Apparatus for detecting the location of incident radiation
    33.
    发明授权
    Apparatus for detecting the location of incident radiation 失效
    用于检测入射辐射位置的装置

    公开(公告)号:US4394576A

    公开(公告)日:1983-07-19

    申请号:US191870

    申请日:1980-09-29

    IPC分类号: G01T1/20 A61B6/00 G01T1/164

    CPC分类号: G01T1/1642

    摘要: An apparatus for a detecting the location of incident radiation comprises at least one pair of assembly comprised of a scintillation crystal consisting of a plurality of crystal segments, a pair of photo-multiplier tubes optically coupled to the scintillation crystal so as to be able to detect a scintillation produced in any one of these crystal segments. These plural crystal segments are coupled to each other in such manner that any scintillation produced in any single crystal segment will cause the photo-multiplier tubes to deliver substantially a same output irrespective of the illuminating position within this crystal segment, and also that scintillations produced in the respective crystal segments will cause the photo-multiplier tubes to deliver outputs which are different in level for the respective crystal segments.

    摘要翻译: 用于检测入射辐射的位置的装置包括至少一对组件,其包括由多个晶体段组成的闪烁晶体,一对与闪烁晶体光学耦合的光电倍增管,以便能够检测 在这些晶体段中的任何一个中产生的闪烁。 这些多个晶体段以这样的方式彼此耦合,使得在任何单晶段中产生的任何闪烁将导致光电倍增管输出基本上相同的输出,而与该晶体段内的照明位置无关,并且还产生在 相应的晶体段将导致光电倍增管传递各个晶体段的电平不同的输出。