Abstract:
Two or more triangular apertures are employed to pass radiation from a source to a detector to reduce the amount of stray radiation received by the detector. Preferably, the two apertures are equilateral triangles oriented at 60° rotated relative to each other and have dimensions proportional to their distances from the sensor. A Bessel filter is employed to reduce the effect of flicker and other rapid changes in intensity in the radiance from the source. The output of the sensor is integrated and sampled at sampling time intervals that are powers of two of time, and a reading is provided when the output of the integrator exceeds the same threshold under all radiation source intensity conditions so that the meter has a substantially constant resolution at different signal levels.
Abstract:
A portable information device such as a portable telephone, portable electronic mail device or portable navigator capable of measuring UV-rays with no deterioration of the display function is provided. In the device, a UV-ray sensor is disposed in an information display region. The UV-sensor has light sensitivity only to UV-rays and preferably has a light receiving surface made of a compound semiconductor.
Abstract:
An optical monitoring unit includes a transmitting unit having plural light emitting diodes that are connected together two at a time in respective diode pairs. Each diode of each diode pair is respectively selectively connectable to a current source so as to operate as an active transmitting diode, or to a load resistor across which a voltage may be measured so as to operate as a monitoring diode. When any selected single diode is operated as the transmitting diode, its light output is measured and evaluated by operating the other diode of the pair as the monitoring diode, which receives optical crosstalk from the light output of the transmitting diode and correspondingly generates a photoelectric current through the load resistor.
Abstract:
A modulated fibre Bragg grating strain gauge assembly for absolute gauging of strain including at least one sensor element (1) in the form of a length of optical fibre containing, along part its length, means for partially reflecting light (1a), means for generating and passing a beam of light (2a) with a spectral feature less than 0.1 nanometers in width into the at least one sensor element (1) where reflection takes place, which reflection is a substantially sinusoidal intensity variation in wavelength over a range of from 2 to 3 nanometers comprising at least two substantially sinusoidal periods such that as the at least one sensor element sustains a change in length resulting from a strain thereon, the reflected intensity varies substantially sinusoidally along the at least two sinusoidal periods, means for receiving and processing the reflected light (2b) to establish the light intensity values at one (1f) and two times (2f) a modulation frequency (1f) applied to the means for generating the beam of light (2a), and means to determine an absolute direction and magnitude of strain from a ratio of the intensity values 1f:2f.
Abstract:
A light measurement device that selectively operates in a normal light measurement mode, in which the output from a sensor cell is logarithmically compressed and directly output as an output, or an integration light measurement mode, in which a signal obtained by integrating the output with an integrating circuit is output. In the integration light measurement mode, since the integrated output can be slowly read out after strobo light emission, accurate light measurement can be performed within a predetermined light measurement time even when the number of divisions of the sensor is increased.
Abstract:
A measurement method and a measurement apparatus for measuring the structure of a micro-structure or the structure along the depth of an object for measurement. The laser light from a solid-state laser light source is subjected to wavelength conversion to generate the ultraviolet laser light, and measurement is made of the object for measurement by heterodyne detection or homodyne detection employing the ultraviolet laser light. This enables measurement of a structure of a micro-structure. Alternatively, the laser light is split into multiple laser light beams and frequency shifted so that the laser light beams will be of different frequencies. The laser light beams are imaged at respective different focal point positions to perform heterodyne detection. The resulting heterodyne signals are separated into respective frequency bands and measurement is made of the structure of the object for measurement in association with the respective imaging points. This enables measurement of the structure of the object for measurement in the direction along its depth.
Abstract:
A portable laser beam monitor utilizes a plurality of optical trains to monitor ultraviolet laser beam profiles at a plurality of positions along a laser beam path. A preferred embodiment useful for monitoring beam profiles of lithography lasers measures the beam profile at the front aperture, the rear aperture, the shutter plane and at infinity (the divergence plane). The beam profiles are imaged on a fluorescent screen which is monitored by a visible light camera. Images of the profiles may be discharged on the screen of a lap top computer.
Abstract:
An improved system and method for obtaining photogrammetric measurements which eliminates optical distortions created by thermal gradients on windows that are used to protect the photogrammetry camera. A gate valve is introduced between the window and the wall that opens for a limited time to allow the camera to take measurements of a test article contained within a thermal testing chamber. This limits or eliminates any thermal gradients on the window and improves photogrammetric measurements. With a gate valve the window can be removed entirely, as the gate valve can prevent a thermal gradient from being introduced to the lens of the photogrammetry camera. The improved system is suited for making close-in photogrammetric measures of test articles on earth.
Abstract:
By employing a high-repeatability optical switch that transmits input optical power selectively either to the standard or the unit under test (UUT), OPHASE presents a system for performing a rapid, repeatable comparison between the standard and the UUT. Further, the selective routing of beam traveling through one of the two output fibers that are coupled to the switch either to the standard or the UUT enables the elimination of much of the system uncertainty by enabling initial characterization of the ratio, Rp, and inequivalence, Im, between the power outputs of the multiple output fibers coupled to the switch. This characterization is accomplished by using an angled interface which is constructed so as to allow simultaneous coupling of the multiple output fibers to the angled interface and enable the power readout of all the output fibers at the standard. Rp and Im are then used to calculate the correction factor that reduces the total uncertainty level in the subsequent calibration of the unit under test.
Abstract:
A device is proposed, which makes it possible to ascertain the relative position of the reference axis BA of an object relative to a reference beam Rp of an electro-magnetic radiation, in particular a laser beam. The device displays a spatially fixed radiation transmitter S and at the object end a splitting mirror 22 as well as two position detectors 23 and 25. The splitting mirror branches a partial beam Rp′ off from the reference beam. The reference beam passing rectilinearly through the splitting mirror impinges on the one position detector and the partial beam on the other. The position detectors supply electrical signals, from which the position of the reference axis is ascertainable by means of a computer. The known devices of this species have an appreciable space requirement. This defect is eliminated by particular structuring of the beam conduction and the additional use of special optical means. Beyond that, the measurement possibilities can be enlarged through additional emission of a second reference beam Rs.