Abstract:
An input buffer includes a delay compensation unit for combining (a) a first signal obtained by buffering an input signal using another signal, which is out of phase with the input signal, with (b) a second signal obtained by buffering the input signal using a reference voltage signal, to output a third signal.
Abstract:
Embodiments of the present invention are directed to provide an internal voltage generator of a semiconductor memory device for generating a predetermined stable level of an internal voltage. The semiconductor memory device includes a control signal generator, an internal voltage generator and an internal voltage compensator. The control signal generator generates a reference signal and a compensating signal which are corresponding to voltage level of the reference signal. The internal voltage generator generates an internal voltage in response to the reference signal. The internal voltage compensator compensates the internal voltage in response to the compensating signal.
Abstract:
A semiconductor memory device employs a clamp for preventing latch up. For the purpose, the semiconductor memory device includes a precharging/equalizing unit for precharging and equalizing a pair of bit lines, and a control signal generating unit for producing a control signal which controls enable and disable of the precharging/equalizing unit, wherein the control signal generating unit includes a clamping unit to clamp its source voltage to a voltage level lower than that of its bulk bias.
Abstract:
A negative voltage generator of a semiconductor memory device includes: a flag signal generation unit for receiving a temperature information code from an On Die Thermal Sensor (ODTS) to output a plurality of flag signals containing temperature information of the semiconductor memory device; and a negative voltage detection unit for detecting a negative voltage to output a detection signal for determining whether to pump a negative voltage, wherein a detection level of the negative voltage is changed according to the flag signals.
Abstract:
A delay locked loop (DLL) power supply circuit for use in a semiconductor memory device, including: a DLL power supplier for supplying a DLL power supply voltage to a DLL in response to a reference voltage and a clock enable exit pulse signal; and a pulse signal generator for generating the clock enable exit pulse signal in response to a clock enable signal.
Abstract:
A bit line equalization signal (BLEQ) driving circuit for generating an equalization signal used to perform a precharge operation in a semiconductor memory device includes a second boosted voltage generator for producing a second boosted voltage by pumping a supply voltage, a BLEQ driver for generating the equalization signal by using the second boosted voltage in response to an equalization command and providing the equalization signal to a precharge unit, an equalizer and an I/O switch module. By using the second boosted voltage VPUP, which is lower than a first boosted voltage and higher than the supply voltage, as the equalization signal to be provided to gates of transistors for precharging a low power device to a precharge voltage level, it is possible to save current that a voltage pump consumes and satisfy a constant tRP.
Abstract:
There is an internal voltage generating circuit for providing a stable internal voltage by supplying the internal voltage before a time point when it is used. The internal voltage generating circuit includes a charge pump unit for generating an internal voltage lower than an external voltage in response to pumping control signals and a supply driving control signal; a pumping control signal generating unit for outputting the pumping control signals to the charge pump unit based on a driving signal; and a supply driving control unit for receiving the driving signal to generate the supply driving control signal to the charge pump unit.
Abstract:
Embodiments of the present invention are directed to provide an internal voltage generator of a semiconductor memory device for generating a predetermined stable level of an internal voltage. The semiconductor memory device includes a control signal generator, an internal voltage generator and an internal voltage compensator. The control signal generator generates a reference signal and a compensating signal which are corresponding to voltage level of the reference signal. The internal voltage generator generates an internal voltage in response to the reference signal. The internal voltage compensator compensates the internal voltage in response to the compensating signal.
Abstract:
There is an internal voltage generating circuit for providing a stable internal voltage by supplying the internal voltage before a time point when it is used. The internal voltage generating circuit includes a charge pump unit for generating an internal voltage lower than an external voltage in response to pumping control signals and a supply driving control signal; a pumping control signal generating unit for outputting the pumping control signals to the charge pump unit based on a driving signal; and a supply driving control unit for receiving the driving signal to generate the supply driving control signal to the charge pump unit.
Abstract:
A delay locked loop (DLL) power supply circuit for use in a semiconductor memory device, including: a DLL power supplier for supplying a DLL power supply voltage to a DLL in response to a reference voltage and a clock enable exit pulse signal; and a pulse signal generator for generating the clock enable exit pulse signal in response to a clock enable signal.