DEVICE AND METHOD FOR INVESTIGATING BULK MATERIAL

    公开(公告)号:US20200300748A1

    公开(公告)日:2020-09-24

    申请号:US16303815

    申请日:2017-05-24

    Applicant: SIKORA AG

    Inventor: Klaus Bremer

    Abstract: A device and method for reliably and accurately detecting impurities in a bulk material comprising two opposing tunnel sections arranged such that a bulk material stream flows between or through the tunnel sections. At least one of the tunnel sections has a lighting means configured for indirectly illuminating the bulk material stream. Furthermore, an optical detector receives the light emitted from the illuminated bulk material. The lighting means and optical detector are configured about the tunnel sections such that the optical radiation optical radiation does not pass directly from the lighting means to the bulk material, nor from the bulk material stream to the optical detector An evaluation apparatus, responsive to measured data from the optical detector, identifies impurities in the bulk material. The invention moreover relates to a method for operating such a device.

    Device and Method for Measuring the Diameter and/or the Wall Thickness of a Strand

    公开(公告)号:US20180112973A1

    公开(公告)日:2018-04-26

    申请号:US15555640

    申请日:2016-02-26

    Applicant: Sikora AG

    Inventor: Harald Sikora

    CPC classification number: G01B11/0625 G01J5/10 G01N21/3581

    Abstract: A device for measuring the diameter and/or the wall thickness of a strand that has a substantially circular cross-section and is guided through the device by guide means in the direction of its longitudinal axis includes at least one transmitter for transmitting terahertz radiation, at least one radiation optical system that conducts the terahertz radiation to a strand guided by the device, at least one reflector for the terahertz radiation arranged opposite a transmitter and behind the strand in the radiation direction of the terahertz radiation, at least one receiver for receiving the terahertz radiation reflected at the strand and/or the reflector, and an evaluation apparatus that determines the diameter and/or the wall thickness of the strand using the measuring signals received by the at least one receiver. A corresponding method is also described.

Patent Agency Ranking