-
公开(公告)号：US20230068075A1
公开(公告)日：2023-03-02
申请号：US17823258
申请日：2022-08-30
申请人： Circuit Check, Inc.
IPC分类号： G01R31/28
摘要： A circuit tester includes an interposer transfer board, a mounting plate, at least one sensor plate, and at least one receptacle and probe assembly. The interposer transfer board includes a first surface and a second surface opposite to the first surface, at least one amplifier holder, and at least one input header and at least one output header. The at least one amplifier holder, the at least one input header, and the at least one output header are disposed on the first surface of the interposer transfer board. The at least one receptacle and probe assembly is fixed on the at least one sensor plate. The at least one receptacle and probe assembly passes through and is mounted on the mounting plate. The at least one input header is connected to the at least one receptacle and probe assembly via wires.
-
公开(公告)号：US08692569B2
公开(公告)日：2014-04-08
申请号：US13083857
申请日：2011-04-11
申请人： Troy Fossum , David Kariniemi
发明人： Troy Fossum , David Kariniemi
IPC分类号： G01R31/28
CPC分类号： G01R31/2808
摘要： A circuit board tester and method that precisely aligns the probe plate and circuit board is disclosed. With a circuit board and probe plate mounting within a housing having a top and bottom, hinged together, at closure there may be slight misalignments of the two. By making one of the two plates floating, or laterally slideable with respect to each other, it is possible to make final alignment at closure. One of the two plates can be provided with a pin and the other with a pin receiving alignment block. With the lateral sideability, the pin and block can insure proper probe alignment. Additional systems for correcting misaligned pins or blocks are also disclosed.
摘要翻译： 公开了一种精密对准探针板和电路板的电路板测试器和方法。 通过电路板和探针板安装在具有顶部和底部的壳体内，铰接在一起，在闭合时可能会有两个微小的不对准。 通过使两个板中的一个相对于彼此浮动或横向滑动，可以在关闭时进行最终对准。 两个板中的一个可以设置有销，而另一个具有销接收对准块。 具有侧面的侧向性，销和块可以确保正确的探针对准。 还公开了用于校正不对准引脚或块的附加系统。
-
公开(公告)号：US20130271171A1
公开(公告)日：2013-10-17
申请号：US13444237
申请日：2012-04-11
IPC分类号： G01R31/20
CPC分类号： G01R31/2808 , Y10T29/49121 , Y10T29/49187
摘要： A dual-stage fixture for a circuit tester includes a slide plate that can be slid between at least a first position and a second position. In the first position, an upper stripper plate is spring-loaded, and a full set of test probes, including both long-stroke and short-stroke probes, can contact the circuit board or UUT (unit under test). In the second position, the upper stripper plate becomes fixed in position, and only the long-stroke probes can contact the circuit board. The fixed positioning of the upper stripper plate prevents the short-stroke probes from contacting the circuit board even when there is unbalanced loading of probe pressure between the top and bottom of the circuit board, thereby preventing transient signals from interfering with testing. In addition, a vacuum is applied in this position during a non-powered test.
摘要翻译： 用于电路测试器的双级固定器包括可在至少第一位置和第二位置之间滑动的滑板。 在第一个位置，上部剥离板是弹簧加载的，并且包括长行程和短行程探头的全套测试探头可以接触电路板或UUT（被测单元）。 在第二位置，上部剥离板变得固定就位，并且只有长行程探针可以接触电路板。 即使在电路板顶部和底部之间存在探头压力不平衡负载，上部剥离板的固定定位也可以防止短行程探头接触电路板，从而防止瞬态信号干扰测试。 此外，在非电源测试期间，在该位置施加真空。
-
公开(公告)号：US09091722B2
公开(公告)日：2015-07-28
申请号：US14306385
申请日：2014-06-17
申请人： Circuit Check, Inc.
CPC分类号： G01R31/2808 , Y10T29/49121 , Y10T29/49187
摘要： A dual-stage fixture for a circuit tester includes a slide plate that can be slid between at least a first position and a second position. In the first position, an upper stripper plate is spring-loaded, and a full set of test probes, including both long-stroke and short-stroke probes, can contact the circuit board or UUT (unit under test). In the second position, the upper stripper plate becomes fixed in position, and only the long-stroke probes can contact the circuit board. The fixed positioning of the upper stripper plate prevents the short-stroke probes from contacting the circuit board even when there is unbalanced loading of probe pressure between the top and bottom of the circuit board, thereby preventing transient signals from interfering with testing. In addition, a vacuum is applied in this position during a non-powered test.
