公开(公告)号：US20090201041A1

公开(公告)日：2009-08-13

申请号：US12419912

申请日：2009-04-07

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07307 ,  G01R1/06733

Abstract: Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With this arrangement of probes, the probe base thickness can be made greater than the contact pad spacing along the contact line, thereby advantageously increasing the lateral stiffness of the probes. The probe tip thickness is less than the contact pad spacing, so probes suitable for practicing the invention have a wide base section and a narrow tip section.

Abstract translation: 通过具有所有探针尖端沿着单个接触线对准的垂直探针的阵列提供紧密间隔的接触垫的改进的探测，而探针基底布置成平行于接触线的两行或更多行的阵列。 利用这种探针的布置，可以使探针基底厚度大于沿着接触线的接触垫间距，从而有利地增加探针的横向刚度。 探针尖端厚度小于接触垫间距，因此适用于实施本发明的探针具有宽的基部和窄的尖端部分。

公开(公告)号：US20080265873A1

公开(公告)日：2008-10-30

申请号：US11635809

申请日：2006-12-06

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/06

CPC classification number: G01R1/06733

Abstract: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Abstract translation: 提供垂直折叠的探针，其可以在探针高度受限的情况下提供改善的擦洗性能。 更具体地，这种探针包括基部和尖端，以及从基部到尖端作为单个连续部件延伸的臂。 探针臂垂直折叠，使得其包括三个或更多个垂直臂部分。 垂直臂部具有相当大的垂直重叠，并且彼此横向移位。 当这种探针垂直向下放置在被测设备上时，探头变形。 在探针变形期间，至少两个垂直臂部彼此接触。 臂部之间的这种接触可以有利地增加探针尖端处的横向擦洗运动，并且还可以有利地减小探针电感。

公开(公告)号：US07436192B2

公开(公告)日：2008-10-14

申请号：US11701236

申请日：2007-01-31

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R3/00 ,  G01R1/06733

Abstract: A probe for engaging a conductive pad is provided. The probe includes a probe contact end for receiving a test current, a probe retention portion below the contact end, a block for holding the probe retention portion, a probe arm below the retention portion, a probe contact tip below the arm, and a generally planar self-cleaning skate disposed perpendicular below the contact tip. The self-cleaning skate has a square front, a round back and a flat middle section. The conductive pad is of generally convex shape having a granular non-conductive surface of debris and moves to engage the skate, whereby an overdrive motion is applied to the pad causing the skate to move across and scrub non-conductive debris from the pad displacing the debris along the skate and around the skate round back end to a position on the skate that is away from the pad.

公开(公告)号：US20080111572A1

公开(公告)日：2008-05-15

申请号：US12009128

申请日：2008-01-15

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07357 ,  G01R1/07371

Abstract: Method and apparatus using a retention arrangement with a potting enclosure for holding a plurality of probes by their retention portions, the probes being of the type having contacting tips for establishing electrical contact with pads or bumps of a device under test (DUT) to perform an electrical test. The retention arrangement has a top plate with top openings for the probes, a bottom plate with bottom openings for the probes, the plates being preferably made of ceramic with laser-machined openings, and a potting enclosure between the plates for admitting a potting agent that upon curing pots the retaining portions of the probes. In some embodiments a spacer is positioned between the top and bottom plates for defining the potting enclosure. Alternatively, the retention arrangement has intermediate plates located in the potting enclosure and having probe guiding openings to guide the probes.

公开(公告)号：US20080068035A1

公开(公告)日：2008-03-20

申请号：US11521944

申请日：2006-09-14

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/06733 ,  G01R1/07357

Abstract: An improved knee probe for probing electrical devices and circuits is provided. The improved knee probe has a reduced thickness section to alter the mechanical behavior of the probe when contact is made. The reduced thickness section of the probe makes it easier to deflect the probe vertically when contact is made. This increased ease of vertical deflection tends to reduce the horizontal contact force component responsible for the scrub motion, thereby decreasing scrub length. Here “thickness” is the probe thickness in the deflection plane of the probe (i.e., the plane in which the probe knee lies). The reduced thickness probe section provides increased design flexibility for controlling scrub motion, especially in combination with other probe parameters affecting the scrub motion.

Abstract translation: 提供了一种用于探测电气设备和电路的改进的膝部探针。 改进的膝关节探针具有减小的厚度部分，以在接触时改变探针的机械性能。 探头的厚度减小部分使接触时更容易使探针垂直偏转。 这种增加的垂直偏转的容易性倾向于减少负责擦洗运动的水平接触力分量，从而减少擦洗长度。 这里，“厚度”是探针的偏转平面中的探针厚度（即探针膝盖所在的平面）。 减小厚度的探针部分提供增加的设计灵活性，用于控制擦洗运动，特别是与影响擦洗运动的其他探头参数组合。

公开(公告)号：US20070152686A1

公开(公告)日：2007-07-05

申请号：US11450977

申请日：2006-06-09

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07357 ,  G01R1/06716 ,  G01R1/06733

Abstract: Improved probing is provided using a knee probe where the knee curves away from the probe axis and then curves back to connect to the probe tip, crossing the probe axis on the way to the tip. The resulting lateral offset between the probe tip and the probe axis is a key geometrical parameter for predetermining the scrub motion provided by the probe in response to a predetermined contact force. The scrub motion preferably includes both a sliding motion and a rocking motion, where the sliding motion acts to clean the contact pad and the rocking motion acts to bring a clean part of the probe tip into contact with the freshly cleaned part of the contact pad. In preferred embodiments, the probe tip can include one or more relatively narrow “skates” for making contact to the contact pad. A dual skate configuration is especially appropriate when small dimples are at the centers of the contact pads.

