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    Method and device for measuring surface potential distribution, method and device for measuring insulation resistance, electrostatic latent image measurement device, and charging device
    42.
    发明申请
    Method and device for measuring surface potential distribution, method and device for measuring insulation resistance, electrostatic latent image measurement device, and charging device 有权
    用于测量表面电位分布的方法和装置，用于测量绝缘电阻的方法和装置，静电潜像测量装置和充电装置

    公开(公告)号：US20050163517A1

    公开(公告)日：2005-07-28

    申请号：US11001048

    申请日：2004-12-02

    Applicant: Hiroyuki Suhara

    Inventor： Hiroyuki Suhara

    IPC: G03F7/20 ,  G03G15/00 ,  H01J37/26

    CPC classification number: G03F7/70675 ,  H01J37/268 ,  H01J2237/2594

    Abstract: In a surface potential distribution measurement method and device, a sample having a surface with a surface potential distribution is scanned using a charged particle beam in a two-dimensional manner. A detection signal caused by the two-dimensional scanning is obtained to measure the surface potential distribution. Charged particles, other than charged particles of the charged particle beam incident to the sample surface by the two-dimensional scanning, with which components of an incidence velocity vector of the charged particles in a direction perpendicular to the sample surface are reversed, are detected so that a detection signal indicating an intensity according to the detected charged particles is obtained in correspondence with a position on the sample surface.

    Abstract translation: 在表面电位分布测量方法和装置中，使用二维方式的带电粒子束来扫描具有表面电位分布的表面的样品。 获得由二维扫描引起的检测信号，以测量表面电位分布。 通过二维扫描将带电粒子入射到样品表面的带电粒子之外的带电粒子与被检测器的垂直于样品表面的方向上的带电粒子的入射速度矢量的分量反转，被检测为 与样品表面上的位置对应地获得表示根据检测到的带电粒子的强度的检测信号。

    Optical scanning apparatus and image forming apparatus having defective light source detection
    44.
    发明授权
    Optical scanning apparatus and image forming apparatus having defective light source detection 有权
    具有缺陷光源检测的光学扫描装置和图像形成装置

    公开(公告)号：US06376837B1

    公开(公告)日：2002-04-23

    申请号：US09500731

    申请日：2000-02-09

    Applicant: Akihisa Itabashi ,  Magane Aoki ,  Akira Kojima ,  Hiroyuki Suhara ,  Nobuaki Kubo ,  Tomoya Ohsugi

    Inventor： Akihisa Itabashi ,  Magane Aoki ,  Akira Kojima ,  Hiroyuki Suhara ,  Nobuaki Kubo ,  Tomoya Ohsugi

    IPC: H01J314

    CPC classification number: H04N1/1906 ,  B41J2/471 ,  G02B26/123 ,  G02B26/127 ,  G06K15/1261 ,  G06K2215/0085 ,  H04N1/1135 ,  H04N1/12 ,  H04N1/1911 ,  H04N2201/03108 ,  H04N2201/0471 ,  H04N2201/04744 ,  H04N2201/04755 ,  H04N2201/04756

    Abstract: An optical scanning apparatus is constructed to detect one or more defective or damaged light emitting devices of a light source unit and forms images having substantially the same quality as that of the images formed when all of a plurality of light emitting devices of a light source of the apparatus are functioning normally even when any one of the plurality of light emitting devices are damaged or broken, without decreasing the image forming performance of the apparatus. The optical scanning apparatus detects one or more damaged or broken light emitting devices and then compensates for the light omitted due to the damaged or broken light emitting devices using the normally functioning light emitting devices without decreasing the image forming speed or quality of the optical scanning apparatus. In order to compensate for a defective light emitting device, the optical scanning apparatus uses various solutions such as increasing the rotating speed of the deflector while increasing the modulation speed of the light emitting devices by the same amount, increasing beam spot diameter in the subscanning direction, changing the output power of the light emitting devices on a surface to be scanned in order to increase beam spot diameter in the main scanning direction and the subscanning direction, and changing the focal length of the line image forming optical apparatus and increasing either the rotation speed of the deflector or the rotation speed of the surface to be scanned or photoconductive drum.

    Abstract translation: 光学扫描装置被构造为检测光源单元的一个或多个有缺陷或损坏的发光装置，并且形成具有与所有图像的质量基本相同的图像的图像， 即使当多个发光装置中的任何一个发光装置被损坏或破坏时，装置也正常工作，而不会降低装置的图像形成性能。 光扫描装置检测一个或多个损坏或破损的发光装置，然后补偿由于使用正常功能的发光装置的损坏或破损的发光装置而省略的光，而不降低光学扫描装置的图像形成速度或质量 。 为了补偿有缺陷的发光装置，光扫描装置使用各种解决方案，例如增加偏转器的旋转速度，同时增加发光装置的调制速度相同的量，增加副扫描方向上的光点直径 改变要扫描的表面上的发光装置的输出功率，以增加主扫描方向和副扫描方向上的光点直径，并且改变线图像形成光学装置的焦距并增加旋转 偏转器的速度或待扫描表面或感光鼓的旋转速度。

    Multi-beam scanning apparatus and multi-beam detection method for the same
    45.
    发明授权
    Multi-beam scanning apparatus and multi-beam detection method for the same 失效
    多光束扫描装置和多光束检测方法相同

    公开(公告)号：US5834766A

    公开(公告)日：1998-11-10

    申请号：US901256

    申请日：1997-07-28

    Applicant: Hiroyuki Suhara

    Inventor： Hiroyuki Suhara

    IPC: B41J2/47 ,  G02B26/12 ,  H01J3/14

    CPC classification number: G02B26/123 ,  B41J2/473

    Abstract: A two-beam detection method causes two beams to differ in light intensity and converging the two beams to enter a common photosensitive element, a photoreception surface of the photosensitive element being configured such that the two beams differ in time required to pass the photoreception surface, processes an output from the photosensitive element using a plurality of threshold levels so as to obtain rectangular signals, one of the rectangular signals obtained using one of the plurality of threshold levels being designated as a detection signal for one of the two beams, and performs a predetermined calculation on the rectangular signals so as to obtain a detection signal for the other of the two beams.

    Abstract translation: 双光束检测方法使两束光束的光强度不同，并且会聚两束光束以进入共同的感光元件，感光元件的光接收表面被配置为使得两束光通过光接收表面所需的时间不同， 使用多个阈值电平处理来自感光元件的输出，以获得矩形信号，使用多个阈值电平中的一个获得的矩形信号中的一个被指定为两个光束之一的检测信号，并执行 对矩形信号进行预定的计算，以获得两个光束中的另一个的检测信号。

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