公开(公告)号：US09164159B2

公开(公告)日：2015-10-20

申请号：US13715648

申请日：2012-12-14

Applicant: Apple Inc.

Inventor： Jayesh Nath ,  Liang Han ,  Matthew A. Mow ,  Ming-Ju Tsai ,  Joshua G. Nickel ,  Hao Xu ,  Peter Bevelacqua ,  Mattia Pascolini ,  Robert W. Schlub ,  Ruben Caballero

IPC: G01R35/00 ,  G01R31/319 ,  G01R31/28

CPC classification number: G01R35/007 ,  G01R31/2822 ,  G01R31/2879 ,  G01R31/3191

Abstract: A manufacturing system for assembling wireless electronic devices is provided. The manufacturing system may include test stations for testing the radio-frequency performance of components that are to be assembled within the electronic devices. A reference test station may be calibrated using calibration coupons having known radio-frequency characteristics. The calibration coupons may include transmission line structures. The reference test station may measure verification standards to establish baseline measurement data. The verification standards may include circuitry having electrical components with given impedance values. Many verification coupons may be measured to enable testing for a wide range of impedance values. Test stations in the manufacturing system may subsequently measure the verification standards to generate test measurement data. The test measurement data may be compared to the baseline measurement data to characterize the performance of the test stations to ensure consistent test measurements across the test stations.

Abstract translation: 提供了一种用于组装无线电子设备的制造系统。 制造系统可以包括用于测试要在电子设备内组装的组件的射频性能的测试站。 可以使用具有已知射频特性的校准试样来校准参考测试台。 校准试样可以包括传输线结构。 参考测试站可以测量验证标准以建立基线测量数据。 验证标准可以包括具有给定阻抗值的电气部件的电路。 可以测量许多验证券，以测试宽范围的阻抗值。 制造系统中的测试台随后可以测量验证标准以产生测试测量数据。 可以将测试测量数据与基线测量数据进行比较，以表征测试站的性能，以确保跨越测试站的一致的测试测量。

公开(公告)号：US08971874B2

公开(公告)日：2015-03-03

申请号：US13873048

申请日：2013-04-29

Applicant: Apple Inc.

Inventor： Liang Han ,  Matthew A. Mow ,  James G. Judkins ,  Thomas E. Biedka ,  Ming-Ju Tsai ,  Robert W. Schlub

IPC: H04W24/00 ,  H04W24/06

CPC classification number: H04W24/06 ,  H03F1/565 ,  H03F3/195 ,  H03F3/245 ,  H03F2200/111 ,  H03F2200/222 ,  H04B17/0085 ,  Y02D70/00 ,  Y02D70/1242 ,  Y02D70/1262 ,  Y02D70/142 ,  Y02D70/144 ,  Y02D70/146 ,  Y02D70/164 ,  Y02D70/23

Abstract: Test systems for characterizing devices under test (DUTs) are provided. A test system for testing a DUT in a shunt configuration may include a signal generator and a matching network that is coupled between the signal generator and the DUT and that is optimized to apply desired voltage/current stress to the DUT with reduced source power. The matching network may be configured to provide matching and desired stress levels at two or more frequency bands. In another suitable embodiment, a test system for testing a DUT in a series configuration may include a signal generator, an input matching network coupled between the DUT and a first terminal of the DUT, and an output matching network coupled between the DUT and a second terminal of the DUT. The input and output matching network may be optimized to apply desired voltage/current stress to the DUT with reduced source power.

Abstract translation: 提供了用于表征被测设备（DUT）的测试系统。 用于在分流配置中测试DUT的测试系统可以包括信号发生器和耦合在信号发生器和DUT之间的匹配网络，并且被优化以在具有降低的源功率的DUT上施加期望的电压/电流应力。 匹配网络可以被配置为在两个或更多个频带处提供匹配和期望的应力水平。 在另一个合适的实施例中，用于测试串联配置中的DUT的测试系统可以包括信号发生器，耦合在DUT和DUT的第一端之间的输入匹配网络，以及耦合在DUT和第二个DUT之间的输出匹配网络 DUT的端子。 可以优化输入和输出匹配网络，以便以较低的源功率将所需的电压/电流应力施加到DUT。

公开(公告)号：US20140333495A1

公开(公告)日：2014-11-13

申请号：US13889987

申请日：2013-05-08

Applicant: APPLE INC.

Inventor： Enrique Ayala Vazquez ,  Hongfei Hu ,  Mattia Pascolini ,  Matthew A. Mow ,  Ming-Ju Tsai ,  Robert W. Schlub ,  Dean F. Darnell ,  Yuehui Ouyang ,  Nanbo Jin ,  Liang Han ,  David Pratt

IPC: H01Q5/00 ,  H01Q9/06

CPC classification number: H01Q9/06 ,  H01Q1/243 ,  H01Q1/48 ,  H01Q5/328 ,  H01Q5/35 ,  H01Q5/371 ,  H01Q9/0442 ,  H01Q9/27 ,  H01Q9/42 ,  H01Q13/10

Abstract: Electronic devices may be provided that include radio-frequency transceiver circuitry and antennas. An antenna may be formed from an antenna resonating element and an antenna ground. The antenna resonating element may have a shorter portion that resonates at higher communications band frequencies and a longer portion that resonates at lower communications band frequencies. An extended portion of the antenna ground may form an inverted-F antenna resonating element portion of the antenna resonating element. The antenna resonating element may be formed from a peripheral conductive electronic device housing structure that is separated from the antenna ground by an opening. A first antenna feed may be coupled between the peripheral conductive electronic device housing structures and the antenna ground across the opening. A second antenna feed may be coupled to the inverted-F antenna resonating element portion of the antenna resonating element.

Abstract translation: 可以提供包括射频收发器电路和天线的电子设备。 天线可以由天线谐振元件和天线接地形成。 天线谐振元件可以具有在较高通信频带频率下谐振的较短部分和在较低通信频带频率下谐振的较长部分。 天线接地的延伸部分可以形成天线谐振元件的倒F天线谐振元件部分。 天线谐振元件可以由外部导电电子器件外壳结构形成，该外壳导电电子器件壳体结构通过开口与天线接地分开。 第一天线馈电可以耦合在外围导电电子器件外壳结构和穿过开口的天线接地之间。 第二天线馈送可以耦合到天线谐振元件的倒F天线谐振元件部分。