摘要:
An equilibration circuit for a memory device that prevents excessive current from being drawn by the memory device when a row to column short exists while still allowing the use of segmented column repair is disclosed. Each equilibration circuit of a memory device is connected to the equilibration voltage through a transistor that is controlled by a pulsed signal. When the pulsed signal is high, the transistor will turn on, connecting the digital lines to the equilibration voltage to pre-charge the digit lines to the equilibration voltage. The pulse duration is short enough, however, to turn the transistor off before the equilibration voltage can be pulled down if a column to row short exists.
摘要:
A high speed cyclical redundancy check system for use in digital systems. The high speed cyclical redundancy check system providing programmable error correction functions for different data protocols. The high speed cyclical redundancy check system providing programmable data paths for minimizing overhead and maximizing throughput. The system supporting multiple operations in a single cycle.
摘要:
A high speed cyclical redundancy check system for use in digital systems. The high speed cyclical redundancy check system providing programmable error correction functions for different data protocols. The high speed cyclical redundancy check system providing programmable data paths for minimizing overhead and maximizing throughput. The system supporting multiple operations in a single cycle.
摘要:
A system has multiple subsystems and a test signal source resident upon a common substrate. A first subsystem interfaces with an off-substrate functional tester during a test. The test signal source generates a first signal during the test for input to the second subsystem. The second subsystem responds performing an operation independent of operation and current state of the first subsystem. The functional tester verifies the independent operation of the first and second subsystems.