Fast particle generating apparatus
    61.
    发明申请
    Fast particle generating apparatus 失效
    快速粒子发生装置

    公开(公告)号:US20070176078A1

    公开(公告)日:2007-08-02

    申请号:US10553432

    申请日:2004-04-22

    IPC分类号: G01J1/32

    CPC分类号: G21K1/06

    摘要: A laser beam L1 emitted from a laser source 10 is projected onto a target 30 set in a vacuum chamber 60 while being focused by a focusing optical system 20. This results in generating fast particles P such as protons and emitting the particles from the target 30. A light measuring device 40 measures plasma emission L2 from the target 30 upon in-focus irradiation with the laser beam L1 and an analyzing device 50 analyzes a measurement signal therefrom to assess a generation state of fast particles P. Then the focusing optical system 20 and target 30 are controlled through optical system moving mechanism 25 and target moving mechanism 35 on the basis of the result of the analysis and feedback control is performed on the generation state of fast particles P in the target 30. This realizes a fast particle generating apparatus capable of monitoring the generation state of fast particles in real time and thereby efficiently generating the fast particles.

    摘要翻译: 从激光源10发射的激光束L 1被投射到设置在真空室60中的目标30上,同时被聚焦光学系统20聚焦。 这导致产生诸如质子的快速颗粒P并从靶30发射颗粒。 光测量装置40在对激光束L 1进行聚焦照射时测量来自靶30的等离子体发射L 2,并且分析装置50从其分析测量信号,以评估快速颗粒P的产生状态。然后聚焦光学系统 20和目标30根据分析结果通过光学系统移动机构25和目标移动机构35进行控制,并且对目标30中的快速粒子P的生成状态进行反馈控制。 这实现了能够实时监测快速颗粒的生成状态并从而有效地产生快速颗粒的快速颗粒产生装置。

    Sheet feeding device and image forming apparatus
    62.
    发明申请
    Sheet feeding device and image forming apparatus 有权
    送纸装置和成像装置

    公开(公告)号:US20070013760A1

    公开(公告)日:2007-01-18

    申请号:US11486857

    申请日:2006-07-14

    IPC分类号: B41J2/01

    CPC分类号: B41J13/103

    摘要: A sheet feeding device for manually feeding a sheet to a specified apparatus such as an image forming apparatus is provided with a manual feed tray for guiding a sheet being manually fed, and a pair of cursors provided on the manual feed tray and movable in opposite directions along a sheet width direction normal to a sheet conveyance direction in accordance with the width of the sheet. The pair of cursors are operable such that the front end positions and/or the rear end positions thereof with respect to the sheet conveyance direction are shifted along the sheet conveyance direction.

    摘要翻译: 用于将纸张手动地输送到诸如图像形成装置的指定装置的片材进给装置设置有用于引导手动进给的片材的手动进给托盘和设置在手动进给托盘上并可相反方向运动的一对光标 沿着纸张宽度方向垂直于纸张输送方向。 一对光标可操作,使得其相对于纸张输送方向的前端位置和/或后端位置沿纸张输送方向移动。

    Die for forming honeycomb structure and method of manufacturing the same
    63.
    发明申请
    Die for forming honeycomb structure and method of manufacturing the same 有权
    用于形成蜂窝结构的模具及其制造方法

    公开(公告)号:US20060034972A1

    公开(公告)日:2006-02-16

    申请号:US11186970

    申请日:2005-07-22

    IPC分类号: B29C47/12

    摘要: There is disclosed a die for forming a honeycomb structure, which realizes a sophisticated formability and which is superior in resistance to wear. A die for forming the honeycomb structure is provided with a die base having two surfaces, one surface is provided with slits of a honeycomb shape, and the other surface is provided with back holes which introduce a forming material therethrough. This die base includes: a die precursor which is obtained by stacking and bonding a first member which is one surface of the die base and is made of a tungsten carbide-based super hard alloy containing at least tungsten carbide, and a second member which is the other surface of the die base and is made of a metal material capable of causing at least one of three phase transformations of martensite transformation, bainite transformation, and pearlite transformation by cooling of an austenite phase together. Tensile and compressive stresses in a mutually bonded surface of the two plate-like members are 1000 MPa or less.

