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公开(公告)号：US08289040B2
公开(公告)日：2012-10-16
申请号：US12947721
申请日：2010-11-16
IPC分类号： G01R31/00
CPC分类号： G01R31/2874 , G01R31/2863 , G01R31/2867
摘要： A wafer unit for testing is electrically connected to a plurality of chips to be tested formed on a wafer to be tested, the wafer unit for testing including: a connecting wafer provided to face the wafer to be tested, and to be electrically connected to each of the plurality of chips to be tested; and a temperature distribution adjusting section provided on the connecting wafer, and to adjust a temperature distribution of the wafer to be tested.
摘要翻译： 用于测试的晶片单元电连接到待测试的晶片上形成的待测试的多个芯片，用于测试的晶片单元包括：设置成面对待测晶片的连接晶片，并与每个芯片电连接 的待测试的多个芯片; 以及温度分布调整部，设置在连接晶片上，并调整被测试晶片的温度分布。
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32.发明授权Optical pickup having a plurality of photodetectors divided into four regions used to obtain both focus and tracking error signals 有权具有多个光电检测器的光学拾取器被分成用于获得焦点和跟踪误差信号的四个区域公开(公告)号：US07313061B2
公开(公告)日：2007-12-25
申请号：US10527084
申请日：2003-09-08
IPC分类号： G11B7/00
CPC分类号： G11B7/1381 , G11B7/123 , G11B7/131 , G11B7/133 , G11B7/1353
摘要： An optical pickup comprises: first and second semiconductor lasers (11, 14); a hologram element (17) for diffracting light reflected by an optical information recording medium (9 or 12); and a plurality of photodetectors (18-23). The hologram element (17) has two or more different diffraction regions. The plurality of photodetectors (18-23) are provided away from the first and second semiconductor lasers (11, 14) at both sides thereof along an extended line of a line between light emission positions of the first and second semiconductor lasers (11, 14). The diffracted light generated from the light beam of the first wavelength (10) by the hologram element (17) and the diffracted light generated from the light beam of the second wavelength (13) by the hologram element (17) are collected at substantially the same position at one side, and part (18, 19) of the plurality of photodetectors (18-23) are provided at the position. Signals obtained from the photodetectors (18-23) at the both sides are used to obtain a focus error signal and a tracking error signal.
摘要翻译： 光拾取器包括：第一和第二半导体激光器（11,14）; 用于衍射由光学信息记录介质（9或12）反射的光的全息元件（17）; 和多个光电检测器（18-23）。 全息元件（17）具有两个或更多个不同的衍射区域。 沿着第一和第二半导体激光器（11,14）的发光位置之间的线的延伸线，在其两侧远离第一和第二半导体激光器（11,14）设置多个光电探测器（18-23） ）。 由全息元件（17）从第一波长（10）的光束产生的衍射光和由全息元件（17）从第二波长（13）的光束产生的衍射光基本上被收集在 在一个位置处设置相同的位置，并且在该位置处设置多个光电检测器（18-23）的部分（18,19）。 使用从两侧的光电检测器（18-23）获得的信号来获得聚焦误差信号和跟踪误差信号。
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公开(公告)号：US20070048013A1
公开(公告)日：2007-03-01
申请号：US11438735
申请日：2006-05-22
IPC分类号： G03G15/00
CPC分类号： G03G15/751 , G03G5/0503 , G03G5/0507 , G03G5/14704 , G03G5/14726 , G03G2215/00957 , G03G2215/0119
摘要： An electrophotographic image forming apparatus, comprises an electrophotographic photoreceptor; an image forming section for forming a toner image on a surface of the electrophotographic photoreceptor; an intermediate transfer member; a first transferring section for transferring the toner image formed on the surface of the electrophotographic photoreceptor to a surface of the intermediate transfer member; and a second transferring section for transferring the toner image transferred on the surface the intermediate transfer member to a recording medium; wherein the electrophotographic photoreceptor comprises a surface layer forming the surface thereof and containing particles having a number average primary particle diameter of 1 to 300 nm and the surface of the electrophotographic photoreceptor has a hardness of 200 to 350 N/mm2 in universal hardness which is lower than the hardness in universal hardness of the surface of the intermediate transfer member.
摘要翻译： 电子照相图像形成装置，包括电子照相感光体; 图像形成部分，用于在电子照相感光体的表面上形成调色剂图像; 中间转印部件; 用于将形成在电子照相感光体的表面上的调色剂图像转印到中间转印部件的表面的第一转印部分; 以及第二转印部分，用于将在中间转印部件的表面上转印的调色剂图像转印到记录介质上; 其特征在于，所述电子照相感光体包含形成表面的表面层，并含有数均一次粒径为1〜300nm的微粒，电子照相感光体的表面硬度为200〜350N / mm 2 / SUP>的通用硬度低于中间转印部件表面的通用硬度的硬度。
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公开(公告)号：US07057146B2
公开(公告)日：2006-06-06
申请号：US10390011
申请日：2003-03-18
IPC分类号： G02B7/04
CPC分类号： G11B7/131 , G11B7/0906 , G11B7/0912 , G11B7/123 , G11B7/1353
摘要： The optical pickup of this invention includes a diffraction grating for dividing a light beam emitted from a semiconductor laser into a main beam, a precedent sub beam and a subsequent sub beam; a hologram element for dividing reflected light beams of the main beam, the precedent sub beam and the subsequent sub beam from an optical recording medium respectively into first through eighth main beams, first through eighth precedent sub beams and first through eighth subsequent sub beams; a main beam detector for receiving the first through eighth main beams; a precedent sub beam detector for receiving the first through eighth precedent sub beams; and a subsequent sub beam detector for receiving the first through eighth subsequent sub beams.
