Bicycle including a bicycle frame capable of concealing a battery cartridge
    71.
    发明申请
    Bicycle including a bicycle frame capable of concealing a battery cartridge 审中-公开
    自行车包括能够隐藏电池盒的自行车车架

    公开(公告)号:US20080179858A1

    公开(公告)日:2008-07-31

    申请号:US11700059

    申请日:2007-01-31

    申请人: Wayne Chen

    发明人: Wayne Chen

    IPC分类号: B62K3/02

    CPC分类号: B62K19/32 B62J6/18 B62K19/30

    摘要: A bicycle includes a bicycle frame and a battery cartridge. The bicycle frame includes a head tube, and a steerer that extends through the head tube. The battery cartridge may be disposed removably in the steerer or between the head tube and the steerer to thereby conceal the battery cartridge for aesthetic purposes.

    摘要翻译: 自行车包括自行车车架和电池盒。 自行车车架包括头管和延伸穿过头管的转向器。 电池盒可以可拆卸地设置在转鼓中或头管和转向器之间,从而为了美观目的而隐藏电池盒。

    Automatic inspection system for flat panel substrate
    72.
    发明申请
    Automatic inspection system for flat panel substrate 有权
    平板基板自动检测系统

    公开(公告)号:US20080174771A1

    公开(公告)日:2008-07-24

    申请号:US11714513

    申请日:2007-03-05

    IPC分类号: G01N21/892

    摘要: Automatic optical inspection (AOI) systems are described comprising optical modules that include an illumination component and a lens array configured to direct illumination of the illumination component at a portion of a substrate. The lens array includes a Fresnel lens. The optical module includes a camera that receives reflected light resulting from an interaction of the illumination and the substrate. The camera includes a time delay integration (TDI) sensor. A telecentric imaging lens directs reflected light from the substrate to the camera. The illumination component comprises a controller coupled to multiple LED light sources, each emitting light at a different wavelength. The controller independently controls each LED light source. The illumination component includes a bright field and/or a dark field light source. The illumination component can include a front side and/or a back side light source. An optical fiber is coupled to the camera and an image processor.

    摘要翻译: 自动光学检查(AOI)系统被描述为包括光学模块,其包括照明部件和透镜阵列,该透镜阵列被配置为在衬底的一部分处直接照射照明部件。 透镜阵列包括菲涅尔透镜。 光学模块包括摄像机,其接收由照明和衬底的相互作用产生的反射光。 相机包括时延积分(TDI)传感器。 远心成像透镜将来自基板的反射光引导到相机。 照明部件包括耦合到多个LED光源的控制器,每个LED光源发射不同波长的光。 控制器独立控制每个LED光源。 照明组件包括明场和/或暗场光源。 照明部件可以包括前侧和/或后侧光源。 光纤耦合到相机和图像处理器。

    METHOD AND APPARATUS FOR EFFICIENT HARDWARE BASED DEFLATE
    73.
    发明申请
    METHOD AND APPARATUS FOR EFFICIENT HARDWARE BASED DEFLATE 有权
    基于有效硬件的定义的方法和装置

    公开(公告)号:US20070109153A1

    公开(公告)日:2007-05-17

    申请号:US11281039

    申请日:2005-11-16

    申请人: Kevin Ma Wayne Chen

    发明人: Kevin Ma Wayne Chen

    IPC分类号: H03M7/00

    摘要: A method and apparatus provide for data compression with deflate block overhead reduction through the use of “pseudo-dynamic” Huffman codes to enable single deflate block encoding in a deflate algorithm implementation. Further, provided is data compression with deflate block overhead reduction through the use of “pseudo-dynamic” Huffman codes to enable single deflate block encoding in a deflate algorithm implementation, with inflation detection and mitigation capabilities.

    摘要翻译: 一种方法和装置通过使用“伪动态”霍夫曼码在缩小算法实现中实现单个放气块编码来提供具有减少块开销降低的数据压缩。 此外,通过使用“伪动态”霍夫曼码来提供具有放气块开销降低的数据压缩,以在具有通货膨胀检测和减轻能力的放气算法实现中实现单个放气块编码。

    System and methods for classifying anomalies of sample surfaces
    74.
    发明授权
    System and methods for classifying anomalies of sample surfaces 有权
    用于分类样品表面异常的系统和方法

    公开(公告)号:US06590645B1

    公开(公告)日:2003-07-08

    申请号:US09566352

    申请日:2000-05-04

    IPC分类号: G01N2100

    摘要: Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.

    摘要翻译: 可以在不同的检测灵敏度和/或处理阈值下为同一样品表面提供两个或更多个缺陷图。 然后可以比较缺陷图以更好地表征异常,如划痕,区域异常或点异常。 这可以在没有隐藏更多重要和更大尺寸的缺陷的许多小和非实质性缺陷之间完成。 一个或多个缺陷图可以用来报告具有分类信息的异常; 该图的结果可用于监测工艺条件以获得更好的产量。