公开(公告)号：US07510416B2

公开(公告)日：2009-03-31

申请号：US11889440

申请日：2007-08-13

申请人： Yoshiyuki Sato ,  Mitsuo Fujimura ,  Hideo Araki ,  Hideki Zenitani

发明人： Yoshiyuki Sato ,  Mitsuo Fujimura ,  Hideo Araki ,  Hideki Zenitani

IPC分类号： H01R13/62

CPC分类号： H05K7/1409

摘要： A PIU plug-in/plug-off mechanism for an electronic apparatus, which is capable of efficiently applying a force required for a plugging-in/off operation of connectors to a printed board by pressing a portion of the printed board close to a backplane. An operating handle of a card lever is turned counterclockwise to thereby bring a push pin into abutment with a rear edge of an open recess. When the card lever is further turned in this state, a pressing force for moving a plug-in unit in the insertion direction acts on an engaging member via an arm. This starts fitting the printed board into a plug-in connector without causing warping of the printed board.

摘要翻译： 一种用于电子设备的PIU插入/插拔机构，其能够通过将印刷电路板的靠近背板的一部分按压而有效地将连接器的插入/断开操作所需的力施加到印刷电路板 。 卡杆的操作手柄逆时针转动，从而使推销与开口凹部的后边缘相邻接。 当在该状态下进一步转动卡片杆时，用于使插入单元沿插入方向移动的按压力通过臂作用在接合构件上。 这将开始将印刷电路板安装到插入式连接器中，而不会导致印刷电路板翘曲。

公开(公告)号：US20090082979A1

公开(公告)日：2009-03-26

申请号：US12236309

申请日：2008-09-23

申请人： Yoshiyuki Sato

发明人： Yoshiyuki Sato

IPC分类号： G01R31/26

CPC分类号： G01R31/2831

摘要： A defect analyzer has a region dividing section configured to divide a defect analyzing region of a wafer into a plurality of grid squares, the wafer having a circuit pattern formed thereon, a pattern feature quantity extracting section configured to extract a pattern feature quantity based on design data of the circuit pattern for each of the grid squares, a region classifying section configured to classify the plurality of grid squares into a plurality of groups based on the pattern feature quantities, a defect coordinate matching section configured to match defect information having been detected in the defect analyzing region with the defect analyzing region, a defect size distribution calculating section configured to calculate a defect size distribution in each of the plurality of groups, a distribution comparing section configured to compare the defect size distribution and a predetermined estimation distribution in each of the plurality of groups and calculate a difference, and a region extracting section configured to output the defect information corresponding to the group having the difference equal to or smaller than the threshold value.

摘要翻译： 缺陷分析器具有：区域分割部，其将晶片的缺陷分析区域分割为多个格子，其上形成有电路图案的晶片;图案特征量提取部，其基于设计提取图案特征量 用于每个网格方格的电路图案的数据;区域分类部，被配置为基于所述图案特征量将所述多个网格方格分类成多个组;缺陷坐标匹配部，被配置为匹配已经检测到的缺陷信息; 缺陷分析区域，缺陷分析区域，缺陷尺寸分布计算部分，被配置为计算多个组中的每个组中的缺陷尺寸分布;分配比较部分，被配置为将缺陷尺寸分布和每个中的预定估计分布进行比较 多个组和计算差异，以及 区域提取部分，被配置为输出与具有等于或小于阈值的差异的组对应的缺陷信息。

公开(公告)号：US20080240544A1

公开(公告)日：2008-10-02

申请号：US12081287

申请日：2008-04-14

申请人： Yoshiyuki Sato

发明人： Yoshiyuki Sato

IPC分类号： G06K9/03

CPC分类号： G01R31/2831

摘要： A system for creating an inspection recipe, includes an inspection target selection module selecting an inspection target; a critical area extraction module extracting corresponding critical areas for defect sizes in the inspection target; a defect density prediction module extracting corresponding defect densities predicted by defects to be detected in the inspection target for the defect sizes; a killer defect calculation module calculating corresponding numbers of killer defects in the defect sizes based on the critical areas and the defect densities; and a detection expectation calculation module calculating another numbers of the killer defects expected to be detected for prospective inspection recipes determining rates of defect detection for the defect sizes, based on the numbers of the killer defects and the rates of defect detection prescribed in the prospective inspection recipes.

