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公开(公告)号:US10398394B2
公开(公告)日:2019-09-03
申请号:US15400798
申请日:2017-01-06
Applicant: General Electric Company
Inventor: Yannan Jin , Peter Michael Edic , Xue Rui , Geng Fu
Abstract: The present approaches relates to the use of silicon-based energy-discriminating, photon-counting detectors, such as for use in X-ray based imaging including computed tomography. The described approaches address the resolution and classification of X-ray photons affected by Compton scatter, which may be detected as having energy levels below their proper level due to collision or deflection events.
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公开(公告)号:US20180177481A1
公开(公告)日:2018-06-28
申请号:US15591932
申请日:2017-05-10
Applicant: General Electric Company
Inventor: Biju Jacob , Brian David Yanoff , Xue Rui
CPC classification number: A61B6/585 , A61B6/032 , A61B6/4233 , A61B6/4241 , G01N23/046 , G01N2223/303 , G01N2223/33
Abstract: The present approach relates to self-calibration of CT detectors based on detected misalignment of the detector and X-ray source. The present approach make the detector more robust to changes against temperature and focal spot movements. The diagnostic image generated by energy resolving calibrated response signals is able to present enhanced features compared to conventional CT based diagnostic images.
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3.
公开(公告)号:US11134907B2
公开(公告)日:2021-10-05
申请号:US16782584
申请日:2020-02-05
Applicant: General Electric Company
Inventor: Xue Rui , Mingye Wu , Yannan Jin , Peter Michael Edic , Bruno Kristiaan Bernard De Man
Abstract: A signal processing method is disclosed, which includes detecting a total intensity of X-rays passing through an object comprising multiple materials; obtaining at least one set of basis information of basis material information of the multiple materials and basis component information of photon-electric absorption basis component and Compton scattering basis component of the object; estimating a scatter intensity component of the detected X-rays based on the at least one set of basis information and the detected total intensity; and obtaining an intensity estimate of primary X-rays incident on a detector based on the detected total intensity and the estimated scatter intensity component. An imaging system adopting the above signal processing method is also disclosed.
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4.
公开(公告)号:US20200170599A1
公开(公告)日:2020-06-04
申请号:US16782584
申请日:2020-02-05
Applicant: General Electric Company
Inventor: Xue Rui , Mingye Wu , Yannan Jin , Peter Michael Edic , Bruno Kristiaan Bernard De Man
Abstract: A signal processing method is disclosed, which includes detecting a total intensity of X-rays passing through an object comprising multiple materials; obtaining at least one set of basis information of basis material information of the multiple materials and basis component information of photon-electric absorption basis component and Compton scattering basis component of the object; estimating a scatter intensity component of the detected X-rays based on the at least one set of basis information and the detected total intensity; and obtaining an intensity estimate of primary X-rays incident on a detector based on the detected total intensity and the estimated scatter intensity component. An imaging system adopting the above signal processing method is also disclosed.
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公开(公告)号:US20190336091A1
公开(公告)日:2019-11-07
申请号:US16511218
申请日:2019-07-15
Applicant: GENERAL ELECTRIC COMPANY
Inventor: Yannan Jin , Peter Michael Edic , Xue Rui , Geng Fu
Abstract: The present approaches relates to the use of silicon-based energy-discriminating, photon-counting detectors, such as for use in X-ray based imaging including computed tomography. The described approaches address the resolution and classification of X-ray photons affected by Compton scatter, which may be detected as having energy levels below their proper level due to collision or deflection events.
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6.
公开(公告)号:US20170215829A1
公开(公告)日:2017-08-03
申请号:US15263565
申请日:2016-09-13
Applicant: General Electric Company
Inventor: Xue Rui , Mingye Wu , Yannan Jin , Peter Michael Edic , Bruno Kristiaan Bernard De Man
CPC classification number: A61B6/482 , A61B6/032 , A61B6/4241 , A61B6/50 , A61B6/5205
Abstract: A signal processing method is disclosed, which includes detecting a total intensity of X-rays passing through an object comprising multiple materials; obtaining at least one set of basis information of basis material information of the multiple materials and basis component information of photon-electric absorption basis component and Compton scattering basis component of the object; estimating a scatter intensity component of the detected X-rays based on the at least one set of basis information and the detected total intensity; and obtaining an intensity estimate of primary X-rays incident on a detector based on the detected total intensity and the estimated scatter intensity component. An imaging system adopting the above signal processing method is also disclosed.
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公开(公告)号:US10827992B2
公开(公告)日:2020-11-10
申请号:US16511218
申请日:2019-07-15
Applicant: GENERAL ELECTRIC COMPANY
Inventor: Yannan Jin , Peter Michael Edic , Xue Rui , Geng Fu
Abstract: The present approaches relates to the use of silicon-based energy-discriminating, photon-counting detectors, such as for use in X-ray based imaging including computed tomography. The described approaches address the resolution and classification of X-ray photons affected by Compton scatter, which may be detected as having energy levels below their proper level due to collision or deflection events.
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公开(公告)号:US10433811B2
公开(公告)日:2019-10-08
申请号:US15591932
申请日:2017-05-10
Applicant: General Electric Company
Inventor: Biju Jacob , Brian David Yanoff , Xue Rui
IPC: A61B6/00 , A61B6/03 , G01N23/046
Abstract: The present approach relates to self-calibration of CT detectors based on detected misalignment of the detector and X-ray source. The present approach make the detector more robust to changes against temperature and focal spot movements. The diagnostic image generated by energy resolving calibrated response signals is able to present enhanced features compared to conventional CT based diagnostic images.
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公开(公告)号:US10213172B2
公开(公告)日:2019-02-26
申请号:US15044787
申请日:2016-02-16
Applicant: GENERAL ELECTRIC COMPANY
Inventor: Yannan Jin , Bruno Kristiaan Bernard De Man , Peter Michael Edic , Paul Francis Fitzgerald , Xue Rui , Yangyang Yao , Zhye Yin , Uwe Wiedmann
Abstract: An imaging method includes executing a low-dose preparatory scan to an object by applying tube voltages and tube currents in an x-ray source, and generating a first image of the object corresponding to the low-dose preparatory scan. The method further includes generating image quality estimates and dose estimates view by view at least based on the first image. The method includes optimizing the tube voltages and the tube currents to generate optimal profiles for the tube voltage and the tube current. At least one of the optimal profiles for the tube voltage and the tube current is generated based on the image quality estimates and the dose estimates. The method includes executing an acquisition scan by applying the tube voltages and the tube currents based on the optimal profiles and generating a second image of the object corresponding to the acquisition scan. An imaging system is also provided.
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公开(公告)号:US10119924B2
公开(公告)日:2018-11-06
申请号:US15087560
申请日:2016-03-31
Applicant: General Electric Company
Inventor: Xue Rui , Geng Fu , Jianjun Guo , Bruno Kristiaan Bernard De Man , Brian David Yanoff
IPC: G01N23/046 , G01T1/17 , G01T1/29 , G01N23/083
Abstract: The present approach relates to a detector design that allows detector-based wobble using an electronic control scheme. In one implementation, each detector pixel is divided into sub-pixels. The readout of the sub-pixels can be binned with minimal noise penalty to enable the detector wobble without physically shifting the detector or alternating the physical focal spot location, though, as discussed herein alternation of the focal spot location may be used in conjunction with the present approach to further improve radial and longitudinal imaging resolution as well as suppressing artifacts resulted by limited spatial sampling.
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