Equilibration/pre-charge circuit for a memory device
    51.
    发明授权
    Equilibration/pre-charge circuit for a memory device 有权
    用于存储器件的平衡/预充电电路

    公开(公告)号:US06333882B1

    公开(公告)日:2001-12-25

    申请号:US09645577

    申请日:2000-08-25

    IPC分类号: G11C700

    CPC分类号: G11C7/12 G11C11/4094

    摘要: An equilibration circuit for a memory device that prevents excessive current from being drawn by the memory device when a row to column short exists while still allowing the use of segmented column repair is disclosed. Each equilibration circuit of a memory device is connected to the equilibration voltage through a transistor that is controlled by a pulsed signal. When the pulsed signal is high, the transistor will turn on, connecting the digital lines to the equilibration voltage to pre-charge the digit lines to the equilibration voltage. The pulse duration is short enough, however, to turn the transistor off before the equilibration voltage can be pulled down if a column to row short exists.

    摘要翻译: 公开了一种用于存储器件的平衡电路,其用于在仍存在允许使用分段柱修复时防止存在存储器件被吸取的过多电流。 存储器件的每个平衡电路通过由脉冲信号控制的晶体管连接到平衡电压。 当脉冲信号为高电平时,晶体管将导通,将数字线连接到平衡电压,以将数字线预充电到平衡电压。 然而,如果存在列到行短,则平均电压可以下拉之前,脉冲持续时间足够短,以关闭晶体管。

    System having multiple subsystems and test signal source resident upon
common substrate
    54.
    发明授权
    System having multiple subsystems and test signal source resident upon common substrate 失效
    具有多个子系统和测试信号源的系统驻留在公共基板上

    公开(公告)号:US5499250A

    公开(公告)日:1996-03-12

    申请号:US443818

    申请日:1995-05-18

    摘要: A system has multiple subsystems and a test signal source resident upon a common substrate. A first subsystem interfaces with an off-substrate functional tester during a test. The test signal source generates a first signal during the test for input to the second subsystem. The second subsystem responds performing an operation independent of operation and current state of the first subsystem. The functional tester verifies the independent operation of the first and second subsystems.

    摘要翻译: 系统具有驻留在公共基板上的多个子系统和测试信号源。 在测试期间,第一子系统与离基板功能测试仪接口。 测试信号源在测试期间产生第一信号以输入到第二子系统。 第二子系统响应执行独立于第一子系统的操作和当前状态的操作。 功能测试器验证第一和第二子系统的独立操作。