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公开(公告)号:US5000572A
公开(公告)日:1991-03-19
申请号:US542656
申请日:1990-06-25
申请人: Noriyuki Nose , Minoru Yoshii , Yukichi Niwa , Ryo Kuroda
发明人: Noriyuki Nose , Minoru Yoshii , Yukichi Niwa , Ryo Kuroda
IPC分类号: G01D5/38
CPC分类号: G01D5/38
摘要: A device for measuring a moving distance of two relatively moving objects includes a first diffraction grating provided on one of the two objects and disposed along the relatively moving direction of the two objects, and a measuring portion provided on the other object. The measuring portion includes a second diffraction grating, a light source and a photodetecting system, wherein the light source provides lights which are projected upon two points on the second diffraction grating so that they emanate from the two points in the form of diffraction lights having different diffraction orders. The diffraction lights are directed to the same point on the first diffraction grating and are diffracted again by the first diffraction grating so that they are emitted in the same direction, and the photodetecting system is operable to detect a change in the light intensity caused due to the interference of the two lights emanating from the first diffraction grating. The device further includes a detecting system for detecting the relative moving distance of the two objects on the basis of the detection by the photodetecting.
摘要翻译: 用于测量两个相对移动物体的移动距离的装置包括设置在两个物体中的一个物体上并沿两个物体的相对移动方向设置的第一衍射光栅以及设置在另一物体上的测量部分。 测量部分包括第二衍射光栅,光源和光电检测系统,其中光源提供投射在第二衍射光栅上的两个点上的光,使得它们以具有不同的衍射光的形式的两个点发射 衍射指令。 衍射光被引导到第一衍射光栅上的同一点,并被第一衍射光栅再次衍射,使得它们沿相同的方向发射,并且光电检测系统可操作以检测由于 从第一衍射光栅发出的两个光的干涉。 该装置还包括检测系统,用于根据受光检测的检测来检测两个物体的相对移动距离。
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公开(公告)号:US4840473A
公开(公告)日:1989-06-20
申请号:US908725
申请日:1986-09-18
申请人: Nobuo Kushibiki , Noriyuki Nose , Toshiyuki Nakajima , Takeshi Baba , Masakazu Matsugu , Yukichi Niwa
发明人: Nobuo Kushibiki , Noriyuki Nose , Toshiyuki Nakajima , Takeshi Baba , Masakazu Matsugu , Yukichi Niwa
CPC分类号: G02B26/0875 , G11B7/09
摘要: An optical device is composed by sandwiching a deformable member between sandwiching members. The deformable member has a shear modulus decreasing toward the inside. The deformable member may be a combination of a core and a coating with different shear moduli or a single body having a continuoudly decreasing shear modulus. The sandwiching members may be a flat plate either transparent or opaque or a lens with or without reflecting film. Because of inner soft and outer hard elastic nature of the deformable member, the sandwiching members can easily change their relative position to change an optical path and an imaging position of the optical device with good durability.
摘要翻译: 光学装置通过将可变形构件夹在夹层构件之间而构成。 可变形构件的剪切模量向内侧减小。 可变形构件可以是具有不同剪切模量的芯和涂层的组合,或者具有连续降低的剪切模量的单体。 夹层构件可以是透明或不透明的平板或具有或不具有反射膜的透镜。 由于可变形构件的内部软和外部的硬弹性,因此夹持构件可以容易地改变其相对位置,以改变具有良好耐用性的光学装置的光路和成像位置。
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公开(公告)号:US4523801A
公开(公告)日:1985-06-18
申请号:US351936
申请日:1982-02-24
申请人: Takeshi Baba , Noriyuki Nose , Hideo Yoshikawa , Kazuo Minoura , Akinori Hasu , Setsuo Minami , Kazuhiko Matsuoka
发明人: Takeshi Baba , Noriyuki Nose , Hideo Yoshikawa , Kazuo Minoura , Akinori Hasu , Setsuo Minami , Kazuhiko Matsuoka
摘要: An optical system for scanning a medium with a beam spot includes a light beam generator, a deflector for deflecting the light beam in a predetermined direction and in deflection plane, and an imaging optical system between the deflector and the medium for imaging the light beam from the deflector on the medium as a beam spot, the imaging optical system having at least one lens element mode of a moisture absorbing material. The lens element has a shape in which the dimension in a direction parallel to the deflection plane of the light beam is greater than the dimension in a direction perpendicular to the deflection plane of the light beam. A device mitigates any influence on the imaged condition of the light beam on the medium caused by the lens element being subjected to moisture.
摘要翻译: 用于扫描具有束斑的介质的光学系统包括光束发生器,用于沿预定方向和偏转平面偏转光束的偏转器,以及偏转器和介质之间的成像光学系统,用于对来自 介质上的偏转器作为光束点,成像光学系统具有至少一种吸湿材料的透镜元件模式。 透镜元件具有与光束的偏转平面平行的方向上的尺寸大于垂直于光束的偏转平面的方向上的尺寸的形状。 一种装置减轻由透镜元件受到湿气导致的介质上的光束的成像状态的任何影响。
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