摘要:
A bicycle includes a bicycle frame and a battery cartridge. The bicycle frame includes a head tube, and a steerer that extends through the head tube. The battery cartridge may be disposed removably in the steerer or between the head tube and the steerer to thereby conceal the battery cartridge for aesthetic purposes.
摘要:
Automatic optical inspection (AOI) systems are described comprising optical modules that include an illumination component and a lens array configured to direct illumination of the illumination component at a portion of a substrate. The lens array includes a Fresnel lens. The optical module includes a camera that receives reflected light resulting from an interaction of the illumination and the substrate. The camera includes a time delay integration (TDI) sensor. A telecentric imaging lens directs reflected light from the substrate to the camera. The illumination component comprises a controller coupled to multiple LED light sources, each emitting light at a different wavelength. The controller independently controls each LED light source. The illumination component includes a bright field and/or a dark field light source. The illumination component can include a front side and/or a back side light source. An optical fiber is coupled to the camera and an image processor.
摘要:
A method and apparatus provide for data compression with deflate block overhead reduction through the use of “pseudo-dynamic” Huffman codes to enable single deflate block encoding in a deflate algorithm implementation. Further, provided is data compression with deflate block overhead reduction through the use of “pseudo-dynamic” Huffman codes to enable single deflate block encoding in a deflate algorithm implementation, with inflation detection and mitigation capabilities.
摘要:
Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.