-
公开(公告)号：USD1042357S1
公开(公告)日：2024-09-17
申请号：US29791272
申请日：2022-01-06
设计人： Mike Andres
摘要： FIG. 1 is a top front left perspective view of an anti pinching contact showing my new design;
FIG. 2 is a front plan view thereof.
FIG. 3 is a rear plan view thereof.
FIG. 4 is a left plan view thereof.
FIG. 5 is a right plan view thereof.
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The dot-dash broken lines depict the bounds of the claimed design, while all evenly spaced broken lines are directed to environment. The broken lines form no part of the claimed design.-
公开(公告)号：USD1042346S1
公开(公告)日：2024-09-17
申请号：US29843097
申请日：2022-06-17
设计人： Melissa Hasskamp , David Skodje , Mike Andres
摘要： FIG. 1 is a top front perspective view of a contact pin for integrated circuit testing showing our new design;
FIG. 2 is a bottom rear perspective view thereof;
FIG. 3 is a front elevation view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a left side elevation view thereof;
FIG. 6 is a right side elevation view thereof;
FIG. 7 is a top plan view thereof; and,
FIG. 8 is a bottom plan view thereof.-
公开(公告)号：USD1015282S1
公开(公告)日：2024-02-20
申请号：US29791709
申请日：2022-02-01
设计人： Valts Treibergs
摘要： FIG. 1 is a top front right side perspective view of a spring pin tip showing my new design;
FIG. 2 is a top rear left side perspective view thereof;
FIG. 3 is a front view thereof:
FIG. 4 is a rear view thereof;
FIG. 5 is a left view thereof;
FIG. 6 is a right view thereof;
FIG. 7 is a top view thereof; and,
FIG. 8 is a bottom view thereof.
The features shown in broken lines depict environmental subject matter only and form no part of the claimed design.-
公开(公告)号：US11867752B1
公开(公告)日：2024-01-09
申请号：US17732815
申请日：2022-04-29
IPC分类号： G01R31/28
CPC分类号： G01R31/2886
摘要： A contact assembly for a Kelvin testing system for testing integrated circuit devices is disclosed. The contact assembly includes at least one grouping of blades including a first force blade, a second force blade, a first sense blade, and a second sense blade; an electrical insulation layer disposed between the first force blade and the first sense blade and between the second force blade and the second sense blade; and an elongated elastomer. The elastomer is configured to be retained by the first force blade, the second force blade, the first sense blade, and the second sense blade. Each of the first force blade, the second force blade, the first sense blade, and the second sense blade includes a recess having an opening and sized to receive and retain at least a portion of the elastomer.
-
公开(公告)号：US20230184826A1
公开(公告)日：2023-06-15
申请号：US18051627
申请日：2022-11-01
发明人： Melissa Hasskamp , David Skodje , Mike Andres
CPC分类号： G01R31/2886 , G01R1/07314
摘要： A contactor assembly for a testing system for testing integrated circuit devices includes a contact, and a housing having a contact slot. The contact is receivable in the contact slot. The contact includes a tip, a body, and a tail; and is configured to be in a free state, a preload state, and an actuated state. The housing includes a housing backstop. When the contact is in the preload state, a contact backstop of the contact is biased against the housing backstop.
-
公开(公告)号：US20220229106A1
公开(公告)日：2022-07-21
申请号：US17713822
申请日：2022-04-05
发明人： Max A. Carideo
IPC分类号： G01R31/28
摘要： A compliant ground block for a testing system for testing integrated circuit devices is disclosed. The compliant ground block includes a plurality of electrically conductive blade pairs in a side by side generally parallel relationship. Blades in the plurality of blade pairs are configured to be longitudinally slidable with respect to each other. The block also includes at least one elastomer configured to retain the plurality of blade pairs. Each blade pair of the plurality of blade pairs includes a first blade (or a first blade assembly) and a second blade. The first blade (or the first blade assembly) and the second blade are configured to generate scrubbing motions when the device under test is being pressed down on the compliant ground block or is being released from the compliant ground block.
-
公开(公告)号：US20220107359A1
公开(公告)日：2022-04-07
申请号：US17494086
申请日：2021-10-05
发明人： Valts Treibergs , Pat Joyal , Leslie Fliegelman
IPC分类号： G01R31/28
摘要： A compliant ground block for a testing system for testing integrated circuit devices is disclosed. The compliant ground block includes a plurality of electrically conductive blades in a side by side generally parallel relationship. The blades are configured to be longitudinally slidable with respect to each other. The block also includes an elastomer configured to retain the plurality of blades. Each blade of the plurality of blades includes a first end and a second end opposite to the first end in the longitudinal direction. The plurality of blades is arranged so that the first end of each blade of the plurality of blades is opposite to the first end of an adjacent blade in the longitudinal direction so that the first end of one blade is adjacent the second end of the adjacent blade. The elastomer is at least tubular (e.g., hollow or solid cylindrical) in part and non-conductive.
-
公开(公告)号：US20220107357A1
公开(公告)日：2022-04-07
申请号：US17492347
申请日：2021-10-01
发明人： Bob Chartrand , David Johnson , Brian Sheposh , Mike Andres
IPC分类号： G01R31/28
摘要： A contactor assembly for a testing system is disclosed. The assembly includes a contact having a contact tail and a housing having a top surface and a bottom surface. A slot extends through the housing from the top surface to the bottom surface and defines a first inner side wall of the housing and a first inner end wall. The contact is receivable in the slot. The contact tail includes a sloped terminus. A retainer is disposed on the first inner side wall. When the sloped terminus is engaged with the first inner end wall, at least a portion of the retainer overlaps with the contact forming at an overlapping area in a cross-sectional view, thereby preventing removal of the contact from the top side of the housing.
-
公开(公告)号：US20210018533A1
公开(公告)日：2021-01-21
申请号：US17063279
申请日：2020-10-05
发明人： Jeffrey Sherry , Joel Erdman
摘要： A test socket for a device under test (DUT) is disclosed in several embodiments. One embodiment shows a test socket base (16) with apertures (30) for insertion of test pin insert blocks (28). The blocks are inserted top—in or bottom—in and are provided with registration bosses 80 and teeth 92 or other means for maintaining registration. Blocks are provided with dielectric constants to achieve different frequency response relative to other pins. To achieve great EMI and cross talk isolation, the socket may be made of aluminum with hard anodize coating to insulate test pins (32) from the housing.
-
公开(公告)号：US10761112B1
公开(公告)日：2020-09-01
申请号：US16124700
申请日：2018-09-07
摘要： A high density thin walled test device testing chips/ICs is disclosed. A housing includes a slot for a contact pin and a pair of elastomers. The pin has an arcuate recess to receive part of the elastomer. Likewise the housing includes a channel to receive part of the elastomer. The recess and channel together partially surround the elastomer but not completely to allow shear forces and expansion space for the elastomer as it is compressed by the channel and recess. In addition, a front channel extends from the top surface of the housing toward the bottom surface but leaving a floor to support the elastomer so that it does not warp the housing when compressed. Further, the channel or the recess may include retainers which prevent the elastomer from moving out of position when the pin is in an uncompressed state.
-
-
-
-
-
-
-
-
-
搜索结果
89 条记录 (耗时 0.023 秒)
