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公开(公告)号:US11908504B2
公开(公告)日:2024-02-20
申请号:US17719637
申请日:2022-04-13
Applicant: Seagate Technology LLC
Inventor: Jon D. Trantham , Praveen Viraraghavan , John W. Dykes , Ian J. Gilbert , Sangita Shreedharan Kalarickal , Matthew J. Totin , Mohamad El-Batal , Darshana H. Mehta
CPC classification number: G11C11/223 , G11C11/2273 , G11C11/2275 , H10B51/20 , H10B51/30
Abstract: A memory device formed of ferroelectric field effect transistors (FeFETs). The memory device can be used as a front end buffer, such as in a data storage device having a non-volatile memory (NVM). A controller can be configured to transfer user data between the NVM and an external client (host) via the buffer. The FeFETs can be arranged in a two-dimensional (2D) or a three-dimensional (3D) array. A monitor circuit can be used to monitor operation of the FeFETs. An optimization controller can be used to adjust at least one operational parameter associated with the FeFETs responsive to the monitored operation by the monitor circuit. The FeFETs may require a refresh operation after each read operation. A power down sequence can involve a read operation without a subsequent refresh operation to wipe the FeFETs, the read operation jettisoning the data read from the buffer memory.
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公开(公告)号:US20220406396A1
公开(公告)日:2022-12-22
申请号:US17845643
申请日:2022-06-21
Applicant: Seagate Technology LLC
Inventor: Jon D. Trantham , Praveen Viraraghavan , John W. Dykes , Ian J. Gilbert , Sangita Shreedharan Kalarickal , Matthew J. Totin , Mohamad El-Batal , Darshana H. Mehta
Abstract: A data storage system can utilize one or more data storage devices that employ a solid-state non-volatile read destructive memory consisting of ferroelectric memory cells. A leveling strategy can be generated by a wear module connected to the memory with the leveling strategy prescribing a plurality of memory cell operating parameters associated with different amounts of cell wear. The wear module may monitor activity of a memory cell and detect an amount of wear in the memory cell as a result of the monitored activity, which can prompt changing a default set of operating parameters for the memory cell to a first stage of operating parameters, as prescribed by the leveling strategy, in response to the detected amount of wear.
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公开(公告)号:US20220399054A1
公开(公告)日:2022-12-15
申请号:US17840779
申请日:2022-06-15
Applicant: Seagate Technology LLC
Inventor: Jon D. Trantham , Praveen Viraraghavan , John W. Dykes , Ian J. Gilbert , Sangita Shreedharan Kalarickal , Matthew J. Totin , Mohamad El-Batal , Darshana H. Mehta
Abstract: A non-volatile memory (NVM) is formed of memory cells each having multiple ferroelectric memory elements (FMEs). Each FME stores data in relation to an electrical polarity of a recording layer formed of ferroelectric or anti-ferroelectric material. Each multi-FME memory cell is coupled to a set of external control lines activated by a control circuit in a selected order to perform program and/or read operations upon the FMEs. The FMEs may share a nominally identical construction or may have different constructions. Data are programmed and written responsive to the respective program/read responses of the FMEs. Constructions can include ferroelectric tunneling junctions (FTJs), ferroelectric random access memory (FeRAM), and ferroelectric field effect transistors (FeFETs). The NVM may form a portion of a data storage device, such as a solid-state drive (SSD).
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公开(公告)号:US20220328086A1
公开(公告)日:2022-10-13
申请号:US17719637
申请日:2022-04-13
Applicant: Seagate Technology LLC
Inventor: Jon D. Trantham , Praveen Viraraghavan , John W. Dykes , Ian J. Gilbert , Sangita Shreedharan Kalarickal , Matthew J. Totin , Mohamad El-Batal , Darshana H. Mehta
IPC: G11C11/22 , H01L27/1159 , H01L27/11597
Abstract: A memory device formed of ferroelectric field effect transistors (FeFETs). The memory device can be used as a front end buffer, such as in a data storage device having a non-volatile memory (NVM). A controller can be configured to transfer user data between the NVM and an external client (host) via the buffer. The FeFETs can be arranged in a two-dimensional (2D) or a three-dimensional (3D) array. A monitor circuit can be used to monitor operation of the FeFETs. An optimization controller can be used to adjust at least one operational parameter associated with the FeFETs responsive to the monitored operation by the monitor circuit. The FeFETs may require a refresh operation after each read operation. A power down sequence can involve a read operation without a subsequent refresh operation to wipe the FeFETs, the read operation jettisoning the data read from the buffer memory.
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公开(公告)号:US10453547B2
公开(公告)日:2019-10-22
申请号:US15625313
申请日:2017-06-16
Applicant: Seagate Technology LLC
Inventor: Darshana H. Mehta , Antoine Khoueir , Ara Patapoutian
IPC: G11C29/00 , G11C29/10 , G11C29/30 , G11C29/42 , G06F12/02 , G06F3/06 , G11C29/44 , G11C29/52 , G11C29/32
Abstract: Systems and methods presented herein provide for monitoring block, page, and/or stripe degradation. In one embodiment, a controller is operable to scan a first block of memory to identify a failure in a portion of the first block. The controller suspends input/output (I/O) operations to the failed portion of the first block, and tests the failed portion of the first block to determine if the failure is a transient failure. Testing includes loading the portion of the first block with data, and reading the data from the loaded portion of the first block. If the failure subsides after testing, the controller is further operable to determine that the failure is a transient failure, and to resume I/O operations to the portion of the first block.