Abstract translation: 使用膝关节探针提供改进的探测，其中膝盖弯曲远离探针轴线，然后弯曲回来连接到探针尖端，在穿过尖端的路上穿过探针轴。 在探针尖端和探针轴线之间产生的横向偏移是用于预测由探针响应于预定接触力提供的擦洗运动的关键几何参数。 擦洗运动优选地包括滑动运动和摇摆运动，其中滑动运动用于清洁接触垫，并且摇摆运动用于使探针尖端的清洁部分与接触垫的新鲜清洁的部分接触。 在优选实施例中，探针尖端可以包括用于与接触垫接触的一个或多个相对较窄的“溜冰鞋”。 当小凹坑位于接触垫的中心时，双滑冰配置是特别合适的。

公开(公告)号：US07189078B2

公开(公告)日：2007-03-13

申请号：US11077054

申请日：2005-03-10

Applicant: January Kister ,  James Jaquette ,  Gene Tokraks

Inventor： January Kister ,  James Jaquette ,  Gene Tokraks

IPC: H01R12/00

CPC classification number: G01R1/06711 ,  G01R1/07307 ,  G01R3/00

Abstract: An interconnect assembly includes a number of interconnects combined in a preferably planar dielectric carrier frame having resilient portions acting as spring members in conjunction with their respective interconnect's rotational displacement during operational contacting. Each interconnect is fabricated as a see-saw structure pivoting around a rotation axis that substantially coincides with a symmetry plane of the torsion features provided by the resilient portion. The torsion features protrude towards and adhere to a central portion of the see-saw interconnect such that an angular movement of the interconnect is resiliently opposed by the torsion feature and the resilient portion. The torsion features and interconnects may be independently optimized to provide the interconnect with maximum stiffness and a maximum deflection at same time.

Abstract translation: 互连组件包括多个互连件，其组合在优选平面的电介质载体框架中，其具有在操作接触期间结合其相应互连的旋转位移作为弹簧构件的弹性部分。 每个互连件被制造为围绕旋转轴线枢转的跷跷板结构，该旋转轴线基本上与由弹性部分提供的扭转特征的对称平面重合。 扭转特征突出并附着到跷跷板互连的中心部分，使得互连件的角运动通过扭转特征和弹性部分弹性地相对。 扭转特征和互连可以被独立地优化，以在相同的时间为互连提供最大刚度和最大偏转。

公开(公告)号：US07091729B2

公开(公告)日：2006-08-15

申请号：US10888347

申请日：2004-07-09

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/06733 ,  G01R1/06727 ,  G01R1/07342 ,  G01R1/07357

Abstract: A cantilever probe has an elbow for bonding to a dual plane fixture plate for a highly stiff and precise angled fixture of the bonded cantilever probe with minimal real estate consumption. The cantilever probe may feature a tip positioning pin and an elbow positioning pin fitting into corresponding holes of the fixture plate and a sacrificial assembly plate. Separate fan-out beams may be attached to the fixture plate and conductively connected to respective elbows once the cantilever probes are fixed. The fan-out beams in turn may be conductively connected with their respective peripheral ends to large pitch apparatus terminals of a circuit board. A probe apparatus may be easily customized by providing varying drill patterns of the positioning holes for fan-out beams and cantilever probes to match pitch requirements of the tested circuit chips.

Abstract translation: 悬臂式探头具有弯头，用于粘接到双平面固定板，用于具有最小的房地产消耗的粘结悬臂式探头的高度刚性和精确的倾斜固定装置。 悬臂探头可以具有尖端定位销和弯头定位销，其适配到固定板的相应孔和牺牲组装板中。 一旦悬臂探头被固定，单独的扇出梁可以附接到固定板并且导电地连接到相应的弯头。 扇形光束又可以与它们各自的周边端部电连接到电路板的大型节距装置端子。 可以通过提供用于扇出光束和悬臂探针的定位孔的不同钻孔图案来匹配测试的电路芯片的间距要求来容易地定制探针装置。

公开(公告)号：USD525207S1

公开(公告)日：2006-07-18

申请号：US29194881

申请日：2003-12-02

Applicant: January Kister ,  James Jaquette ,  Steve Fahrner

Designer： January Kister ,  James Jaquette ,  Steve Fahrner

公开(公告)号：US07046021B2

公开(公告)日：2006-05-16

申请号：US10883568

申请日：2004-06-30

Applicant: January Kister

Inventor： January Kister

IPC: G01R324/754

CPC classification number: G01R1/07314

Abstract: A probe for test connecting an apparatus contact of a probe apparatus with a test contact of a tested electronic device along a contacting axis has a top structure, a bottom structure a spring member and a guide. The guide may be an outer guide face of the spring member or be part of the bottom or top structure in the form of a circumferential recess or a snap finger. The probe may be guided either slide ably in a rigid carrier structure and/or via its circumferential recess in one or two flexible membranes snapped on a rigid support frame. The probes may be simultaneously fabricated in large numbers by micro fabrication techniques with a fixed fabrication pitch and assembled in a probe apparatus with a probe pitch independently of the fabrication pitch.

Abstract translation: 用于将探针装置的装置接触与测试的电子装置沿着接触轴的测试接触连接的测试用探针具有顶部结构，底部结构，弹簧构件和引导件。 引导件可以是弹簧构件的外引导面，也可以是圆周凹部或卡扣指形式的底部或顶部结构的一部分。 探针可以被引导为在刚性载体结构中滑动，和/或通过其一个或两个弹性膜中的圆周凹槽卡扣在刚性支撑框架上。 探针可以通过具有固定制造间距的微制造技术大量同时制造，并且组装在具有与制造间距无关的探针间距的探针装置中。