2022-03-28

    Abstract: A 3D semiconductor device a first level, where the first level includes a first layer which includes first transistors, where the first level includes a second layer, the second layer including first interconnections; a second level overlaying the first level, where the second level includes a third layer which includes second transistors, and where the second level includes a fourth layer, the fourth layer including second interconnections and a plurality of connection paths, where the plurality of connection paths provides connections from a plurality of the first transistors to a plurality of the second transistors, where the second level is bonded to the first level, where the bonded includes oxide to oxide bond regions, where the bonded includes metal to metal bond regions, where the second level includes at least one first ElectroStatic Discharge (ESD) circuit, and where the first level includes at least one second ESD circuit.

    3D MICRO DISPLAY SEMICONDUCTOR DEVICE AND STRUCTURE

    公开(公告)号:US20220208812A1

    公开(公告)日:2022-06-30

    申请号:US17699099

    申请日:2022-03-19

    Abstract: A 3D micro display, the 3D micro display including: a first level including a first single crystal layer, the first single crystal layer includes at least one LED driving circuit; a second level including a first plurality of light emitting diodes (LEDs), the first plurality of LEDs including a second single crystal layer, where the second level is disposed on top of the first level, where the second level includes at least ten individual first LED pixels; and a bonding structure, where the bonding structure includes oxide to oxide bonding.

    3D SEMICONDUCTOR DEVICE AND STRUCTURE

    公开(公告)号:US20220157983A1

    公开(公告)日:2022-05-19

    申请号:US17586730

    申请日:2022-01-27

    Abstract: A 3D semiconductor device, the device including: a first level, where the first level includes a first layer, the first layer including first transistors, and where the first level includes a second layer, the second layer including first interconnections; a second level overlaying the first level, where the second level includes a third layer, the third layer including second transistors, and where the second level includes a fourth layer, the fourth layer including second interconnections; a plurality of connection paths, where the plurality of connection paths provide first connections from a plurality of the first transistors to a plurality of the second transistors, where the second level is bonded to the first level, where the bonded includes oxide to oxide bond regions, where the bonded includes metal to metal bond regions, where the third layer includes crystalline silicon, and where the second level includes a plurality of capacitors.

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