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公开(公告)号:US12157263B2
公开(公告)日:2024-12-03
申请号:US17281615
申请日:2019-09-30
Applicant: Sikora AG
Inventor: Harald Sikora , Christian Schalich
IPC: B29C48/92 , G01N21/3581 , G01N21/41 , G01N21/896
Abstract: A device for controlling a production system for planar or strand-shaped bodies comprises a measurement region and a conveying apparatus configured to convey the body through the measurement region. A transmission apparatus is configured to irradiate the body with measurement radiation in the measurement region. A detection apparatus is configured to detect the measurement radiation reflected by the body. An evaluation apparatus is configured to use the measurement radiation detected by the detection apparatus to determine at least one of: (1) a refractive index of the body; and (2) an absorption of the measurement radiation by the body. A control apparatus is configured to control at least one production parameter of a production system based on the at least one of: (1) the refractive index of the body; and (2) the absorption of the measurement radiation by the body.
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公开(公告)号:US20240377320A1
公开(公告)日:2024-11-14
申请号:US18659184
申请日:2024-05-09
Applicant: Sikora AG
Inventor: Christian Frank , Kolja Tobias Schuh , Harald Sikora
IPC: G01N21/3581 , G01B11/06 , G01B11/12 , G01N21/3563
Abstract: A measuring device for measuring a geometric parameter of an object includes a transceiver including a transmission apparatus structured to emit terahertz radiation onto the object. The terahertz radiation is at least partially reflected by the object. A receiving apparatus is structured to receive the terahertz radiation emitted by the transmission apparatus onto the object. A reflector is structured to reflect the terahertz radiation emitted by the transmission apparatus after the terahertz radiation has passed through at least one portion of the object. A holder is structured to support the transceiver and the reflector, and to position the transceiver and the reflector opposite one another on different sides of the object or on different sides of a wall of the object.
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公开(公告)号:US20220268576A1
公开(公告)日:2022-08-25
申请号:US17627456
申请日:2020-06-20
Applicant: Sikora AG
Inventor: Armin Holle , Christian Frank
Abstract: A device for measuring a strand that is tubular includes a first radiation source to emit terahertz radiation in a first measurement region from an inside onto an inner surface of the strand. A first radiation receiver receives terahertz radiation reflected by the strand in a second measurement region. A first evaluation apparatus determines at least one geometric parameter of the strand in the first measurement region. A second radiation source emits terahertz radiation in the second measurement region from an outside onto an outer surface of the strand. A second radiation receiver receives terahertz radiation reflected by the strand in the second measurement region. A second evaluation apparatus determines at least one geometric parameter of the strand in the second measurement region. A third evaluation apparatus determines a change in the at least one geometric parameter of the strand between the first and second measurement regions.
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公开(公告)号:US20210172727A1
公开(公告)日:2021-06-10
申请号:US17263336
申请日:2019-07-22
Applicant: Sikora AG
Inventor: Harald Sikora
Abstract: A device for performing a measurement of a strand-shaped object comprises at least one transmission apparatus configured to emit measuring radiation onto the strand-shaped object, which reflects the measuring radiation. At least one receiving apparatus is configured to receive the measuring radiation reflected by the strand-shaped object. An evaluation apparatus is configured to determine at least one of (1) the diameter and (2) the outer contour of the strand-shaped object based on the measuring radiation received by the at least one receiving apparatus. At least one retroreflector is configured to surround at least a portion of the strand-shaped object and retroreflect at least some of the measuring radiation reflected by the strand-shaped object.
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公开(公告)号:US10323986B2
公开(公告)日:2019-06-18
申请号:US15679287
申请日:2017-08-17
Applicant: Sikora AG
Inventor: Norbert Geerken , Hilmar Bolte , Harald Sikora
Abstract: A method for determining the temperature of a strand comprises disposing the strand along a background radiator of known temperature. Receiving the strand using a spatially resolving thermal imaging sensor in front of the background radiator while the strand is being disposed along its longitudinal axis. Forming an integral across a measuring value area, the integral configured to detect a complete strand portion located in front of the background radiator of the thermal imaging sensor. deducing the temperature of the strand by comparing the formed integral with a reference value.
