TEST WAFER UNIT AND TEST SYSTEM
    1.
    发明申请
    TEST WAFER UNIT AND TEST SYSTEM 有权
    测试波形单元和测试系统

    公开(公告)号:US20110095777A1

    公开(公告)日:2011-04-28

    申请号:US12947721

    申请日:2010-11-16

    IPC分类号: G01R31/00

    摘要: A wafer unit for testing is electrically connected to a plurality of chips to be tested formed on a wafer to be tested, the wafer unit for testing including: a connecting wafer provided to face the wafer to be tested, and to be electrically connected to each of the plurality of chips to be tested; and a temperature distribution adjusting section provided on the connecting wafer, and to adjust a temperature distribution of the wafer to be tested.

    摘要翻译: 用于测试的晶片单元电连接到待测试的晶片上形成的待测试的多个芯片,用于测试的晶片单元包括:设置成面对待测晶片的连接晶片,并与每个芯片电连接 的待测试的多个芯片; 以及温度分布调整部,设置在连接晶片上,并调整被测试晶片的温度分布。

    Peptide mixture and products thereof
    3.
    发明授权
    Peptide mixture and products thereof 失效
    肽混合物及其产物

    公开(公告)号:US06395508B1

    公开(公告)日:2002-05-28

    申请号:US09316957

    申请日:1999-05-24

    IPC分类号: A23C2102

    摘要: A method for producing a peptide mixture from a starting protein by (1) adding at least one protease to an aqueous solution of at least one starting protein to hydrolyse the starting protein, (2) measuring the amount of a free amino acid selected from the group consisting of lysine, phenylalanine, leucine and arginine produced during the hydrolysis of the starting protein, (3) calculating the amount of the free amino acid with respect to the total amount of amino acid contained in the starting protein, and (4) terminating the hydrolysis when the calculated amount of the free amino acid with respect to the total amount of the amino acid contained in the starting protein falls within a predetermined range. The inventive method provides a starting protein hydrolysate of uniform and consistent quality.

    摘要翻译: (1)在至少一种起始蛋白质的水溶液中加入至少一种蛋白酶以水解起始蛋白质的方法,从起始蛋白质制备肽混合物的方法,(2)测量游离氨基酸的量 在起始蛋白水解期间产生的赖氨酸,苯丙氨酸,亮氨酸和精氨酸组成的组,(3)计算游离氨基酸相对于起始蛋白质中所含氨基酸总量的量,以及(4)终止 当游离氨基酸的计算量相对于起始蛋白质中含有的氨基酸总量的计算量落在预定范围内时,水解。 本发明的方法提供均匀且一致质量的起始蛋白质水解产物。

    Low-phosphorus whey protein, manufacturing method thereof,
low-phosphorus purified whey hydrolysate and manufacturing method
thereof
    4.
    发明授权
    Low-phosphorus whey protein, manufacturing method thereof, low-phosphorus purified whey hydrolysate and manufacturing method thereof 失效
    低磷乳清蛋白及其制备方法,低磷纯化乳清水解物及其制备方法

    公开(公告)号:US5744179A

    公开(公告)日:1998-04-28

    申请号:US428129

    申请日:1995-09-06

    IPC分类号: A23J1/20 A23J3/34 A23C9/146

    摘要: A whey protein having a phosphorus content reduced to below 0.15 mg per gram of protein, a manufacturing method thereof, a low-phosphorus hydrolysate highly purified having a low phosphorus content. The method comprises the steps of adjusting pH of the solution containing the whey protein to below 4, and contacting the solution with a cation exchange resin, sequentially contacting the solution with an anion exchange resin, thereby reducing the phosphorus content to below 0.15 mg per gram of protein, and the highly purified low-phosphorus whey protein hydrolysate of the present invention is available by hydrolyzing the above-mentioned low-phosphorus whey protein with proteases.

    摘要翻译: PCT No.PCT / JP93 / 01729 Sec。 371日期:1995年9月6日 102(e)日期1995年9月6日PCT提交1993年11月26日PCT公布。 公开号WO94 / 12053 日期:1995年6月9日具有磷含量降低至低于0.15mg /克蛋白质的乳清蛋白,其制造方法,具有低磷含量的高度纯化的低磷水解产物。 该方法包括以下步骤:将含有乳清蛋白的溶液的pH调节至4以下,并使该溶液与阳离子交换树脂接触,依次使该溶液与阴离子交换树脂接触,从而将磷含量降低至低于0.15mg /克 的蛋白质,通过用蛋白酶水解上述低磷乳清蛋白,可获得本发明的高纯度低磷乳清蛋白水解产物。

    Test wafer unit and test system
    10.
    发明授权
    Test wafer unit and test system 有权
    测试晶圆单元和测试系统

    公开(公告)号:US08289040B2

    公开(公告)日:2012-10-16

    申请号:US12947721

    申请日:2010-11-16

    IPC分类号: G01R31/00

    摘要: A wafer unit for testing is electrically connected to a plurality of chips to be tested formed on a wafer to be tested, the wafer unit for testing including: a connecting wafer provided to face the wafer to be tested, and to be electrically connected to each of the plurality of chips to be tested; and a temperature distribution adjusting section provided on the connecting wafer, and to adjust a temperature distribution of the wafer to be tested.

    摘要翻译: 用于测试的晶片单元电连接到待测试的晶片上形成的待测试的多个芯片,用于测试的晶片单元包括:设置成面对待测晶片的连接晶片,并与每个芯片电连接 的待测试的多个芯片; 以及温度分布调整部,设置在连接晶片上,并调整被测试晶片的温度分布。