摘要:
A laser processing apparatus includes a support table, a local exhaust device, and a laser light source unit. The support table supports a processing object. The local exhaust device directs laser light into a local exhaust unit in which pressure is locally adjusted over the support table. The laser light source unit outputs the laser light. The local exhaust device is capable of relatively being lifted from the support table by injecting a lift gas to the support table. The processing object includes a multilayer film formed of two or more layers with different materials. An input unit into which reflectance of the processing object is inputted is connected to the laser light source unit.
摘要:
In a contactless IC card (1), a rectification circuit (17) rectifies an electromagnetic wave received via an antenna (10) to provide a DC voltage, and an electric double-layer capacitor (18) quickly stores the power from the rectification circuit (17). The electric double-layer capacitor (18) supplies the electric power to circuits such as a modem (11), CPU (12), memory (13), controller IC (14), driver IC (15), etc. for operation, and rewrites information for display on a display device (16) using a cholesteric liquid crystal, ferroelectric liquid crystal or the like.
摘要:
A method of manufacturing a substrate formed with a plurality of wiring patterns on a base, includes: a first inspection step of identifying a faulty wiring pattern having electric short circuit or disconnection by performing an electric inspection respectively for the plurality of wiring patterns; a second inspection step of examining a relative position of a defect on the base and at least one of a type and a size of the defect by an optical inspection; a matching step of matching a result of the first inspection step with a result of the second inspection step, and identifying a critical defect having electric short circuit or disconnection; and a third inspection step of examining a relative position in a pixel and an effective range of the critical defect by an optical inspection.