    摘要翻译: 公开了一种用于形成蜂窝结构的模具,其实现了复杂的成形性,并且耐磨性优异。 用于形成蜂窝结构的模具设置有具有两个表面的模座,一个表面设置有蜂窝状的狭缝,另一个表面设置有通过其引入成形材料的后孔。 该模具基体包括:模具前体,其通过堆叠并接合作为模具基座的一个表面的第一构件并且由至少含有碳化钨的碳化钨类超硬合金构成,第二构件是 模具基体的另一个表面由金相材料制成,该金属材料通过一起冷却奥氏体相,能够引起马氏体相变,贝氏体相变和珠光体相变的三相转变中的至少一种。 两个板状构件的相互接合的表面中的拉伸和压缩应力为1000MPa以下。

    Electric field measuring apparatus
    64.
    发明授权
    Electric field measuring apparatus 失效
    电场测量仪

    公开(公告)号:US5896035A

    公开(公告)日:1999-04-20

    申请号:US779564

    申请日:1997-01-07

    CPC分类号: G01R29/0885

    摘要: An electric field measuring apparatus can guide, with a predetermined optical path length, pulse light with a short pulse width output from a laser light source to an object to be measured or an electric field sensor without expansion of the pulse width caused by wavelength dispersion, thereby enabling electric field measurement with a high time resolution. A laser luminous flux incident on an input end of an input optical system is divided by a light dividing section into probe light and pumping light. After being transmitted through a light delaying device, the probe light is guided through an articulated light guiding patt at reflecting mirror type in which a plurality of tubular light guiding sections, each of which has a light guiding path therewithin inducing substantially no wavelength dispersion with a bending point at which reflecting mirror is disposed, are rotatably cascaded to each other such that their light guiding paths coincide with each other by way of joint sections, so as to be supplied to a microscope unit. On the other hand, the pumping light is guided through an articulated probe light guiding path of reflecting mirror type so as to irradiate an object to be measured. Also, a CCD camera is coupled to the exit end of an articulated reflecting mirror type light guiding path, allowing the positioning of the point irradiated with the pumping light.

    摘要翻译: 电场测量装置可以以预定的光程长度引导从激光光源输出到被测量物体的短脉冲宽度的脉冲光或电波传感器,而不会由波长分散引起的脉冲宽度扩大, 从而能够以高时间分辨率实现电场测量。 入射到输入光学系统的输入端的激光光束被光分离部分分成探测光和泵浦光。 在通过光延迟装置传输之后,探测光被引导通过反射镜类型的铰接导光板,其中多个管状导光部分在其中具有导光路径,其中基本上不引入波长色散, 设置反射镜的弯曲点可彼此可旋转地级联,使得它们的导光路径通过接合部分彼此重合,以供应到显微镜单元。 另一方面,泵浦光被引导通过反射镜类型的铰接式探针光引导路径,以照射被测量物体。 而且,CCD相机耦合到关节式反射镜型光导路径的出口端,从而允许用泵浦光照射的点的定位。

    Low jitter trigger circuit for electro-optic probing apparatus
    65.
    发明授权
    Low jitter trigger circuit for electro-optic probing apparatus 失效
    用于电光探测装置的低抖动触发电路

    公开(公告)号:US5847570A

    公开(公告)日:1998-12-08

    申请号:US693969

    申请日:1996-08-07

    CPC分类号: G01R13/32

    摘要: A trigger circuit is composed of a frequency multiplying portion which receives an electric signal to be measured and multiplies its repetitive frequency so as to output a multiple signal, a comparing portion which receives this multiple signal and outputs a square wave signal corresponding to its value, and a dividing portion which divides the square wave signal so as to output a trigger signal. Accordingly, even when a noise component is superposed on the electric signal to be measured, a trigger signal having little jitter and a repetitive frequency lower than that of the electric signal to be measured is output. Also, the electric field measuring apparatus in accordance with the present invention comprises this trigger circuit and measures, with a highly accurate timing, the electric field of the object to be measured.

    摘要翻译: 触发电路由接收要测量的电信号并乘以其重复频率以输出多个信号的倍频部分组成,接收该多个信号的比较部分输出与其值对应的方波信号, 以及划分部分,其分割方波信号以输出触发信号。 因此,即使在要测量的电信号上叠加噪声成分的情况下,也能够输出抖动小,重复频率低于待测电信号的触发信号。 此外,根据本发明的电场测量装置包括该触发电路,并且以高度精确的定时测量被测量物体的电场。

    Electro-optic voltage measurement apparatus
    66.
    发明授权
    Electro-optic voltage measurement apparatus 失效
    电光电压测量装置

    公开(公告)号:US5625296A

    公开(公告)日:1997-04-29

    申请号:US597226

    申请日:1996-02-06

    CPC分类号: G01R31/311

    摘要: A processing unit notifies a drive unit of a designated number N (=1, 2, . . . ). The drive unit supplies a drive signal of a frequency f.sub.0 to a target measurement device, and supplies a modulation signal of a frequency N.multidot.f.sub.0 +.DELTA.f to an optical modulator. In this state, a continuous emission light beam is emitted from a light source, incident on an E-O probe sequentially through a polarizer and a first optical system, influenced by a periodical voltage waveform generated at a target measurement portion at a fundamental period 1/f.sub.0 to modulate the polarized state, and output from the E-O probe. The optical signal whose polarized state is modulated is input to the optical modulator and modulated. Thereafter, a polarization direction is selected by an optical selection unit, and the optical signal is input to an photodetector 510 and heterodyne-detected. The processing unit reproduces the waveform of the voltage signal generated at the target measurement portion by calculation of Fourier transform on the basis of the obtained photodetection signal and displays the waveform.

