公开(公告)号：US11347403B2

公开(公告)日：2022-05-31

申请号：US16560858

申请日：2019-09-04

Applicant: Seagate Technology LLC

Inventor： Darshana H. Mehta ,  Antoine Khoueir

IPC: G06F3/06 ,  G06F11/07 ,  G06F11/20 ,  G11C29/00

Abstract: Technologies are described herein for or extending the lifespan of a solid-state drive by using worn-out MLC flash blocks in SLC mode to extend their useful life. Upon identifying a first storage location in the storage media of an SSD as a candidate for defecting, the first storage location is switched from a first programming mode to a second programming mode, where the second programming mode results in a lower storage density of storage locations than the first programming mode. In conjunction with switching the first storage location to the first programming mode, a second storage location in the storage media is switched from the second programming mode to the first programming mode to ensure that the total capacity of the storage media remains at or above the rated capacity.

公开(公告)号：US11340979B2

公开(公告)日：2022-05-24

申请号：US16729237

申请日：2019-12-27

Applicant: Seagate Technology LLC

Inventor： Mehmet Emin Aklik ,  Antoine Khoueir ,  Darshana H. Mehta ,  Nicholas Lien

IPC: G06F11/07 ,  G11C29/08 ,  G06F11/10 ,  G11C29/52 ,  G11C29/00

Abstract: Read error mitigation in solid-state memory devices. A solid-state drive (SSD) includes a read error mitigation module that monitors one or more memory regions. In response to detecting uncorrectable read errors, memory regions of the memory device may be identified and preemptively retired. Example approaches include identifying a memory region as being suspect such that upon repeated read failures within the memory region, the memory region is retired. Moreover, memory regions may be compared to peer memory regions to determine when to retire a memory region. The read error mitigation module may trigger a test procedure on a memory region to detect the susceptibility of a memory region to read error failures. By detecting read error failures and retirement of a memory regions, data loss and/or data recovery processes may be limited to improve drive performance and reliability.

公开(公告)号：US20200264944A1

公开(公告)日：2020-08-20

申请号：US16427502

申请日：2019-05-31

Applicant: Seagate Technology LLC

Inventor： Darshana H. Mehta ,  Antoine Khoueir

IPC: G06F11/07 ,  G06F11/10 ,  G11C16/14 ,  G11C16/34 ,  G11C16/26

Abstract: Weak erase detection and mitigation techniques are provided that detect permanent failures in solid-state storage devices. One exemplary method comprises obtaining an erase fail bits metric for a solid-state storage device; and detecting a permanent failure in at least a portion of the solid-state storage device causing weak erase failure mode by comparing the erase fail bit metric to a predefined fail bits threshold. In at least one embodiment, the method also comprises mitigating for the permanent failure causing the weak erase failure mode for one or more cells of the solid-state storage device. The mitigating for the permanent failure comprises, for example, changing a status of the one or more cells to a defective state and/or a retired state. The detection of the permanent failure causing the weak erase failure mode comprises, for example, detecting the weak erase failure mode without an erase failure.