公开(公告)号：US20200273688A1

公开(公告)日：2020-08-27

申请号：US16647426

申请日：2018-08-03

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takayuki OHMURA ,  Masahiro KOTANI

IPC: H01J49/04 ,  G01N27/62 ,  B01L3/00

Abstract: Provided is a sample support body that includes a substrate, an ionization substrate, and a support. The ionization substrate has a plurality of measurement regions for dropping a sample on a second surface. A plurality of through-holes that open in a first surface and the second surface are formed at least in the measurement regions of the ionization substrate. A conductive layer is provided on peripheral edges of the through-holes at least on the second surface. The support has a first support provided on peripheral edges of the measurement regions on the first surface to separate the plurality of measurement regions when viewed in the direction in which the substrate and the ionization substrate face each other.

公开(公告)号：US20200264134A1

公开(公告)日：2020-08-20

申请号：US16644743

申请日：2018-08-22

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takayuki OHMURA ,  Masahiro KOTANI

IPC: G01N27/62 ,  H01J49/04

Abstract: Provided is a sample support body that includes a substrate, an ionization substrate, a support, and a frame. The ionization substrate has a plurality of measurement regions for dropping a sample on second surface. A plurality of through-holes that open in a first surface and the second surface are formed at least in the measurement regions of the ionization substrate. A conductive layer is provided on peripheral edges of the through-holes at least on the second surface. The frame has a wall provided on peripheral edges of the measurement regions on the second surface to separate the plurality of measurement regions when viewed in the direction in which the substrate and the ionization substrate face each other.

公开(公告)号：US20200219713A1

公开(公告)日：2020-07-09

申请号：US16647498

申请日：2018-07-31

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masahiro KOTANI ,  Takayuki OHMURA

IPC: H01J49/16 ,  G01N27/62 ,  H01J49/04

Abstract: A laser desorption/ionization method includes: a first process of preparing a sample support body that includes a substrate in which a plurality of through-holes are formed and a conductive layer that is provided on the first surface of the substrate; a second process of mounting a frozen sample on a mounting surface of a mount under a sub-freezing atmosphere, and fixing the sample support body to the mount in a state in which the second surface is in contact with the frozen sample; a third process of thawing the sample, and moving components of the thawed sample toward the first surface via the plurality of through-holes due to a capillary phenomenon; and a fourth process of irradiating the first surface with a laser beam while applying a voltage to the conductive layer, and ionizing the components that have moved toward the first surface.

公开(公告)号：US20200219710A1

公开(公告)日：2020-07-09

申请号：US16647306

申请日：2018-07-31

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masahiro KOTANI ,  Takayuki OHMURA

IPC: H01J49/04 ,  H01J49/00

Abstract: A mass spectrometer includes: a chamber; a support that, in a state in which, in a sample support body that includes a substrate in which a plurality of through-holes open in first and second surfaces are formed and a conductive layer that is at least provided on the first surface, the second surface thereof is in contact with a sample, supports the sample and the sample support body; a laser beam irradiation part that irradiates the first surface with a laser beam; a voltage application part that applies a voltage to the conductive layer; an ion detection part that, detects the ionized components of the sample in a space inside the chamber; a first light irradiation part that irradiates the sample with a first light from a side of the substrate; and an imaging part that obtains a reflected light image of the sample by the first light.

公开(公告)号：US20130187057A1

公开(公告)日：2013-07-25

申请号：US13744863

申请日：2013-01-18

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Hiroshi KOBAYASHI ,  Motohiro SUYAMA ,  Masahiro KOTANI ,  Takayuki OHMURA

IPC: G01T1/28

CPC classification number: G01T1/28

Abstract: An ion detector 1A for detecting positive ions is provided with a chamber 2 having an ion entrance 3 which allows positive ions to enter, a conversion dynode 9 which is disposed in the chamber 2 and to which a negative potential is applied, and an avalanche photodiode 30 that is disposed in the chamber 2 and has an electron incident surface 30a which is opposed to the conversion dynode 9 and also into which secondary electrons emitted from the conversion dynode 9 are made incident. The electron incident surface 30a is located closer to the conversion dynode 9 than a positioning part 14 which supports the avalanche photodiode 30 in the grounded chamber 2.

Abstract translation: 用于检测正离子的离子检测器1A设置有具有允许正离子进入的离子入口3的室2，设置在室2中并且施加负电位的转换倍增极9和雪崩光电二极管 30，其设置在室2中，并且具有与转换倍增极9相对的电子入射表面30a，并且入射从转换倍增极9发射的二次电子。 电子入射表面30a比在接地室2中支撑雪崩光电二极管30的定位部分14更靠近转换倍增极9。