公开(公告)号：US20050208504A1

公开(公告)日：2005-09-22

申请号：US10803510

申请日：2004-03-17

申请人： Srinka Ghosh ,  Eric Leproust

发明人： Srinka Ghosh ,  Eric Leproust

IPC分类号： C12M1/34 ,  C12Q1/68

CPC分类号： C12Q1/6837 ,  C12Q2545/101 ,  C12Q2565/513

摘要： A method and system for monitoring the feature-extractability of microarrays by integrating control-feature blocks, or reference pattern blocks within a microarrray. The embedded control features comprise an array of pattern blocks, or reference pattern, in which each pattern block is composed of a set of microarray features arranged in a specific pattern of low-intensity and high-intensity features. Positive control features are designed to generate high-intensity signals following exposure of the microarray to a sample solution, and negative control features are designed to generate no signal or a low-intensity signal. The pattern blocks may be visually inspected to determine the feature extractability of a microarray prior to undertaking full, automated feature extraction, or may select a feature-extraction method based on an analysis of the reference pattern.

摘要翻译： 通过集成微阵列内的控制特征块或参考图案块来监测微阵列的特征提取性的方法和系统。 嵌入式控制特征包括一组图案块或参考图案，其中每个图案块由以低强度和高强度特征的特定图案排列的一组微阵列特征组成。 正面控制特征被设计为在将微阵列暴露于样品溶液之后产生高强度信号，而阴性控制特征被设计成不产生信号或低强度信号。 可以目视检查图案块以在进行全自动特征提取之前确定微阵列的特征提取能力，或者可以基于参考图案的分析来选择特征提取方法。