Abstract:
An integrated circuit includes a plurality of processing stages each including processing logic 1014, a non-delayed signal-capture element 1016, a delayed signal-capture element 1018 and a comparator 1024. The non-delayed signal-capture element 1016 captures an output from the processing logic 1014 at a non-delayed capture time. At a later delayed capture time, the delayed signal-capture element 1018 also captures a value from the processing logic 1014. An error detection circuit 1026 and error correction circuit 1028 detect and correct random errors in the delayed value and supplies an error-checked delayed value to the comparator 1024. The comparator 1024 compares the error-checked delayed value and the non-delayed value and if they are not equal this indicates that the non-delayed value was captured too soon and should be replaced by the error-checked delayed value. The non-delayed value is passed to the subsequent processing stage immediately following its capture and accordingly error recovery mechanisms are used to suppress the erroneous processing which has occurred by the subsequent processing stages, such as gating the clock and allowing the correct signal values to propagate through the subsequent processing logic before restarting the clock. The operating parameters of the integrated circuit, such as the clock frequency, the operating voltage, the body biased voltage, temperature and the like are adjusted so as to maintain a finite non-zero error rate in a manner that increases overall performance.
Abstract:
An integrated circuit 2 includes logic circuitry 10 and sequential storage elements 8. Both the logic circuit 10 and sequential storage elements 8 can be subject to particle strikes giving rise to single event upset errors. These single event upset errors can be detected by detecting a transition in the stored value stored by the sequential storage elements 8 occurring outside of a valid transition period associated with that sequential storage element 8.
Abstract:
An integrated circuit includes a plurality of processing stages each including processing logic 1014, a non-delayed signal-capture element 1016, a delayed signal-capture element 1018 and a comparator 1024. The non-delayed signal-capture element 1016 captures an output from the processing logic 1014 at a non-delayed capture time. At a later delayed capture time, the delayed signal-capture element 1018 also captures a value from the processing logic 1014. An error detection circuit 1026 and error correction circuit 1028 detect and correct random errors in the delayed value and supplies an error-checked delayed value to the comparator 1024. The comparator 1024 compares the error-checked delayed value and the non-delayed value and if they are not equal this indicates that the non-delayed value was captured too soon and should be replaced by the error-checked delayed value. The non-delayed value is passed to the subsequent processing stage immediately following its capture and accordingly error recovery mechanisms are used to suppress the erroneous processing which has occurred by the subsequent processing stages, such as gating the clock and allowing the correct signal values to propagate through the subsequent processing logic before restarting the clock. The operating parameters of the integrated circuit, such as the clock frequency, the operating voltage, the body biased voltage, temperature and the like are adjusted so as to maintain a finite non-zero error rate in a manner that increases overall performance.
Abstract:
A signal interface for interfacing with an address decoder and a method of address decoding are disclosed. The signal interface comprises: a signal capture element operable to receive an address portion signal associated with a read access to a memory and to provide a first interim address portion signal and a second interim address portion signal, the signal capture element being operable during a pre-charged period to provide a first pre-charged logic level as the first interim address portion signal and the first pre-charged logic level as the second interim address portion signal, the signal capture element being further operable during an evaluate period to output an address portion logic level representative of the address portion signal as the first interim address portion signal and an inverted address portion logic level representative of an inverted address portion signal as the second interim address portion signal; and an inverter circuit operable to receive the first interim address portion signal and the second interim address portion signal from which a first address portion signal and a second address portion signal is respectively derived, the inverter circuit being operable during the pre-charged period to output to an address decoder a second pre-charged logic level as the first address portion signal and the second pre-charged logic level as the second address portion signal, the receipt of the first address portion signal and the second address portion signal at the second pre-charged logic level causing the address decoder to be prevented from causing a data access to the memory from occurring, the inverter circuit having transfer characteristics which cause the first address portion signal and the second address portion signal to be maintained at voltage levels interpreted by the address decoder as being the second pre-charged logic level should the first interim address portion signal or the second interim address portion signal fail to transition to a valid logic level during the evaluate period. By maintaining the address portion signals in this way prevents the address decoder from selecting multiple word lines which ensures no corruption in the state stored in the memory can result due to the inadvertent flow of charge between cells in different rows of the memory even when metastable signals occur during the read access.
Abstract:
An integrated circuit includes a plurality of processing stages each including processing logic 1014, a non-delayed signal-capture element 1016, a delayed signal-capture element 1018 and a comparator 1024. The non-delayed signal-capture element 1016 captures an output from the processing logic 1014 at a non-delayed capture time. At a later delayed capture time, the delayed signal-capture element 1018 also captures a value from the processing logic 1014. An error detection circuit 1026 and error correction circuit 1028 detect and correct random errors in the delayed value and supplies an error-checked delayed value to the comparator 1024. The comparator 1024 compares the error-checked delayed value and the non-delayed value and if they are not equal this indicates that the non-delayed value was captured too soon and should be replaced by the error-checked delayed value. The non-delayed value is passed to the subsequent processing stage immediately following its capture and accordingly error recovery mechanisms are used to suppress the erroneous processing which has occurred by the subsequent processing stages, such as gating the clock and allowing the correct signal values to propagate through the subsequent processing logic before restarting the clock. The operating parameters of the integrated circuit, such as the clock frequency, the operating voltage, the body biased voltage, temperature and the like are adjusted so as to maintain a finite non-zero error rate in a manner that increases overall performance.