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    Fast particle generating apparatus
    1.
    发明授权
    Fast particle generating apparatus 失效
    快速粒子发生装置

    公开(公告)号：US07460228B2

    公开(公告)日：2008-12-02

    申请号：US10553432

    申请日：2004-04-22

    申请人： Hironori Takahashi ,  Masatoshi Fujimoto ,  Shin-Ichiro Aoshima

    发明人： Hironori Takahashi ,  Masatoshi Fujimoto ,  Shin-Ichiro Aoshima

    IPC分类号： G01J3/00

    CPC分类号： G21K1/06

    摘要： A laser beam emitted from a laser source is projected onto a target set in a vacuum chamber while being focused by a focusing optical system. This results in generating fast particles, such as protons and emitting the particles from the target. A light measuring device measures plasma emission from the target upon in-focus irradiation with the laser beam and an analyzing device analyzes a measurement signal therefrom to assess a generation state of fast particles. Then the focusing optical system and target are controlled through optical system moving mechanism and target moving mechanism on the basis of the result of the analysis and feedback control is performed on the generation state of fast particles in the target. This realizes a fast particle generating apparatus capable of monitoring the generation state of fast particles in real time and thereby efficiently generating the fast particles.

    摘要翻译： 从激光源发射的激光束被投射到真空室中的目标组上，同时被聚焦光学系统聚焦。 这导致产生快速的颗粒，例如质子，并从目标物中发射出粒子​​。 光测量装置在用激光束进行聚焦照射时测量来自靶的等离子体发射，并且分析装置从其分析测量信号以评估快速颗粒的产生状态。 然后基于分析结果，通过光学系统移动机构和目标移动机构控制聚焦光学系统和目标，并对目标中快速粒子的产生状态进行反馈控制。 这实现了能够实时监测快速颗粒的生成状态并从而有效地产生快速颗粒的快速颗粒产生装置。

    Fast particle generating apparatus
    2.
    发明申请
    Fast particle generating apparatus 失效
    快速粒子发生装置

    公开(公告)号：US20070176078A1

    公开(公告)日：2007-08-02

    申请号：US10553432

    申请日：2004-04-22

    申请人： Hironori Takahashi ,  Masatoshi Fujimoto ,  Shin-Ichiro Aoshima

    发明人： Hironori Takahashi ,  Masatoshi Fujimoto ,  Shin-Ichiro Aoshima

    IPC分类号： G01J1/32

    CPC分类号： G21K1/06

    摘要： A laser beam L1 emitted from a laser source 10 is projected onto a target 30 set in a vacuum chamber 60 while being focused by a focusing optical system 20. This results in generating fast particles P such as protons and emitting the particles from the target 30. A light measuring device 40 measures plasma emission L2 from the target 30 upon in-focus irradiation with the laser beam L1 and an analyzing device 50 analyzes a measurement signal therefrom to assess a generation state of fast particles P. Then the focusing optical system 20 and target 30 are controlled through optical system moving mechanism 25 and target moving mechanism 35 on the basis of the result of the analysis and feedback control is performed on the generation state of fast particles P in the target 30. This realizes a fast particle generating apparatus capable of monitoring the generation state of fast particles in real time and thereby efficiently generating the fast particles.

    摘要翻译： 从激光源10发射的激光束L 1被投射到设置在真空室60中的目标30上，同时被聚焦光学系统20聚焦。 这导致产生诸如质子的快速颗粒P并从靶30发射颗粒。 光测量装置40在对激光束L 1进行聚焦照射时测量来自靶30的等离子体发射L 2，并且分析装置50从其分析测量信号，以评估快速颗粒P的产生状态。然后聚焦光学系统 20和目标30根据分析结果通过光学系统移动机构25和目标移动机构35进行控制，并且对目标30中的快速粒子P的生成状态进行反馈控制。 这实现了能够实时监测快速颗粒的生成状态并从而有效地产生快速颗粒的快速颗粒产生装置。

    Total reflection terahertz wave measurement device
    5.
    发明授权
    Total reflection terahertz wave measurement device 有权
    全反射太赫兹波测量装置

    公开(公告)号：US08415625B2

    公开(公告)日：2013-04-09

    申请号：US12988158

    申请日：2009-04-27

    申请人： Atsushi Nakanishi ,  Yoichi Kawada ,  Takashi Yasuda ,  Hironori Takahashi ,  Masatoshi Fujimoto ,  Shinichiro Aoshima ,  Atsuko Aoshima

