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公开(公告)号：US20050197084A1
公开(公告)日：2005-09-08
申请号：US11072266
申请日：2005-03-07
申请人： Toshinori Hamasaki , Kaoru Ishida
发明人： Toshinori Hamasaki , Kaoru Ishida
CPC分类号： H03D7/1425 , H03D7/1433 , H03D7/1458 , H03D7/165 , H03D2200/0043 , H03D2200/0047
摘要： A mixer circuit is provided with a quadrature demodulator including a Gilbert cell in which a first differential amplifier and a switching circuit are vertically stacked for connection and a bypass circuit including a second differential amplifier having a pair of differential input terminals short-circuited with each other, and provided in parallel with the first differential amplifier. Correction of a DC offset is performed by inactivating the first differential amplifier and activating the second differential amplifier, and detecting the DC offset under such state.
摘要翻译： 混频器电路设置有包括吉尔伯特单元的正交解调器，其中第一差分放大器和开关电路被垂直堆叠用于连接，并且旁路电路包括具有彼此短路的一对差分输入端子的第二差分放大器 并且与第一差分放大器并联提供。 通过停用第一差分放大器并激活第二差分放大器以及在这种状态下检测DC偏移来执行DC偏移的校正。
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公开(公告)号：US5917181A
公开(公告)日：1999-06-29
申请号：US831080
申请日：1997-04-01
CPC分类号： G01B5/012 , G01B11/007
摘要： A profile measuring apparatus provided with an improved probe for measuring profiles throughout a wide area of the surface of an object with a high level of response and high accuracy. The probe 10 comprises an arm 3 having a stylus 1 fixedly mounted to the distal end thereof, which is coupled to a stationary part 11 of the apparatus by an arm holding member 5 made of a V-shaped leaf spring in such a way that the arm 3 is tilted in one axial direction by a contact pressure exerted thereto during measurement. Displacement of the arm 3 is thereby detected through measuring an elastic deformation of the leaf spring caused by the contact pressure exerted to the stylus 1 being pressed against the surface to be measured.
摘要翻译： 一种轮廓测量装置，其具有改进的探针，用于以高水平的响应和高精度测量物体表面的广泛区域中的轮廓。 探针10包括臂3，其具有固定地安装到其远端的触针1，其通过由V形片簧制成的臂保持构件5联接到装置的固定部分11， 臂3在测量期间通过施加到其上的接触压力在一个轴向倾斜。 因此通过测量由施加到触针1被测量表面的接触压力引起的板簧的弹性变形，来检测臂3的位移。
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