摘要翻译： 一种用于创建检查配方的系统，包括：选择检查对象的检查对象选择模块; 关键区域提取模块，提取检测对象缺陷尺寸的相应关键区域; 缺陷密度预测模块，提取由所述缺陷尺寸在所述检查对象中检测出的缺陷所预测的相应的缺陷密度; 杀伤缺陷计算模块，基于关键区域和缺陷密度计算缺陷尺寸中的杀伤缺陷的相应数量; 以及检测期望计算模块，基于预期检查中规定的凶手缺陷的数量和缺陷检测的数量，计算针对预期检查配方确定的针对缺陷尺寸的缺陷检测率的预期的检测缺陷的缺陷缺陷的数量 食谱

公开(公告)号：US07401004B2

公开(公告)日：2008-07-15

申请号：US11367360

申请日：2006-03-06

申请人： Yoshiyuki Sato

发明人： Yoshiyuki Sato

IPC分类号： G06F19/00

CPC分类号： H01L22/20 ,  G06T7/0004 ,  G06T2207/30148 ,  H01L2924/0002 ,  H01L2924/00

摘要： A system for reviewing defects includes an analysis module configured to analyze defect information of a plurality of intermediate products, the defect information including information of an amount of defects classified by sizes of the defects existing in each of the intermediate products; a failure magnitude calculation module configured to calculate a systematic failure magnitude of the intermediate products caused by fabrication procedure of the intermediate products; a classification module configured to classify a calculated result of the systematic failure magnitude; and a review target selection module configured to select intermediate products becoming review targets.

摘要翻译： 用于检查缺陷的系统包括：分析模块，被配置为分析多个中间产品的缺陷信息，所述缺陷信息包括根据每个所述中间产品中存在的缺陷的大小分类的缺陷量的信息; 失效量值计算模块，被配置为计算由所述中间产品的制造程序引起的中间产品的系统故障量值; 分类模块，被配置为对系统故障量值的计算结果进行分类; 以及审查对象选择模块，被配置为选择成为审查对象的中间产品。

公开(公告)号：US20080045051A1

公开(公告)日：2008-02-21

申请号：US11889440

申请日：2007-08-13

申请人： Yoshiyuki Sato ,  Mitsuo Fujimura ,  Hideo Araki ,  Hideki Zenitani

发明人： Yoshiyuki Sato ,  Mitsuo Fujimura ,  Hideo Araki ,  Hideki Zenitani

IPC分类号： H01R12/00

CPC分类号： H05K7/1409

摘要： A PIU plug-in/plug-off mechanism for an electronic apparatus, which is capable of efficiently applying a force required for a plugging-in/off operation of connectors to a printed board by pressing a portion of the printed board close to a backplane. An operating handle of a card lever is turned counterclockwise to thereby bring a push pin into abutment with a rear edge of an open recess. When the card lever is further turned in this state, a pressing force for moving a plug-in unit in the insertion direction acts on an engaging member via an arm. This starts fitting the printed board into a plug-in connector without causing warping of the printed board.