摘要翻译： 本发明的光拾取器包括用于将从半导体激光器发射的光束划分成主光束，先前子光束和后续子光束的衍射光栅; 用于将主光束，先前子光束和后续子光束的反射光束分别从第一至第八主光束，第一至第八先导子光束和第一至第八后续子光束分别的光学记录介质的全息元件分离; 用于接收第一至第八主光束的主光束检测器; 用于接收第一到第八先例子光束的先例子光束检测器; 以及用于接收第一至第八后续子光束的后续子光束检测器。
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公开(公告)号：US20060023608A1
公开(公告)日：2006-02-02
申请号：US10527084
申请日：2003-09-08
IPC分类号： G11B7/00
CPC分类号： G11B7/1381 , G11B7/123 , G11B7/131 , G11B7/133 , G11B7/1353
摘要： An optical pickup comprises: first and second semiconductor lasers (11, 14); a hologram element (17) for diffracting light reflected by an optical information recording medium (9 or 12); and a plurality of photodetectors (18-23). The hologram element (17) has two or more different diffraction regions. The plurality of photodetectors (18-23) are provided away from the first and second semiconductor lasers (11, 14) at both sides thereof along an extended line of a line between light emission positions of the first and second semiconductor lasers (11, 14). The diffracted light generated from the light beam of the first wavelength (10) by the hologram element (17) and the diffracted light generated from the light beam of the second wavelength (13) by the hologram element (17) are collected at substantially the same position at one side, and part (18, 19) of the plurality of photodetectors (18-23) are provided at the position. Signals obtained from the photodetectors (18-23) at the both sides are used to obtain a focus error signal and a tracking error signal.
摘要翻译： 光拾取器包括：第一和第二半导体激光器（11,14）; 用于衍射由光学信息记录介质（9或12）反射的光的全息元件（17）; 和多个光电检测器（18-23）。 全息元件（17）具有两个或更多个不同的衍射区域。 沿着第一和第二半导体激光器（11,14）的发光位置之间的线的延伸线，在其两侧远离第一和第二半导体激光器（11,14）设置多个光电探测器（18-23） ）。 由全息元件（17）从第一波长（10）的光束产生的衍射光和由全息元件（17）从第二波长（13）的光束产生的衍射光基本上被收集在 在一个位置处设置相同的位置，并且在该位置处设置多个光电检测器（18-23）的部分（18,19）。 使用从两侧的光电检测器（18-23）获得的信号来获得聚焦误差信号和跟踪误差信号。
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36.发明授权公开(公告)号：US06620567B2
公开(公告)日：2003-09-16
申请号：US10058612
申请日：2002-01-28
IPC分类号： G03G5047
摘要： An electrophotographic photoreceptor is disclosed. The photoreceptor has an interlayer between an electroconductive substrate and a photosensitive layer wherein the interlayer contains a particle and has a light absorbance of not more than 0.25 per micrometer of thickness at a wavelength of 1,000 nm. An image forming apparatus and a processing cartridge employing the photoreceptor are also disclosed.
摘要翻译： 公开了一种电子照相感光体。 感光体在导电性基材和感光层之间具有中间层，其中中间层含有颗粒，并且在1000nm的波长下的每微米厚度的吸光度不大于0.25。一种图像形成装置和使用 还公开了感光体。
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公开(公告)号：US06472113B2
公开(公告)日：2002-10-29
申请号：US09835735
申请日：2001-04-16
IPC分类号： G03G5047
摘要： An electrophotoreceptor, comprises a conductive support; a photoreceptive layer, an intermediate layer provided between the conductive support and the photoreceptive layer, the intermediate layer containing N type semi-conductive fine particles and a binder resin, wherein the N type semi-conductive fine particles are subjected to plural surface treatments, and the final surface treatment is carried out employing a reactive organic silicon compound.
摘要翻译： 电子感受器，包括导电支撑体; 感光层，设置在导电性支持体和感光层之间的中间层，含有N型半导体微粒的中间层和粘合剂树脂，其中，对N型半导体微粒进行多次表面处理， 使用反应性有机硅化合物进行最终的表面处理。
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公开(公告)号：US6040105A
公开(公告)日：2000-03-21
申请号：US102303
申请日：1998-06-22
摘要： An electrophotographic photoreceptor and a cleaning method of the support therefor are disclosed. The element of Si and Na remaining on the support surface, evaluated in terms of ESCA, has the following relation with a major element constituting the support;0
摘要翻译： 公开了电子照相感光体及其支持体的清洗方法。 根据ESCA评价，残留在载体表面上的Si和Na的元素与构成载体的主要元素具有以下关系：0 <[Si（surf）/ Xs-Si（本体）/ Xb] 0.50 <[Na（冲浪）/ Xs-Na（本体）/ Xb]≤0.3，其中Si（冲浪）：清洁后的支撑表面的ESCA测量（硅）Na（冲浪）：ESCA测量（钠） 清洗后的支撑表面（体积）：支撑体积的ESCA测量（硅）Na（体积）：支撑体积的ESCA测量（钠）Xs：组成支撑体的主要元件的ESCA测量（清洁后的支撑表面） Xb：构成支持的主要元素的ESCA测量（支持批量）。
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