公开(公告)号：US06763604B2

公开(公告)日：2004-07-20

申请号：US10314615

申请日：2002-12-09

Applicant: Pascal Jordil ,  Adriano Zanier

Inventor： Pascal Jordil ,  Adriano Zanier

IPC: G01B502

CPC classification number: G01B5/061

Abstract: Column for measuring longitudinal dimensions (1) comprising: a supporting frame (2), a carriage (3) capable of moving along a measuring axis (z) along the supporting frame, a probe tip (44) connected to said carriage and designed to be brought into contact with the piece to be measured, a driving device of the carriage comprising a cable or belt (40) for moving said carriage along said measuring axis, a system for measuring the position of said carriage (3) along said measuring axis, a frame connected in an articulated manner to the carriage. The cable or belt are fastened to the frame. The articulation between the frame and the carriage allows at least one pivoting along a pivoting axis (x) parallel to the plane of said carriage. Advantages: the forces and moments exerted by the cable or belt are not exerted directly onto the carriage. The forces along an axis other than the measuring axis are absorbed by the frame.

Abstract translation: 用于测量纵向尺寸的柱（1）包括：支撑框架（2），能够沿着支撑框架沿着测量轴线（z）移动的托架（3），连接到所述托架的探针尖端（44） 与被测量件接触，所述托架的驱动装置包括用于沿着所述测量轴线移动所述托架的缆索或带（40），用于沿所述测量轴线测量所述托架（3）的位置的系统 ，以铰接方式连接到滑架的框架。 电缆或皮带固定在框架上。 框架和滑架之间的铰接允许沿着平行于所述滑架的平面的枢转轴线（x）进行至少一个枢转。优点：由电缆或皮带施加的力和力矩不会直接施加到滑架上。 沿测量轴以外的轴的力被框架吸收。

公开(公告)号：US06745488B2

公开(公告)日：2004-06-08

申请号：US10314805

申请日：2002-12-09

Applicant: Pascal Jordil ,  Adriano Zanier

Inventor： Pascal Jordil ,  Adriano Zanier

IPC: G01B502

CPC classification number: G01B5/245 ,  B23Q1/0054 ,  G01B5/0007 ,  G01B5/061

Abstract: Height-measuring column comprising a supporting frame fastened to a base, said supporting frame determining the measuring axis, it being possible to regulate the perpendicularity between the supporting frame and the base and method for regulating the perpendicularity of a height-measuring column relative to a reference surface by regulating the perpendicularity between the supporting frame and the base of said height-measuring column.

Abstract translation: 高度测量柱包括固定到基座的支撑框架，所述支撑框架确定测量轴线，可以调节支撑框架和底座之间的垂直度，以及用于调节高度测量柱相对于基座的垂直度的方法 通过调节支撑框架和所述高度测量柱的基座之间的垂直度来确定参考表面。