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公开(公告)号:US12125513B2
公开(公告)日:2024-10-22
申请号:US17726864
申请日:2022-04-22
Applicant: Seagate Technology LLC
Inventor: Jon D. Trantham , Praveen Viraraghavan , John W. Dykes , Ian J. Gilbert , Sangita Shreedharan Kalarickal , Matthew J. Totin , Mohamad El-Batal , Darshana H. Mehta
CPC classification number: G11C11/2273 , G11C7/1039 , G11C11/2275 , G11C11/2297 , G11C17/12
Abstract: A system on chip (SOC) integrated circuit device having an incorporated ferroelectric memory configured to be selectively refreshed, or not, depending on different operational modes. The ferroelectric memory is formed of an array of ferroelectric memory elements (FMEs) characterized as non-volatile, read-destructive semiconductor memory cells each having at least one ferroelectric layer. The FMEs can include FeRAM, FeFET or FTJ constructions. A read/write circuit writes data to the FMEs and subsequently reads back data from the FMEs responsive to respective write and read signals supplied by a processor circuit of the SOC. A refresh circuit is selectively enabled in a first normal mode to refresh the FMEs after a read operation, and is selectively disabled in a second exception mode so that the FMEs are not refreshed after a read operation. The FMEs can be used as a main memory, a cache, a buffer, an OTP, a keystore, etc.
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公开(公告)号:US11996144B2
公开(公告)日:2024-05-28
申请号:US17840779
申请日:2022-06-15
Applicant: Seagate Technology LLC
Inventor: Jon D. Trantham , Praveen Viraraghavan , John W. Dykes , Ian J. Gilbert , Sangita Shreedharan Kalarickal , Matthew J. Totin , Mohamad El-Batal , Darshana H. Mehta
CPC classification number: G11C11/5657 , G11C11/221 , G11C11/223 , G11C11/2273 , G11C11/2275
Abstract: A non-volatile memory (NVM) is formed of memory cells each having multiple ferroelectric memory elements (FMEs). Each FME stores data in relation to an electrical polarity of a recording layer formed of ferroelectric or anti-ferroelectric material. Each multi-FME memory cell is coupled to a set of external control lines activated by a control circuit in a selected order to perform program and/or read operations upon the FMEs. The FMEs may share a nominally identical construction or may have different constructions. Data are programmed and written responsive to the respective program/read responses of the FMEs. Constructions can include ferroelectric tunneling junctions (FTJs), ferroelectric random access memory (FeRAM), and ferroelectric field effect transistors (FeFETs). The NVM may form a portion of a data storage device, such as a solid-state drive (SSD).
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公开(公告)号:US20220350739A1
公开(公告)日:2022-11-03
申请号:US17730920
申请日:2022-04-27
Applicant: Seagate Technology LLC
Inventor: Jon D. Trantham , Praveen Viraraghavan , John W. Dykes , Ian J. Gilbert , Sangita Shreedharan Kalarickal , Matthew J. Totin , Mohamad El-Batal , Darshana H. Mehta
IPC: G06F12/0802 , G06F3/06
Abstract: Method and apparatus for managing a front-end cache formed of ferroelectric memory element (FME) cells. Prior to storage of writeback data associated with a pending write command from a client device, an intelligent cache manager circuit forwards a first status value indicative that sufficient capacity is available in the front-end cache for the writeback data. Non-requested speculative readback data previously transferred to the front-end cache from the main NVM memory store may be jettisoned to accommodate the writeback data. A second status value may be supplied to the client device if insufficient capacity is available to store the writeback data in the front-end cache, and a different, non-FME based cache may be used in such case. Mode select inputs can be supplied by the client device specify a particular quality of service level for the front-end cache, enabling selection of suitable writeback and speculative readback data processing strategies.
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9.
公开(公告)号:US11017850B2
公开(公告)日:2021-05-25
申请号:US16547925
申请日:2019-08-22
Applicant: Seagate Technology LLC
Inventor: Kurt Walter Getreuer , Darshana H. Mehta , Antoine Khoueir , Christopher Joseph Curl
Abstract: Method and apparatus for managing data in a non-volatile memory (NVM) of a storage device, such as a solid-state drive (SSD). In some embodiments, first data are read from the NVM using an initial set of read voltages over a selected range of cross-temperature differential (CTD) values comprising a difference between a programming temperature at which the first data are programmed to the NVM cells and a reading temperature at which the first data are subsequently read from the NVM cells. A master set of read voltages is thereafter selected that provides a lowest acceptable error rate performance level over the entirety of the CTD range, and the master set of read voltages is thereafter used irrespective of NVM temperature. In some cases, the master set of read voltages may be further adjusted for different word line addresses, program/erase counts, read counts, data aging, etc.
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10.
公开(公告)号:US20210057024A1
公开(公告)日:2021-02-25
申请号:US16547925
申请日:2019-08-22
Applicant: Seagate Technology LLC
Inventor: Kurt Walter Getreuer , Darshana H. Mehta , Antoine Khoueir , Christopher Joseph Curl
Abstract: Method and apparatus for managing data in a non-volatile memory (NVM) of a storage device, such as a solid-state drive (SSD). In some embodiments, first data are read from the NVM using an initial set of read voltages over a selected range of cross-temperature differential (CTD) values comprising a difference between a programming temperature at which the first data are programmed to the NVM cells and a reading temperature at which the first data are subsequently read from the NVM cells. A master set of read voltages is thereafter selected that provides a lowest acceptable error rate performance level over the entirety of the CTD range, and the master set of read voltages is thereafter used irrespective of NVM temperature. In some cases, the master set of read voltages may be further adjusted for different word line addresses, program/erase counts, read counts, data aging, etc.
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