摘要翻译： 用于电路测试器的双级固定器包括可在至少第一位置和第二位置之间滑动的滑板。 在第一个位置，上部剥离板是弹簧加载的，并且包括长行程和短行程探头的全套测试探头可以接触电路板或UUT（被测单元）。 在第二位置，上部剥离板变得固定就位，并且只有长行程探针可以接触电路板。 即使在电路板顶部和底部之间存在探头压力不平衡负载，上部剥离板的固定定位也可以防止短行程探头接触电路板，从而防止瞬态信号干扰测试。 此外，在非电源测试期间，在该位置施加真空。
-
公开(公告)号：US08847618B1
公开(公告)日：2014-09-30
申请号：US13452220
申请日：2012-04-20
IPC分类号： G01R31/00
CPC分类号： G01R1/06705 , G01R31/2808 , G01R31/2818
摘要： A circuit board tester and method that precisely aligns the probe plate and circuit board is disclosed. With a circuit board and probe plate mounting within a housing having a top and bottom, hinged together, at closure there may be slight misalignments of the two. By making one of the two plates floating, or laterally slideable with respect to each other, it is possible to make final alignment at closure. One of the two plates can be provided with a pin and the other with a pin receiving alignment block. With the lateral slideability, the pin and block can insure proper probe alignment. Additional systems for correcting misaligned pins or blocks are also disclosed.
摘要翻译： 公开了一种精密对准探针板和电路板的电路板测试器和方法。 在电路板和探针板安装在具有顶部和底部的壳体内，铰接在一起，在闭合时可能会有两个微小的不对准。 通过使两个板中的一个相对于彼此浮动或横向滑动，可以在关闭时进行最终对准。 两个板中的一个可以设置有销，而另一个具有销接收对准块。 具有侧向滑动性，销和块可以确保正确的探针对准。 还公开了用于校正不对准引脚或块的附加系统。
-
公开(公告)号：US09772349B1
公开(公告)日：2017-09-26
申请号：US14496630
申请日：2014-09-25
申请人： Circuit Check, Inc.
CPC分类号： G01R1/06705 , G01R31/2808 , G01R31/2818
摘要： A circuit board tester and method that precisely aligns the probe plate and circuit board is disclosed. With a circuit board and probe plate mounting within a housing having a top and bottom, hinged together, at closure there may be slight misalignments of the two. By making one of the two plates floating, or laterally slideable with respect to each other, it is possible to make final alignment at closure. One of the two plates can be provided with a pin and the other with a pin receiving alignment block. With the lateral slideability, the pin and block can insure proper probe alignment. Additional systems for correcting misaligned pins or blocks are also disclosed.
-
公开(公告)号：US08754665B2
公开(公告)日：2014-06-17
申请号：US13444237
申请日：2012-04-11
IPC分类号： G01R31/20
CPC分类号： G01R31/2808 , Y10T29/49121 , Y10T29/49187
摘要： A dual-stage fixture for a circuit tester includes a slide plate that can be slid between at least a first position and a second position. In the first position, an upper stripper plate is spring-loaded, and a full set of test probes, including both long-stroke and short-stroke probes, can contact the circuit board or UUT (unit under test). In the second position, the upper stripper plate becomes fixed in position, and only the long-stroke probes can contact the circuit board. The fixed positioning of the upper stripper plate prevents the short-stroke probes from contacting the circuit board even when there is unbalanced loading of probe pressure between the top and bottom of the circuit board, thereby preventing transient signals from interfering with testing. In addition, a vacuum is applied in this position during a non-powered test.
摘要翻译： 用于电路测试器的双级固定器包括可在至少第一位置和第二位置之间滑动的滑板。 在第一个位置，上部剥离板是弹簧加载的，并且包括长行程和短行程探头的全套测试探头可以接触电路板或UUT（被测单元）。 在第二位置，上部剥离板变得固定就位，并且只有长行程探针可以接触电路板。 即使在电路板顶部和底部之间存在探头压力不平衡负载，上部剥离板的固定定位也可以防止短行程探头接触电路板，从而防止瞬态信号干扰测试。 此外，在非电源测试期间，在该位置施加真空。
-
-
-
-
-
-
搜索结果
7 条记录 (耗时 0.011 秒)