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公开(公告)号:US09797712B2
公开(公告)日:2017-10-24
申请号:US14441420
申请日:2013-10-09
Applicant: Sikora AG
Inventor: Werner Blohm , Harald Sikora
CPC classification number: G01B11/14 , G01B11/028 , G01B11/105
Abstract: A method for determining the position of at least one edge of an object, in particular a strand, comprises illuminating the object using light from at least one coherent light source, wherein diffraction borders are generated on both geometric boundaries of the shadow caused by the object. The method also includes recording the spatial intensity profile of at least one diffraction border using at least one single or multi line optical sensor, differentiating the at least one recorded intensity profile with respect to location and plotting it using a squared location axis, and comparing the at least one recorded intensity profile, differentiated with respect to location and plotted using a squared location axis, to at least one periodic reference intensity profile. The position of at least one edge of the object is determined on the basis of the completed comparison.
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公开(公告)号:US20240369480A1
公开(公告)日:2024-11-07
申请号:US18026708
申请日:2021-08-17
Applicant: Sikora AG
Inventor: Harald Sikora , Armin Holle
IPC: G01N21/41 , G01N21/3581
Abstract: A method for determining a refractive index in a surface region of an object from a production system which has not cooled to an ambient temperature includes emitting terahertz radiation from a transmitter at an angle of incidence to the surface region of the object. The terahertz radiation is reflected from the surface region of the object and received by a receiver. The refractive index of the surface region of the object from a ratio of the emitted and reflected terahertz radiation is determined using an evaluator in communication with the transmitter and the receiver. The influence of surface properties of the object on a portion of the reflected terahertz radiation is taken into account when determining the refractive index.
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公开(公告)号:US11519718B2
公开(公告)日:2022-12-06
申请号:US17263336
申请日:2019-07-22
Applicant: Sikora AG
Inventor: Harald Sikora
Abstract: A device for performing a measurement of a strand-shaped object comprises at least one transmission apparatus configured to emit measuring radiation onto the strand-shaped object, which reflects the measuring radiation. At least one receiving apparatus is configured to receive the measuring radiation reflected by the strand-shaped object. An evaluation apparatus is configured to determine at least one of (1) the diameter and (2) the outer contour of the strand-shaped object based on the measuring radiation received by the at least one receiving apparatus. At least one retroreflector is configured to surround at least a portion of the strand-shaped object and retroreflect at least some of the measuring radiation reflected by the strand-shaped object.
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公开(公告)号:US11249006B2
公开(公告)日:2022-02-15
申请号:US16303815
申请日:2017-05-24
Applicant: Sikora AG
Inventor: Klaus Bremer
Abstract: A device and method for reliably and accurately detecting impurities in a bulk material comprising two opposing tunnel sections arranged such that a bulk material stream flows between or through the tunnel sections. At least one of the tunnel sections has a lighting means configured for indirectly illuminating the bulk material stream. Furthermore, an optical detector receives the light emitted from the illuminated bulk material. The lighting means and optical detector are configured about the tunnel sections such that the optical radiation optical radiation does not pass directly from the lighting means to the bulk material, nor from the bulk material stream to the optical detector An evaluation apparatus, responsive to measured data from the optical detector, identifies impurities in the bulk material. The invention moreover relates to a method for operating such a device.
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公开(公告)号:US10684119B2
公开(公告)日:2020-06-16
申请号:US15555640
申请日:2016-02-26
Applicant: Sikora AG
Inventor: Harald Sikora
IPC: G01N21/3581 , G01B11/06 , G01J5/10
Abstract: A device for measuring the diameter and/or the wall thickness of a strand that has a substantially circular cross-section and is guided through the device by guide means in the direction of its longitudinal axis includes at least one transmitter for transmitting terahertz radiation, at least one radiation optical system that conducts the terahertz radiation to a strand guided by the device, at least one reflector for the terahertz radiation arranged opposite a transmitter and behind the strand in the radiation direction of the terahertz radiation, at least one receiver for receiving the terahertz radiation reflected at the strand and/or the reflector, and an evaluation apparatus that determines the diameter and/or the wall thickness of the strand using the measuring signals received by the at least one receiver. A corresponding method is also described.
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