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    Force Sensing of Inputs Through Strain Analysis
    31.
    发明申请
    Force Sensing of Inputs Through Strain Analysis 审中-公开

    公开(公告)号：US20180217708A1

    公开(公告)日：2018-08-02

    申请号：US15933113

    申请日：2018-03-22

    Applicant: Apple Inc.

    Inventor： Storrs T. Hoen ,  Kristina A. Babiarz ,  Miguel C. Christophy ,  Romain A. Teil ,  Sinan Filiz ,  Vivek Katiyar

    IPC: G06F3/041 ,  G06F3/0488

    CPC classification number: G06F3/0414 ,  G06F3/041 ,  G06F3/0412 ,  G06F3/0416 ,  G06F3/0488 ,  G06F2203/04103

    Abstract: An electronic device has a force sensor that determines a measure of applied force from a user contacting a cover glass of the device. In one embodiment, a frame at least partially encloses an interior of the electronic device and has an open end. A cover glass covers the open end of the frame and is movably connected to the frame to allow movement of the cover glass in response to one or more forces applied to an external surface of the cover glass. A plurality of strain probes is positioned under the cover glass, between the cover glass and the frame, and is arranged to output a plurality of strain signals response to the one or more forces applied to the cover glass. A force processing module is configured to at least calculate an amount of force applied to the cover glass based on the plurality of strain signals.

    Strain Sensors in an Electronic Device
    34.
    发明申请
    Strain Sensors in an Electronic Device 审中-公开

    公开(公告)号：US20170191884A1

    公开(公告)日：2017-07-06

    申请号：US15457992

    申请日：2017-03-13

    Applicant: Apple Inc.

    Inventor： Michael Vosgueritchian ,  John Stephen Smith ,  Sinan Filiz ,  James E. Pedder ,  Tingjun Xu ,  Xiaonan Wen

    IPC: G01L1/22 ,  G06F3/041 ,  G06F3/045

    CPC classification number: G01L1/225 ,  G01L1/22 ,  G01L1/2287 ,  G06F3/0414 ,  G06F3/045 ,  G06F3/0488

    Abstract: One or more strain sensors can be included in an electronic device. Each strain sensor includes a strain sensitive element and one or more strain signal lines connected directly to the strain sensitive element. The strain sensor(s) are used to detect a force that is applied to the electronic device, to a component in the electronic device, and/or to an input region or surface of the electronic device. A strain sensitive element is formed or processed to have a first gauge factor and the strain signal line(s) is formed or processed to have a different second gauge factor. Additionally or alternatively, a strain sensitive element is formed or processed to have a first conductance and the strain signal line(s) is formed or processed to have a different second conductance.

    Distributed Sensor Network for Measurement of Biometric Parameter
    39.
    发明申请
    Distributed Sensor Network for Measurement of Biometric Parameter 有权

    公开(公告)号：US20230085860A1

    公开(公告)日：2023-03-23

    申请号：US17947823

    申请日：2022-09-19

    Applicant: Apple Inc.

    Inventor： Zachary Gaubert ,  Jacky G. Ko ,  Han Bi ,  Saahil Mehra ,  Sinan Filiz ,  Xinsheng Chu ,  Adriaan Taal

    IPC: A61B5/01 ,  A61B5/00

    Abstract: One embodiment described herein takes the form of a wearable electronic device, such as a watch, including a housing, a memory and a processor located in the housing, and three or more sensors. Each sensor of the three or more sensors is configured to generate a measurement of a parameter. Each sensor of the three or more sensors is located in a different region in the housing. The processor is configured to execute instructions stored in the memory. In response to execution of the instructions by the processor, the processor is configured to generate an adjusted measurement of the biometric parameter using at least the measurements of the parameter generated by the three or more sensors. The parameter is a temperature, and the biometric parameter is a body temperature of a user.

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