Method of Measuring the Thickness Profile of a Film Tube
    1.
    发明申请
    Method of Measuring the Thickness Profile of a Film Tube 审中-公开
    测量薄膜管厚度曲线的方法

    公开(公告)号:US20090299930A1

    公开(公告)日:2009-12-03

    申请号:US12471646

    申请日:2009-05-26

    Abstract: A method of measuring the thickness profile of a film produced in a blow film line having a rotatable pull-off rig in which a flattened film tube is scanned by performing individual measurements at measurement positions distributed over the width over the film tube and, in each individual measurement, the total thickness of two segments of the film tube is measured that are superposed at the measurement position, the thickness profile is calculated from the measured values obtained for a number individual measurements that is larger than the number of measurement positions, the improvement including the steps of training a neural network with measured values for the total thicknesses, which measured values have been obtained in simulated or real measurement processes with known thickness profiles and supplying the measured results obtained by scanning the film tube to the neural network for calculating the thickness profile.

    Abstract translation: 一种测量在具有可旋转拉出装置的吹膜管线中产生的薄膜的厚度分布的方法,其中通过在分布在薄膜管上的宽度上的测量位置进行单独测量来扫描扁平薄膜管,并且在每个 单独测量时,测量在测量位置叠加的薄膜管的两个部分的总厚度,根据对于大于测量位置数量的单个测量值获得的测量值来计算厚度分布,改进 包括对具有总厚度的测量值训练神经网络的步骤,该测量值已经在具有已知厚度分布的模拟或实际测量过程中获得,并且通过将膜管扫描到神经网络获得的测量结果来计算 厚度剖面。

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