    发明人： Atsushi Nakanishi ,  Yoichi Kawada ,  Takashi Yasuda ,  Hironori Takahashi ,  Masatoshi Fujimoto ,  Shinichiro Aoshima

    IPC分类号： G01J5/02

    CPC分类号： G01N21/552 ,  G01N21/3504 ,  G01N21/3586

    摘要： A total reflection terahertz wave measuring apparatus 1 includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a beam splitter 17, a terahertz wave generating element 20, a filter 25, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance surface 31a, an exit surface 31b, and a reflection surface 31c. The terahertz wave generating element 20 and the filter 25 are provided to be integrated with the entrance surface 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit surface 31b of the internal total reflection prism 31. The filter 25 allows a terahertz wave to be transmitted therethrough and blocks pump light. Accordingly, a total reflection terahertz wave measuring apparatus, which can be downsized, can be realized.

    摘要翻译： 全反射太赫波测量装置1包括光源11，分支部12，斩波器13，光程长度差调节部14，偏振器15，分束器17，太赫兹波发生元件20，滤光器 25，内部全反射棱镜31，太赫兹波检测元件40，1/4波片51，偏振分离元件52，光电检测器53a，光电检测器53b，差分放大器54和锁定放大器55。 内部全反射棱镜31是所谓的平行棱镜，具有入射面31a，出射面31b和反射面31c。 太赫兹波发生元件20和滤波器25设置成与内部全反射棱镜31的入射面31a一体化，太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化 滤光器25允许太赫兹波被透过并阻止泵浦光。 因此，能够实现小型化的全反射太赫兹波测量装置。

    TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE
    7.
    发明申请
    TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE 有权
    总反射TERAHERTZ波形测量装置

    公开(公告)号：US20110249253A1

    公开(公告)日：2011-10-13

    申请号：US12988158

    申请日：2009-04-27

    申请人： Atsushi Nakanishi ,  Yoichi Kawada ,  Takashi Yasuda ,  Hironori Takahashi ,  Masatoshi Fujimoto ,  Shinichiro Aoshima ,  Atsuko Aoshima

    发明人： Atsushi Nakanishi ,  Yoichi Kawada ,  Takashi Yasuda ,  Hironori Takahashi ,  Masatoshi Fujimoto ,  Shinichiro Aoshima ,  Atsuko Aoshima

    IPC分类号： G01J3/00

    CPC分类号： G01N21/552 ,  G01N21/3504 ,  G01N21/3586

    摘要： A total reflection terahertz wave measuring apparatus 1 includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a beam splitter 17, a terahertz wave generating element 20, a filter 25, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance surface 31a, an exit surface 31b, and a reflection surface 31c. The terahertz wave generating element 20 and the filter 25 are provided to be integrated with the entrance surface 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit surface 31b of the internal total reflection prism 31. The filter 25 allows a terahertz wave to be transmitted therethrough and blocks pump light. Accordingly, a total reflection terahertz wave measuring apparatus, which can be downsized, can be realized.

    摘要翻译： 全反射太赫波测量装置1包括光源11，分支部12，斩波器13，光程长度差调节部14，偏振器15，分束器17，太赫兹波发生元件20，滤光器 25，内部全反射棱镜31，太赫兹波检测元件40，1/4波片51，偏振分离元件52，光电检测器53a，光电检测器53b，差分放大器54和锁定放大器55。 内部全反射棱镜31是所谓的平行棱镜，具有入射面31a，出射面31b和反射面31c。 太赫兹波发生元件20和滤波器25设置成与内部全反射棱镜31的入射面31a一体化，太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化 滤光器25允许太赫兹波被透过并阻止泵浦光。 因此，能够实现小型化的全反射太赫兹波测量装置。

    Flexible and scalable operating system achieving a fast boot and reliable operation
    8.
    发明授权
    Flexible and scalable operating system achieving a fast boot and reliable operation 有权
    灵活可扩展的操作系统实现了快速启动和可靠运行