    摘要翻译: 处理单元向驱动单元通知指定数量N(= 1,2,...)。 驱动单元向目标测量装置提供频率f0的驱动信号,并将频率Nxf0 + DELTA f的调制信号提供给光调制器。 在这种状态下,从光源发射连续发射光束,其依次通过偏振器和第一光学系统入射到EO探测器上,受到在基本周期1 / f0的目标测量部分产生的周期性电压波形的影响 以调制极化状态,并从EO探头输出。 将调制了偏振状态的光信号输入到光调制器并进行调制。 此后,通过光学选择单元选择偏振方向,并且将光信号输入到光电检测器510并进行外差检测。 处理单元通过基于获得的光电检测信号计算傅立叶变换来再现在目标测量部分产生的电压信号的波形,并显示波形。

    Polarized light measuring apparatus and phase plate measuring apparatus
    67.
    发明授权
    Polarized light measuring apparatus and phase plate measuring apparatus 失效
    偏光测量装置和相板测量装置

    公开(公告)号:US5237388A

    公开(公告)日:1993-08-17

    申请号:US762457

    申请日:1991-09-19

    IPC分类号: G01J4/00 G01J4/04 G01M11/02

    CPC分类号: G01J4/04

    摘要: Young's interferometer consisting of a single slit and a double slit member, and an analyzer are arranged along the axis of light to be measured. Parallel slits of the double slit member are provided with respective polarizers whose paralyzing directions are at .+-.45.degree. to the longitudinal direction of the parallel slits. The polarizing direction of the analyzer is set in parallel with the parallel slits. The incident light passes through Young's interferometer and the analyzer to form an interference fringe, which is detected by an image detector unit. An image analyzer unit produces an intensity profile of the interference fringe and determines the polarization state of the incident light, for instance, by comparing the produced intensity profile with conceivable profiles stored in advance.

    摘要翻译: 由单个狭缝和双缝隙构件组成的杨氏干涉仪和分析器沿着待测量的光轴设置。 双缝构件的平行狭缝设置有各自的偏振器,其麻痹方向与平行狭缝的纵向方向成+/- 45度。 分析仪的偏振方向与平行狭缝平行设置。 入射光通过杨氏干涉仪和分析仪,形成一个由图像检测器单元检测的干涉条纹。 图像分析器单元产生干涉条纹的强度分布并且确定入射光的偏振状态,例如通过将产生的强度分布与预先存储的可想到的曲线进行比较。

    Low noise pulsed light source using laser diode
    69.
    发明授权
    Low noise pulsed light source using laser diode 失效
    低噪声脉冲光源使用激光二极管

    公开(公告)号:US5128950A

    公开(公告)日:1992-07-07

    申请号:US560773

    申请日:1990-07-31

    IPC分类号: G01R15/24 H01S5/0683

    CPC分类号: G01R15/247 H01S5/06835

    摘要: A low noise pulsed light source using a laser diode for generating a short pulsed light of a high repetitive frequency. The low noise pulsed light source includes a laser diode drived by an electric pulse generator for emitting repetitive pulsed light; a current source for supplying a bias current to the laser diode; and a photodetector for detecting the repetitive pulsed light emitted from the laser diode; and control means. The control means modulates at least one of the bias current from the current source and the amplitude of a pulse signal generated from the electric pulse generator in accordance with an output signal from the photodetector such that the intensity of the pulsed light is kept unchanged and any noise involved in the same is reduced.

    Voltage detecting device
    70.
    发明授权
    Voltage detecting device 失效
    电压检测装置

    公开(公告)号:US5034683A

    公开(公告)日:1991-07-23

    申请号:US460645

    申请日:1990-01-03

    IPC分类号: G01R15/24 G01R31/308

    CPC分类号: G01R31/308 G01R15/242

    摘要: A voltage detecting device for detecting voltages in an object under test including an electro-optic material covering a plurality of parts of the object under test; the refractive index of the electro-optic material being variable according to an applied voltage. A light source emits light through the electro-optic material toward the object under test and a detecting device receives an emergent light beam reflected from within the electro-optic material in order to detect voltages in the object. Further, a scanning device automatically scans the object under test with the light beam in order to detect voltages at a plurality of locations on the object.