摘要:
Apparatus and method evaluate a wafer fabrication process for forming patterns on a wafer based upon design data. Within a recipe database, two or more inspection regions are defined on the wafer for analysis. Patterns within each of the inspection regions are automatically selected based upon tendency for measurement variation resulting from variation in the fabrication process. For each inspection region, at least one image of patterns within the inspection region is captured, a reference pattern, represented by one or both of (a) one or more line segments and (b) one or more curves, is automatically generated from the design data. An inspection unit detects edges within each of the images and registers the image with the reference pattern. One or more measurements are determined from the edges for each of the selected patterns and are processed within a statistical analyzer to form statistical information associated with the fabrication process.
摘要:
In an image defect inspection method and apparatus which detects a gray level difference between corresponding portions of two images, automatically sets a threshold value based on the distribution thereof, compares the gray level difference with the threshold value, and judges one or the other of the portions to be defective if the gray level difference is larger than the threshold value, provisions are made to enhance defect detection sensitivity by correcting the threshold value when the distribution of the gray level difference is different from the usual distribution. A cumulative frequency of the gray level difference between the corresponding portions of the two images is computed (S103); a converted cumulative frequency is computed by converting the cumulative frequency so that the cumulative frequency shows a linear relationship to the gray level difference when a prescribed distribution is assumed (S104); an approximate straight line is computed in each of two regions, one where the gray level difference is positive and the other where the gray level difference is negative (S105); when the difference between the slopes of the approximate straight lines is larger than a predetermined value (S106), the approximate straight line having the smaller slope is corrected in such a manner the slope increases (S107); and based on the approximate straight line, the threshold value is determined from a prescribed cumulative frequency value in accordance with a prescribed calculation method.
摘要:
A new image defect inspection method and a new image defect inspection apparatus capable of being used for automatic setting of a threshold value for an appearance inspection apparatus with a high throughput have been disclosed. According to the image defect inspection method and the image defect inspection apparatus, cumulative frequencies of gray level differences of the corresponding parts of two images are calculated, converted cumulative frequencies are calculated by converting the cumulative frequencies so as to be linear with the gray level differences in a predetermined distribution, a straight line approximation to the converted cumulative frequencies is calculated, and a threshold value is determined from a predetermined cumulative frequency based on the calculated straight line approximation according to a predetermined calculation method. Because there holds a linear relationship between the converted cumulative frequencies and the gray level differences, the following process for determining a threshold value is facilitated.
摘要:
A plurality of viewers which correspond to a plurality of different image file formats, respectively, are activated. An image file retrieving means retrieves a desired image file according a retrieval condition entered by a retrieval condition inputting means. An extension confirming means confirms an image file format of the retrieved image file. A viewer selecting means selects a viewer corresponding to the retrieved image file format to display the image data of the retrieved image file.
摘要:
In an image defect inspection method and apparatus which detects a gray level difference between corresponding portions of two images, automatically sets a threshold value based on the distribution thereof, compares the gray level difference with the threshold value, and judges one or the other of the portions to be defective if the gray level difference is larger than the threshold value, provisions are made to enhance defect detection sensitivity by correcting the threshold value when the distribution of the gray level difference is different from the usual distribution. A cumulative frequency of the gray level difference between the corresponding portions of the two images is computed (S103); a converted cumulative frequency is computed by converting the cumulative frequency so that the cumulative frequency shows a linear relationship to the gray level difference when a prescribed distribution is assumed (S104); an approximate straight line is computed in each of two regions, one where the gray level difference is positive and the other where the gray level difference is negative (S105); when the difference between the slopes of the approximate straight lines is larger than a predetermined value (S106), the approximate straight line having the smaller slope is corrected in such a manner the slope increases (S107); and based on the approximate straight line, the threshold value is determined from a prescribed cumulative frequency value in accordance with a prescribed calculation method.
摘要:
There is proposed a competitive buying and selling system that avoids unnatural bidding prices and exclusive possession of resources, stabilizes bidding prices, and provides such an environment that participants can bid easily. There are included a first step in which a server opens a subject of buying and selling and a successful bid evaluation function thereof to a plurality of clients, a second step in which each of the clients makes a participant determine the subject of buying and selling and a bidding price thereof by using the successful bid evaluation function, and notifies a determined result to the server, and a third step in which the server selects a bidding price of a participant who has indicated a highest evaluation value based on the successful bid evaluation function among all bidding prices notified from the clients and designates the participant as a successful bidder. The successful bid evaluation function is based on past bidding prices per unit volume and utilization efficiencies of resources knocked down in past. Furthermore, the successful bid evaluation function is based further on a resource occupation rate in bidding of this time.
摘要:
A semiconductor device equipped on the same substrate thereof with a first area isolated for device isolation by a first device isolation structure and with a second area isolated for device isolation by a second device isolation structure, wherein the thickness of the substrate inside the first area is different from the thickness of the substrate inside the second area, and the first and second device isolation structures are buried into the substrate so as to bring their tops into about the same level.
摘要:
The present invention relates to a process for the production of a layer composition (10) with an electrically conductive layer (11), comprising the process steps: a) provision of a substrate (12) with a substrate surface (13); b) formation of a polymer layer (14) comprising an electrically conductive polymer (15) on at least a part of the substrate surface (13); c) application of a liquid stabilizer phase, comprising a stabilizer and a liquid phase, to the polymer layer (14) from process step b), wherein the stabilizer phase comprises less than 0.2 wt. %, based on the stabilizer phase, of the electrically conductive polymer, wherein the stabilizer is an aromatic compound with at least two OH groups, and a layer composition (10) and uses thereof.
摘要:
The hard disc is provided with two areas for storing file system management information and content management information. The disc recorder records double file system management information and content management information onto the hard disc. Further, information indicating a procedure for updating file system management information is described in a flash descriptor, and a procedure for updating content management information is described in a robust descriptor.
摘要:
According to a defect inspecting method implemented in a semiconductor circuit inspection machine, a difference in a gray-scale level of a pattern edge image is corrected. A procedure of determining a magnitude of correction is modified in efforts to improve the sensitivity in detecting a defective pattern edge image. A defect inspecting system comprises: an image alignment unit that detects a sub-pixel deviation of two images, which are objects of inspection, from each other; and a magnitude-of-correction determination unit that determines a magnitude of correction, by which the difference in a gray-scale level of a pattern edge image between the two images that is detected by the difference detector is corrected, according to the detected sub-pixel deviation.