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21 条记录 (耗时 0.019 秒)

    Method and circuit for transferring data with dynamic parity generation and checking scheme in multi-port DRAM
    5.
    发明授权
    Method and circuit for transferring data with dynamic parity generation and checking scheme in multi-port DRAM 失效
    在多端口DRAM中使用动态奇偶校验生成和检查方案传输数据的方法和电路

    公开(公告)号：US5778007A

    公开(公告)日：1998-07-07

    申请号：US814661

    申请日：1997-03-11

    申请人： Mark Thomann ,  Huy Thanh Vo ,  Glen E. Hush

    发明人： Mark Thomann ,  Huy Thanh Vo ,  Glen E. Hush

    IPC分类号： H04Q3/00 ,  H04L12/56 ,  H04Q11/04 ,  G11C29/00

    CPC分类号： H04L12/5601 ,  H04L49/108 ,  H04L49/405 ,  H04L2012/5627 ,  H04L2012/5652 ,  H04L2012/5681

    摘要： An ATM switch including a multi-port memory is described. The multi-port memory having a dynamic random access memory (DRAM) and a plurality of input and output serial access memories (SAMs). Efficient, flexible transfer circuits and methods are described for transferring ATM data between the SAMs and the DRAM. The transfer circuits and methods include helper flip/flops to latch ATM data for editing prior to storage in the DRAM. Editing of ATM data transferred from the DRAM is also described. Dynamic parity generation and checking is described to detect errors induced during switching.

    摘要翻译： 描述包括多端口存储器的ATM交换机。 具有动态随机存取存储器（DRAM）和多个输入和输出串行存取存储器（SAM）的多端口存储器。 描述了用于在SAM和DRAM之间传送ATM数据的高效，灵活的传送电路和方法。 传输电路和方法包括辅助触发器，以在存储在DRAM之前锁存ATM数据进行编辑。 还描述了从DRAM传送的ATM数据的编辑。 描述动态奇偶校验生成和检查以检测切换期间引起的错误。

    Multiport datapath system
    6.
    发明授权
    Multiport datapath system 失效
    多端口数据通路系统

    公开(公告)号：US5748635A

    公开(公告)日：1998-05-05

    申请号：US746403

    申请日：1996-11-08

    申请人： Mark Thomann ,  Huy Thanh Vo

    发明人： Mark Thomann ,  Huy Thanh Vo

    IPC分类号： H04Q3/00 ,  G06F9/38 ,  H04L12/56 ,  H04Q11/04 ,  G06F15/80

    CPC分类号： G06F9/3824 ,  H04Q11/0478 ,  H04L2012/5616 ,  H04L2012/5647

    摘要： A multiport interface for digital communication systems having pipelined multiplexing of port instructions for increased throughput. The multiport interface includes an analog delay for independent timing of asynchronous operations, such as memory accesses. The multiport interface also has an instruction pipeline and multiplexer to coordinate a number of port instructions.

    摘要翻译： 用于数字通信系统的多端口接口，具有用于提高吞吐量的端口指令的流水线复用。 多端口接口包括用于异步操作的独立定时的模拟延迟，诸如存储器访问。 多端口接口还具有指令流水线和多路复用器来协调多个端口指令。

    Device and method to reduce wordline RC time constant in semiconductor memory devices
    7.
    发明授权
    Device and method to reduce wordline RC time constant in semiconductor memory devices 有权

    公开(公告)号：US07570504B2

    公开(公告)日：2009-08-04

    申请号：US09808750

    申请日：2001-03-15

    申请人： Huy Thanh Vo

    发明人： Huy Thanh Vo

    IPC分类号： G11C5/06 ,  G11C5/02 ,  G11C8/00

    CPC分类号： G11C8/14 ,  G11C5/063

    摘要： A semiconductor memory device and a method of making and using a semiconductor memory device containing a word line design, which is used in ultra-large scale integrated (ULSI) circuits, that produces a device with a lower RC time constant than devices formed using prior art techniques. In one embodiment of the invention low resistivity metal strapping layers are attached to alternating halves of wordlines in a single memory array. The alternating pattern allows the low resistivity of the strapping layers to be utilized without introducing significant negative capacitive resistance effects due to strapping layers being too close to each other.

    Threshold voltage scalable buffer with reference level
    8.
    发明授权
    Threshold voltage scalable buffer with reference level 失效
    具有参考电平的阈值电压可伸缩缓冲器

    公开(公告)号：US06323685B1

    公开(公告)日：2001-11-27

    申请号：US09361455

    申请日：1999-07-27

    申请人： Huy Thanh Vo

    发明人： Huy Thanh Vo

    IPC分类号： H03K5153

    CPC分类号： H03K19/018521 ,  H03K19/0016

    摘要： A buffer circuit (10). The buffer circuit (10) includes a first inverter (12) with a first current limiter (18) that limits the standby current used by the first inverter (12). Further, the buffer circuit (10) includes a second inverter (14) that is coupled to an output of the first inverter (12). The input buffer (10) converts a first logic level of an input signal provided to the first inverter (12) to a second logic level at an output of the second inverter (14). The buffer circuit (10) also includes a second current limiting circuit (16) that is coupled between the first and second inverters (12 and 14) to further limit the standby current in the buffer circuit (10).