    公开(公告)号：US08887159B2

    公开(公告)日：2014-11-11

    申请号：US12243843

    申请日：2008-10-01

    申请人： Hironori Takahashi ,  Motoki Hirano ,  Peirong Liu ,  Yoichi Sato

    发明人： Hironori Takahashi ,  Motoki Hirano ,  Peirong Liu ,  Yoichi Sato

    IPC分类号： G06F9/46 ,  G06F9/48 ,  G06F9/54

    CPC分类号： G06F9/4843 ,  G06F9/545

    摘要： Systems and methods are provided for a flexible and scalable operating system achieving a fast boot. A computing system is described that includes a reserved static object memory configured to store predefined static threads, and a secure kernel configured to be executed in a fast boot mode. The secure kernel further may be configured to chain the static threads to a secure kernel thread queue stored in a secure kernel work memory, and to create temporary threads in the secure kernel work memory during the fast boot mode. The computing system may include a main kernel configured to be initialized by creating dynamic threads in a main kernel work memory during the fast boot mode. The main kernel may be configured to chain the static threads to a main kernel thread queue, and to assume control of the static threads from the secure kernel.

    摘要翻译： 提供了系统和方法，用于实现快速启动的灵活且可扩展的操作系统。 描述了一种计算系统，其包括被配置为存储预定义的静态线程的保留静态对象存储器，以及配置为以快速启动模式执行的安全内核。 安全内核还可以被配置为将静态线程链接到存储在安全内核工作存储器中的安全内核线程队列，并且在快速引导模式期间在安全内核工作存储器中创建临时线程。 计算系统可以包括被配置为通过在快速启动模式期间在主内核工作存储器中创建动态线程来初始化的主内核。 可以将主内核配置为将静态线程链接到主内核线程队列，并承担来自安全内核的静态线程的控制。

    Die for forming honeycomb structure
    9.
    发明授权
    Die for forming honeycomb structure 有权
    用于形成蜂窝结构的模具

    公开(公告)号：US08353695B2

    公开(公告)日：2013-01-15

    申请号：US12562382

    申请日：2009-09-18

    申请人： Hironori Takahashi

    发明人： Hironori Takahashi

    IPC分类号： B29C47/20

    CPC分类号： B23P15/243 ,  B28B3/269 ,  C22C38/18 ,  C22C38/40

    摘要： A joined article in which a first metal member made of a tungsten carbide base cemented carbide and a second metal member made of a martensitic stainless steel having a carbon equivalent of 2.5 to 3.5 and containing 0.030 mass % or less of sulfur are joined. The martensitic stainless steel having the carbon equivalent of 2.5 to 3.5 is preferably at least one selected from the group consisting of SUS431, SUS420J1, SUS420J2, SUS410, SUS410J1, S-STAR, PROVA-400, HPM38, STAVAX ESR, and SUS403 in the joined article. There is disclosed a joined article in which the lowering of the strength of a second metal member around a joining interface thereof is prevented.

    摘要翻译： 将由碳化钨基底硬质合金构成的第一金属构件和碳当量为2.5〜3.5，含有0.030质量％以下的硫的马氏体系不锈钢的第二金属构件接合在一起的接合体。 碳当量为2.5〜3.5的马氏体系不锈钢优选为选自SUS431，SUS420J1，SUS420J2，SUS410，SUS410J1，S-STAR，PROVA-400，HPM38，STAVAX ESR和SUS403中的至少一种。 加入文章。 公开了一种接合制品，其中防止第二金属构件围绕其接合界面的强度降低。

    Fixing device and image forming apparatus
    10.
    发明授权
    Fixing device and image forming apparatus 有权
    固定装置和成像装置

    公开(公告)号：US08295725B2

    公开(公告)日：2012-10-23

    申请号：US12615422

    申请日：2009-11-10

    申请人： Hironori Takahashi

    发明人： Hironori Takahashi

    IPC分类号： G03G15/20

    CPC分类号： G03G15/2032 ,  G03G15/2028 ,  G03G2215/2009

    摘要： An image forming apparatus includes a fixing device. The fixing device includes a heating member and a pressing member that form a fixing nip, an approach guide positioned an upstream in a recording-medium conveyance direction of a fixing nip, a fixing-pressure-changing mechanism designed to change the fixing device between a high-pressure mode and a low-pressure mode, and an approach-guide-changing mechanism designed to change an angle of the approach guide in conjunction with the changing by the fixing-pressure-changing mechanism.

    摘要翻译： 图像形成装置包括定影装置。 定影装置包括加热构件和形成定影夹持部的按压构件，定位在定影夹持部的记录介质传送方向上游的接近引导件，设置成将定影装置改变为定影夹持部的定影压力改变机构 高压模式和低压模式，以及设计成随着定影压力变化机构的变化而改变进入导板的角度的进场导向换档机构。