Monitoring a memory for retirement

    公开(公告)号:US10453547B2

    公开(公告)日:2019-10-22

    申请号:US15625313

    申请日:2017-06-16

    Abstract: Systems and methods presented herein provide for monitoring block, page, and/or stripe degradation. In one embodiment, a controller is operable to scan a first block of memory to identify a failure in a portion of the first block. The controller suspends input/output (I/O) operations to the failed portion of the first block, and tests the failed portion of the first block to determine if the failure is a transient failure. Testing includes loading the portion of the first block with data, and reading the data from the loaded portion of the first block. If the failure subsides after testing, the controller is further operable to determine that the failure is a transient failure, and to resume I/O operations to the portion of the first block.

    INTELLIGENT MANAGEMENT OF FERROELECTRIC MEMORY IN A DATA STORAGE DEVICE

    公开(公告)号:US20220350739A1

    公开(公告)日:2022-11-03

    申请号:US17730920

    申请日:2022-04-27

    Abstract: Method and apparatus for managing a front-end cache formed of ferroelectric memory element (FME) cells. Prior to storage of writeback data associated with a pending write command from a client device, an intelligent cache manager circuit forwards a first status value indicative that sufficient capacity is available in the front-end cache for the writeback data. Non-requested speculative readback data previously transferred to the front-end cache from the main NVM memory store may be jettisoned to accommodate the writeback data. A second status value may be supplied to the client device if insufficient capacity is available to store the writeback data in the front-end cache, and a different, non-FME based cache may be used in such case. Mode select inputs can be supplied by the client device specify a particular quality of service level for the front-end cache, enabling selection of suitable writeback and speculative readback data processing strategies.

    MASTER SET OF READ VOLTAGES FOR A NON-VOLATILE MEMORY (NVM) TO MITIGATE CROSS-TEMPERATURE EFFECTS

    公开(公告)号:US20210057024A1

    公开(公告)日:2021-02-25

    申请号:US16547925

    申请日:2019-08-22

    Abstract: Method and apparatus for managing data in a non-volatile memory (NVM) of a storage device, such as a solid-state drive (SSD). In some embodiments, first data are read from the NVM using an initial set of read voltages over a selected range of cross-temperature differential (CTD) values comprising a difference between a programming temperature at which the first data are programmed to the NVM cells and a reading temperature at which the first data are subsequently read from the NVM cells. A master set of read voltages is thereafter selected that provides a lowest acceptable error rate performance level over the entirety of the CTD range, and the master set of read voltages is thereafter used irrespective of NVM temperature. In some cases, the master set of read voltages may be further adjusted for different word line addresses, program/erase counts, read counts, data aging, etc.

Patent Agency Ranking