摘要翻译： 一种用于电子设备的PIU插入/插拔机构，其能够通过将印刷电路板的靠近背板的一部分按压而有效地将连接器的插入/断开操作所需的力施加到印刷电路板 。 卡杆的操作手柄逆时针转动，从而使推销与开口凹部的后边缘相邻接。 当在该状态下进一步转动卡片杆时，用于使插入单元沿插入方向移动的按压力通过臂作用在接合构件上。 这将开始将印刷电路板安装到插入式连接器中，而不会导致印刷电路板翘曲。

公开(公告)号：US20080043451A1

公开(公告)日：2008-02-21

申请号：US11715953

申请日：2007-03-09

申请人： Yoshiyuki Sato ,  Mitsuo Fujimura ,  Hideo Araki ,  Hideki Zenitani

发明人： Yoshiyuki Sato ,  Mitsuo Fujimura ,  Hideo Araki ,  Hideki Zenitani

IPC分类号： H05K7/14

CPC分类号： H05K7/1461

摘要： A plug-in unit-mounting structure which makes it possible to efficiently mount plug-in units having different sizes in all slots. PIUs of printed board type which are different in size are mounted using respective mounting frames associated therewith. Box-shaped PIUs are also mounted using respective mounting frame associated therewith. However, no guide rail is provided on the metal shelf per se, for guiding each PIU for mounting the same therein.

摘要翻译： 一种插入式单元安装结构，其可以在所有槽中有效地安装具有不同尺寸的插入式单元。 使用与其相关联的各个安装框架来安装尺寸不同的印刷电路板类型的PIU。 箱形PIU也使用与其相关联的相应安装框架来安装。 然而，金属架本身上没有设置导轨，用于引导每个PIU以将其固定在其中。

公开(公告)号：US20080004736A1

公开(公告)日：2008-01-03

申请号：US11819091

申请日：2007-06-25

申请人： Yasunori Ueno ,  Yoshiyuki Sato

发明人： Yasunori Ueno ,  Yoshiyuki Sato

IPC分类号： G06F19/00

CPC分类号： B29C33/3835 ,  B29D11/00413 ,  B29D11/00538 ,  B29L2011/0016

摘要： A mold with which a molded product in a desired shape with an aspherical curved surface is molded can be designed with high precision by correcting shape deformation of the molded product molded from the mold. A mold 10 in which use surfaces 16 of an upper mold 11 and a lower mold 12 are formed to be design curved surfaces of the optical lens in a spherical shape is prepared. A curved surface shape of the optical lens molded from the mold is measured, a measured value is approximated by an equation (1) which is an equation of an aspherical surface and a curved surface of the molded optical lens is specified as an aspherical surface. Information corresponding to an error between the curved surface of the optical lens specified by the equation of the aspherical surface and the above-described design curved surface is compiled into database for each of characteristics of the optical lens as correction information for molding the optical lens of which curved surface is in the spherical shape. By using the correction information compiled into database, design values of the use surfaces in the upper mold and the lower mold of the mold with which the optical lens of which curved surface in the aspherical shape is molded are corrected to design them. [ Mathematical ⁢   ⁢ expression ⁢   ⁢ 10 ]   Z = C ⁢   ⁢ ρ 2 1 + 1 - ( 1 + K ) ⁢ C 2 ⁢ ρ 2 + ∑ i = 2 n ⁢ A 2 ⁢ i ⁢ ρ 2 ⁢ i ( 1 )

