Abstract:
Because the ejection state of a printing element in a printing apparatus may vary at all times, an inspection item for inspecting a printed image may be set in consideration of the ejection state of the printing element. An inspection item for inspecting a printed image may be set based on information including a temperature characteristic of a printing head and a state of ink such as an elapsed time from the last ejection. This allows image inspection that matches with variations in the ejection state of the printing element.
Abstract:
In an image processing apparatus for carrying out a plurality of correction processes on an input image, a multi-dimensional histogram of the input image is calculated, and a feature amount of the input image for which a specific correction process has been carried out is analyzed based on the multi-dimensional histogram. Then, based on the result of the analysis, correction parameters to be used for another correction process are calculated.
Abstract:
A frequency distribution of luminances is acquired from an image data acquired by optically reading a document. A frequency distribution of luminances of a background of the document is generated using the maximum frequency of the acquired frequency distribution as the maximum frequency of the frequency distribution of the luminances of the background of the document. A difference between the generated frequency distribution of the luminances of the background of the document and the acquired frequency distribution of the luminances is acquired, and the frequency distribution of the luminances of the background of the document is corrected based on the acquired difference.
Abstract:
One dither mask having a highest spacial frequency is selected from a plurality of dither masks. Next, a granularity is obtained with reference to a table based on the selected dither mask and an ejection amount level per area. Moreover, a difference in granularity between adjacent areas is calculated with respect to all of the areas. A maximum value is obtained out of the obtained differences in granularity, and then, the maximum difference in granularity is compared with a determination threshold. When the maximum difference in granularity is the threshold or greater, it is determined whether or not a dither mask having a spacial frequency lower than that of the selected dither mask is stored in a memory. When there are dither masks having lower spacial frequencies, a dither mask having a spacial frequency lower by one level than that of the selected dither mask is selected.
Abstract:
Nozzles in a print head are arrayed in a density of 600 dpi. Moreover, a dither matrix has a size of 16 pixels×16 pixels in 600 dpi. The dither matrix is repeatedly used. In the meantime, each of rectangles represents an HS processing unit. WHS=3 pixels. As a consequence, the relationship of a least common multiple below is established in a nozzle array direction: 3×WD=16×WHS. In this case, the cycle of interference unevenness can be prolonged to the least common multiple between WD and WHS, that is, 48 pixels (3WD). In this manner, the size of the dither matrix is not an integral multiple of the HS processing unit width, so that the cycle of interference unevenness can be prolonged more than the size of the dither matrix. Thus, the interference unevenness can be hardly recognized.
Abstract:
When an input image is shifted by 640 pixels from a test pattern with reference to the position of a nozzle, the remainder is obtained by dividing 640 pixels by pixels of the dither matrix in an x direction. For example, when the size of the dither matrix in the x direction is 256 pixels, the dither matrix is shifted by 128 pixels in a direction reverse to the x direction. In this manner, the phase of the dither matrix at the time of the quantization during test pattern printing matches the phase of the dither matrix at the time of the quantization during input image printing. Consequently, unevenness of the dither matrix at a position N becomes the same in both of the test pattern and the input image. The HS correction to density unevenness caused by the unevenness of the dither matrix becomes suitable for the input image.
Abstract:
In an image processing apparatus for carrying out a plurality of correction processes on an input image, a multi-dimensional histogram of the input image is calculated, and a feature amount of the input image for which a specific correction process has been carried out is analyzed based on the multi-dimensional histogram. Then, based on the result of the analysis, correction parameters to be used for another correction process are calculated.