    摘要翻译： 缓冲电路（10）。 缓冲电路（10）包括具有限制第一逆变器（12）使用的待机电流的第一限流器（18）的第一逆变器（12）。 此外，缓冲电路（10）包括耦合到第一反相器（12）的输出的第二反相器（14）。 输入缓冲器（10）将提供给第一反相器（12）的输入信号的第一逻辑电平转换为第二反相器（14）的输出处的第二逻辑电平。 缓冲电路（10）还包括耦合在第一和第二反相器（12和14）之间的第二限流电路（16），以进一步限制缓冲电路（10）中的待机电流。

    Method and apparatus for testing embedded DRAM
    9.
    发明授权
    Method and apparatus for testing embedded DRAM 有权
    用于测试嵌入式DRAM的方法和装置

    公开(公告)号：US6072737A

    公开(公告)日：2000-06-06

    申请号：US130632

    申请日：1998-08-06

    申请人： Donald M. Morgan ,  Huy Thanh Vo

    发明人： Donald M. Morgan ,  Huy Thanh Vo

    IPC分类号： G11C29/14 ,  G11C7/00

    CPC分类号： G11C29/14

    摘要： A test circuit tests for defective memory cells in a memory portion of an Embedded DRAM. The Embedded DRAM includes an array of memory cells. The test circuit includes a test mode terminal adapted to receive a test mode signal and a plurality of comparison circuits. Each comparison circuit includes a first input adapted to receive a read data signal and a second input adapted to receive an expect data signal. Each comparison circuit compares the binary values of the read and expect data signals and develops and inactive error signal on an output when the compared signals have the same binary values, and develops an active error signal when the compared signals have different binary values. A storage circuit is coupled to the outputs of the comparison circuits. The storage circuit latches the error signals output by the comparison circuits and sequentially transfers the latched error signals onto a data terminal of the Embedded DRAM. A test control circuit is coupled to the comparison circuits, the test mode terminal, and the storage circuit. The test control circuit operates when the test mode signal is active, to apply data from addressed memory cells respectively on the first inputs of the comparison circuits. The test control circuit also applies respective expect data on the second inputs of the comparison circuits and controls the storage circuit to latch the resulting error signals and thereafter sequentially transfer the latched error signals onto the data terminal. The test circuit may include additional stages of comparison circuits to further compress read test data, as well as additional storage circuits for storing such additional compressed data.

    摘要翻译： 测试电路测试嵌入式DRAM的存储器部分中的有缺陷的存储单元。 嵌入式DRAM包括一组存储单元。 测试电路包括适于接收测试模式信号的测试模式终端和多个比较电路。 每个比较电路包括适于接收读取数据信号的第一输入和适于接收期望数据信号的第二输入。 每个比较电路比较读取和期望数据信号的二进制值，并且当比较的信号具有相同的二进制值时，在输出上产生和无效的误差信号，并且当比较的信号具有不同的二进制值时产生有效的误差信号。 存储电路耦合到比较电路的输出端。 存储电路锁存由比较电路输出的误差信号，并将锁存的误差信号依次传送到嵌入式DRAM的数据端。 测试控制电路耦合到比较电路，测试模式终端和存储电路。 当测试模式信号有效时，测试控制电路工作，分别将来自寻址的存储器单元的数据应用于比较电路的第一输入端。 测试控制电路还对比较电路的第二输入端施加各自的期望数据，并且控制存储电路以锁存所得到的误差信号，然后将锁存的误差信号顺序地传送到数据终端。 测试电路可以包括用于进一步压缩读取测试数据的另外的比较电路级，以及用于存储这种附加压缩数据的附加存储电路。

    Threshold voltage scalable buffer with reference level
    10.
    发明授权
    Threshold voltage scalable buffer with reference level 失效
    具有参考电平的阈值电压可伸缩缓冲器

    公开(公告)号：US5703500A

    公开(公告)日：1997-12-30

    申请号：US648443

    申请日：1996-05-15

    申请人： Huy Thanh Vo

    发明人： Huy Thanh Vo

    IPC分类号： H03K19/00 ,  H03K19/0185 ,  H03K19/0948

    CPC分类号： H03K19/018521 ,  H03K19/0016

    摘要： A buffer circuit (10). The buffer circuit (10) includes a first inverter (12) with a first current limiter (18) that limits the standby current used by the first inverter (12). Further, the buffer circuit (10) includes a second inverter (14) that is coupled to an output of the first inverter (12). The input buffer (10) converts a first logic level of an input signal provided to the first inverter (12) to a second logic level at an output of the second inverter (14). The buffer circuit (10) also includes a second current limiting circuit (16) that is coupled between the first and second inverters (12 and 14) to further limit the standby current in the buffer circuit (10).

    摘要翻译： 缓冲电路（10）。 缓冲电路（10）包括具有限制第一逆变器（12）使用的待机电流的第一限流器（18）的第一逆变器（12）。 此外，缓冲电路（10）包括耦合到第一反相器（12）的输出端的第二反相器（14）。 输入缓冲器（10）将提供给第一反相器（12）的输入信号的第一逻辑电平转换为第二反相器（14）的输出处的第二逻辑电平。 缓冲电路（10）还包括耦合在第一和第二反相器（12和14）之间的第二限流电路（16），以进一步限制缓冲电路（10）中的待机电流。