摘要:
A burst page access unit for a semiconductor memory device which has a plurality of memory cell arrays for storing bit data therein. The burst page access unit comprises a row decoder for decoding a row address signal from an address input line in response to a row address strobe signal to select a desired one of the memory cell arrays, an internal address counter for incrementing a column address signal from the address input line by one in response to a column address strobe signal to generate an internal column address signal, and a column decoding circuit for decoding the internal column address signal from the internal address counter to select a desired one of memory cells in the memory cell array selected by the row decoder. According to the present invention, the burst page access unit can enhance the successive data access speed to increase the bandwidth of the semiconductor memory device.
摘要:
A burst mode end detection unit comprising a first decoding circuit for pre-decoding external burst length data, a plurality of counters being reset in response to a reset signal to generate different counts in response to a clock signal in such a manner that the counts are sequentially incremented by one, the reset signal being generated when a burst mode is designated, a second decoding circuit for decoding output signals from the counters, and a comparison circuit for comparing an output signal from the first decoding circuit with an output signal from the second decoding circuit and detecting an end time of the burst mode in accordance with the compared result. According to the present invention, the burst mode end detection unit can accurately detect the end time of the burst mode and notify a synchronous DRAM of the detected burst mode end time. Therefore, the synchronous DRAM can rapidly perform the subsequent operation.