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31.发明授权公开(公告)号：US11134907B2
公开(公告)日：2021-10-05
申请号：US16782584
申请日：2020-02-05
Applicant: General Electric Company
Inventor： Xue Rui , Mingye Wu , Yannan Jin , Peter Michael Edic , Bruno Kristiaan Bernard De Man
Abstract: A signal processing method is disclosed, which includes detecting a total intensity of X-rays passing through an object comprising multiple materials; obtaining at least one set of basis information of basis material information of the multiple materials and basis component information of photon-electric absorption basis component and Compton scattering basis component of the object; estimating a scatter intensity component of the detected X-rays based on the at least one set of basis information and the detected total intensity; and obtaining an intensity estimate of primary X-rays incident on a detector based on the detected total intensity and the estimated scatter intensity component. An imaging system adopting the above signal processing method is also disclosed.
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32.发明申请公开(公告)号：US20200170599A1
公开(公告)日：2020-06-04
申请号：US16782584
申请日：2020-02-05
Applicant: General Electric Company
Inventor： Xue Rui , Mingye Wu , Yannan Jin , Peter Michael Edic , Bruno Kristiaan Bernard De Man
Abstract: A signal processing method is disclosed, which includes detecting a total intensity of X-rays passing through an object comprising multiple materials; obtaining at least one set of basis information of basis material information of the multiple materials and basis component information of photon-electric absorption basis component and Compton scattering basis component of the object; estimating a scatter intensity component of the detected X-rays based on the at least one set of basis information and the detected total intensity; and obtaining an intensity estimate of primary X-rays incident on a detector based on the detected total intensity and the estimated scatter intensity component. An imaging system adopting the above signal processing method is also disclosed.
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公开(公告)号：US10571579B2
公开(公告)日：2020-02-25
申请号：US15004214
申请日：2016-01-22
Applicant: General Electric Company
Inventor： Yannan Jin , Geng Fu , Peter Michael Edic , Brian David Yanoff , Jianjun Guo
Abstract: A detector is described having readout electronics integrated in the photodetector layer. The detector may be configured to acquire both energy-integrated and photon-counting data. In one implementation, the detector is also configured with control logic to select between the jointly generated photon-counting and energy-integrated data.
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公开(公告)号：US10507005B2
公开(公告)日：2019-12-17
申请号：US15273043
申请日：2016-09-22
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Yannan Jin , Geng Fu , Peter M. Edic , Hewei Gao
Abstract: There is set forth herein a method including performing with an X-ray detector array of a CT imaging system one or more calibration scans, wherein the one or more calibration scans include obtaining for each element of the first through Nth elements of the X-ray detector array one or more calibration measurements; and updating a spectral response model for each element of the first through Nth elements using the one or more calibration measurements. In another aspect, a CT imaging system can perform imaging, e.g. including material decomposition (MD) imaging, using updated spectral response models for elements of an X-ray detector array. The spectral response models can be updated using a calibration process so that different elements of an X-ray detector array have different spectral response models.
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公开(公告)号：US20190336091A1
公开(公告)日：2019-11-07
申请号：US16511218
申请日：2019-07-15
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Yannan Jin , Peter Michael Edic , Xue Rui , Geng Fu
Abstract: The present approaches relates to the use of silicon-based energy-discriminating, photon-counting detectors, such as for use in X-ray based imaging including computed tomography. The described approaches address the resolution and classification of X-ray photons affected by Compton scatter, which may be detected as having energy levels below their proper level due to collision or deflection events.
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Patent Agency Ranking
公开(公告)号：US20190216413A1
公开(公告)日：2019-07-18
申请号：US15872169
申请日：2018-01-16
Applicant: General Electric Company
Inventor： Yannan Jin , Jiahua Fan , Mingye Wu , Feng Chen , Bruno Kristiaan Bernard De Man
CPC classification number: A61B6/405 , A61B6/032 , A61B6/4021 , A61B6/4208 , A61B6/4435 , A61B6/482
Abstract: The present approach relates to avoiding azimuthal blur in a computed tomography context, such as in dual energy imaging with fast kV switching. In accordance with certain aspects, the focal spot position is held stationary in the patient coordinate system within each respective view and the detector signals within the view are summed. In one embodiment, this results in the low and high energy views within the signal being collected from the same position within the patient coordinate system.
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公开(公告)号：US10162066B2
公开(公告)日：2018-12-25
申请号：US15425800
申请日：2017-02-06
Applicant: General Electric Company
Inventor： Geng Fu , Yannan Jin , Peter Michael Edic , Feng Chen
Abstract: The present approach relates to the use of energy-resolved, photon-counting detectors, such as CZT- or CdTe-based detectors, to acquire spectral information that is not available with conventional energy-integrating detectors. In certain embodiments, the present approach discussed reduces or eliminates spectral contamination incurred by transient signals in neighboring pixels in designs employing coincidence logic and shaping amplifiers with short shaping times.
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公开(公告)号：US20180224564A1
公开(公告)日：2018-08-09
申请号：US15425800
申请日：2017-02-06
Applicant: General Electric Company
Inventor： Geng Fu , Yannan Jin , Peter Michael Edic , Feng Chen
IPC: G01T1/24
CPC classification number: G01T1/247 , G01T1/17 , G01T1/2928
Abstract: The present approach relates to the use of energy-resolved, photon-counting detectors, such as CZT- or CdTe-based detectors, to acquire spectral information that is not available with conventional energy-integrating detectors. In certain embodiments, the present approach discussed reduces or eliminates spectral contamination incurred by transient signals in neighboring pixels in designs employing coincidence logic and shaping amplifiers with short shaping times.
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公开(公告)号：US09888894B2
公开(公告)日：2018-02-13
申请号：US14977086
申请日：2015-12-21
Applicant: General Electric Company
Inventor： Uwe Wiedmann , Peter Michael Edic , Bruno Kristiaan Bernard De Man , Naveen Stephan Chandra , Jed Douglas Pack , Yannan Jin , Denis Perrillat-Amede , Jean-Francois Larroux
CPC classification number: A61B6/482 , A61B6/032 , A61B6/405 , A61B6/5205 , A61B6/5258
Abstract: Acquisition of X-ray transmission data at three or more energy levels is described. Various implementations utilize generator waveforms that utilize fast-switching, slow-switching, or a combination of fast- and slow-switching to transition between X-ray energy levels. In addition, various sampling arrangements for sampling and/or binning three or more energy levels of X-ray transmission data are discussed. The use of these data in subsequent processing steps, such for material decomposition and/or improvement of dual-energy material decomposition processing, are also described.
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40.发明申请公开(公告)号：US20170215829A1
公开(公告)日：2017-08-03
申请号：US15263565
申请日：2016-09-13
Applicant: General Electric Company
Inventor： Xue Rui , Mingye Wu , Yannan Jin , Peter Michael Edic , Bruno Kristiaan Bernard De Man
CPC classification number: A61B6/482 , A61B6/032 , A61B6/4241 , A61B6/50 , A61B6/5205
Abstract: A signal processing method is disclosed, which includes detecting a total intensity of X-rays passing through an object comprising multiple materials; obtaining at least one set of basis information of basis material information of the multiple materials and basis component information of photon-electric absorption basis component and Compton scattering basis component of the object; estimating a scatter intensity component of the detected X-rays based on the at least one set of basis information and the detected total intensity; and obtaining an intensity estimate of primary X-rays incident on a detector based on the detected total intensity and the estimated scatter intensity component. An imaging system adopting the above signal processing method is also disclosed.
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