公开(公告)号：US07251538B2

公开(公告)日：2007-07-31

申请号：US10555385

申请日：2005-05-31

申请人： Yasunori Ueno ,  Yoshiyuki Sato

发明人： Yasunori Ueno ,  Yoshiyuki Sato

IPC分类号： G06F19/00 ,  G06F7/60

CPC分类号： B29C33/3835 ,  B29D11/00413 ,  B29D11/00538 ,  B29L2011/0016

摘要： A mold with which a molded product in a desired shape with an aspherical curved surface is molded can be designed with high precision by correcting shape deformation of the molded product molded from the mold.A mold 10 in which use surfaces 16 of an upper mold 11 and a lower mold 12 are formed to be design curved surfaces of the optical lens in a spherical shape is prepared. A curved surface shape of the optical lens molded from the mold is measured, a measured value is approximated by an equation (1) which is an equation of an aspherical surface and a curved surface of the molded optical lens is specified as an aspherical surface. Information corresponding to an error between the curved surface of the optical lens specified by the equation of the aspherical surface and the above-described design curved surface is compiled into database for each of characteristics of the optical lens as correction information for molding the optical lens of which curved surface is in the spherical shape. By using the correction information compiled into database, design values of the use surfaces in the upper mold and the lower mold of the mold with which the optical lens of which curved surface in the aspherical shape is molded are corrected to design them. [ Mathematical ⁢ ⁢ Expression ⁢ ⁢ 10 ] Z = C ⁢ ⁢ ρ 2 1 + 1 - ( 1 + K ) ⁢ C 2 ⁢ ρ 2 + ∑ i = 2 n ⁢ A 2 ⁢ i ⁢ ρ 2 ⁢ i . ( 1 )

公开(公告)号：US20070043463A1

公开(公告)日：2007-02-22

申请号：US10555385

申请日：2005-05-31

申请人： Yasunori Ueno ,  Yoshiyuki Sato

发明人： Yasunori Ueno ,  Yoshiyuki Sato

IPC分类号： G06F19/00

CPC分类号： B29C33/3835 ,  B29D11/00413 ,  B29D11/00538 ,  B29L2011/0016

摘要： A mold with which a molded product in a desired shape with an aspherical curved surface is molded can be designed with high precision by correcting shape deformation of the molded product molded from the mold. A mold 10 in which use surfaces 16 of an upper mold 11 and a lower mold 12 are formed to be design curved surfaces of the optical lens in a spherical shape is prepared. A curved surface shape of the optical lens molded from the mold is measured, a measured value is approximated by an equation (1) which is an equation of an aspherical surface and a curved surface of the molded optical lens is specified as an aspherical surface. Information corresponding to an error between the curved surface of the optical lens specified by the equation of the aspherical surface and the above-described design curved surface is compiled into database for each of characteristics of the optical lens as correction information for molding the optical lens of which curved surface is in the spherical shape. By using the correction information compiled into database, design values of the use surfaces in the upper mold and the lower mold of the mold with which the optical lens of which curved surface in the aspherical shape is molded are corrected to design them. [ Mathematical ⁢   ⁢ Expression ⁢   ⁢ 10 ]   Z = C ⁢   ⁢ ρ 2 1 + 1 - ( 1 + K ) ⁢ C 2 ⁢ ρ 2 + ∑ i = 2 n ⁢ A 2 ⁢ i ⁢ ρ 2 ⁢ i ( 1 )

公开(公告)号：US20060199286A1

公开(公告)日：2006-09-07

申请号：US11367360

申请日：2006-03-06

申请人： Yoshiyuki Sato

发明人： Yoshiyuki Sato

IPC分类号： H01L21/66 ,  H01L23/58

CPC分类号： H01L22/20 ,  G06T7/0004 ,  G06T2207/30148 ,  H01L2924/0002 ,  H01L2924/00

摘要： A system for reviewing defects includes an analysis module configured to analyze defect information of a plurality of intermediate products, the defect information including information of an amount of defects classified by sizes of the defects existing in each of the intermediate products; a failure magnitude calculation module configured to calculate a systematic failure magnitude of the intermediate products caused by fabrication procedure of the intermediate products; a classification module configured to classify a calculated result of the systematic failure magnitude; and a review target selection module configured to select intermediate products becoming review targets.

摘要翻译： 用于检查缺陷的系统包括：分析模块，被配置为分析多个中间产品的缺陷信息，所述缺陷信息包括根据每个所述中间产品中存在的缺陷的大小分类的缺陷量的信息; 失效量值计算模块，被配置为计算由所述中间产品的制造程序引起的中间产品的系统故障量值; 分类模块，被配置为对系统故障量值的计算结果进行分类; 以及审查对象选择模块，被配置为选择成为审查对象的中间产品。