摘要:
A human embryonic lung fibroblast diploid cell strain LBHEL(KCTC 0127BP) is highly susceptible to varicella zoster virus(VZV). A cell-free varicella zoster virus (VZV) is produced by (a) culturing the human embryonic lung fibroblast diploid cell strain LBHEL(KCTC 0127BP) of claim 1 in a culture vessel to give cultured LBHEL cells; (b) infecting the cultured LBHEL cells with VZV to give VZV-infected cells; (c) culturing and harvesting the VZV-infected cells; (d) disrupting the harvested cells to obtain a cell homogenate; and (e) centrifuging the cell homogenate to obtain a supernatant containing the cell-free VZV.
摘要:
Disclosed herein are a maskless exposure apparatus configured to perform exposure by tilting a beam spot array with respect to a scan direction (Y-axis direction) thus preventing stitching stripes and a stitching method using the same. A step distance, in which exposure dose uniformity in a stitching area is within a tolerance range, is calculated using actual position data of beam spots constituting the beam spot array on an exposure plane, and if necessary, using beam power data and/or beam size data. As exposure is performed based on image data conforming to the step distance, the stitching area has a uniform exposure dose, enabling exposure without stitching stripes.
摘要:
Provided is a process for purifying a vancomycin wet body, comprising: dissolving a wet body obtained from a microorganism-fermented solution containing vancomycin into a water soluble solvent to a concentration of about 1 to 40 g/L and carrying out reverse osmosis filtration; and carrying out lyophilization of the filtered vancomycin. The process for purifying a vancomycin wet body provides high-purity vancomycin, while avoiding degradation of stability during a drying step.
摘要:
Disclosed herein are a maskless exposure apparatus configured to perform exposure by tilting a beam spot array with respect to a scan direction (Y-axis direction) thus preventing stitching stripes and a stitching method using the same. A step distance, in which exposure dose uniformity in a stitching area is within a tolerance range, is calculated using actual position data of beam spots constituting the beam spot array on an exposure plane, and if necessary, using beam power data and/or beam size data. As exposure is performed based on image data conforming to the step distance, the stitching area has a uniform exposure dose, enabling exposure without stitching stripes.