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    Method of Measuring the Thickness Profile of a Film Tube
    6.
    发明申请
    Method of Measuring the Thickness Profile of a Film Tube 审中-公开
    测量薄膜管厚度曲线的方法

    公开(公告)号：US20090299930A1

    公开(公告)日：2009-12-03

    申请号：US12471646

    申请日：2009-05-26

    申请人： Stefan Konermann ,  Michael Gunther ,  Roland Pulch ,  Andreas Bartel ,  Markus Stein

    发明人： Stefan Konermann ,  Michael Gunther ,  Roland Pulch ,  Andreas Bartel ,  Markus Stein

    IPC分类号： G06N3/08 ,  G06F15/00

    CPC分类号： G01B21/08 ,  B29C48/0018 ,  B29C48/0019 ,  B29C48/10 ,  B29C48/251 ,  B29C48/92 ,  B29C2948/92152 ,  B29C2948/92438

    摘要： A method of measuring the thickness profile of a film produced in a blow film line having a rotatable pull-off rig in which a flattened film tube is scanned by performing individual measurements at measurement positions distributed over the width over the film tube and, in each individual measurement, the total thickness of two segments of the film tube is measured that are superposed at the measurement position, the thickness profile is calculated from the measured values obtained for a number individual measurements that is larger than the number of measurement positions, the improvement including the steps of training a neural network with measured values for the total thicknesses, which measured values have been obtained in simulated or real measurement processes with known thickness profiles and supplying the measured results obtained by scanning the film tube to the neural network for calculating the thickness profile.

    摘要翻译： 一种测量在具有可旋转拉出装置的吹膜管线中产生的薄膜的厚度分布的方法，其中通过在分布在薄膜管上的宽度上的测量位置进行单独测量来扫描扁平薄膜管，并且在每个 单独测量时，测量在测量位置叠加的薄膜管的两个部分的总厚度，根据对于大于测量位置数量的单个测量值获得的测量值来计算厚度分布，改进 包括对具有总厚度的测量值训练神经网络的步骤，该测量值已经在具有已知厚度分布的模拟或实际测量过程中获得，并且通过将膜管扫描到神经网络获得的测量结果来计算 厚度剖面。

    Method and device for control of the thickness of extruded film
    8.
    发明申请
    Method and device for control of the thickness of extruded film 审中-公开
    用于控制挤出薄膜厚度的方法和装置

    公开(公告)号：US20060244167A1

    公开(公告)日：2006-11-02

    申请号：US10541363

    申请日：2003-12-09

    申请人： Bartholomeus Trommelen ,  Lothar Koenig

    发明人： Bartholomeus Trommelen ,  Lothar Koenig

    IPC分类号： B29C47/92

    CPC分类号： G05D5/03 ,  B29C48/08 ,  B29C48/251 ,  B29C48/92 ,  B29C2037/90 ,  B29C2948/92152 ,  B29C2948/92428 ,  B29C2948/926 ,  B29C2948/92647 ,  B29C2948/92695 ,  B29C2948/92704 ,  B29C2948/92876 ,  B29C2948/92904 ,  B29C2948/92923

    摘要： The present invention relates to a process for the automatic control of the thickness of extruded film (8). The purpose of the invention is to lower the deviations in the thickness of the film more quickly after the start of the extrusion process. The process involves the measurement of the thickness profile of the film just extruded (8) by means of a thickness-measuring probe (12). The thickness-measuring probe (12) is moved along the surface of the film substantially perpendicular (x) to the conveying direction (z) of the extruded film (8). The thickness-measuring probe (12) records for each measuring cycle (MZ) a thickness profile (P) of the film (8) at least over parts of the expansion of the film (8) perpendicular (x) to its conveying direction (z). The process pursuant to the present invention is characterized by the fact that during a predetermined time-frame at the start of the extrusion process measured values or information derived therefrom using or for a greater number of measuring cycles is made accessible to the computer (14) than those recorded by the thickness-measuring probe (12) in a time-frame of similar length during the normal operation and that the computer (14) takes into account these measured values while providing the statistical values.

    摘要翻译： 本发明涉及自动控制挤出薄膜（8）的厚度的方法。 本发明的目的是在挤出过程开始之后更快地降低薄膜厚度的偏差。 该方法包括通过厚度测量探针（12）测量刚刚挤出（8）的膜的厚度分布。 厚度测量探针（12）沿着膜的表面基本上垂直于（x）移动到挤压膜（8）的输送方向（z）。 每个测量循环（MZ）的厚度测量探针（MZ）记录薄膜（8）的厚度分布（P）至少部分垂直于（x）的输送方向的薄膜（8）的膨胀的至少一部分 z）。 根据本发明的方法的特征在于，在挤出过程开始时的预定时间段期间，计算机（14）使得测量值或从其导出的信息或更大数量的测量循环可访问， 比正常操作中长度相同的时间段由厚度测量探针（12）记录的那些数据计算机计算机（14）在提供统计值的同时考虑这些测量值。