公开(公告)号：US07106043B1

公开(公告)日：2006-09-12

申请号：US10667118

申请日：2003-09-17

申请人： Luiz B. Da Silva ,  Charles L. Chase ,  Bruce W. Haughey

发明人： Luiz B. Da Silva ,  Charles L. Chase ,  Bruce W. Haughey

IPC分类号： G01R31/02 ,  G01R27/26 ,  A61B8/14

CPC分类号： A61B5/053 ,  A61B5/6848 ,  A61B5/6849 ,  A61B2017/00026 ,  A61N1/08

摘要： A low capacitance measurement probe is disclosed. The low capacitance measurement probe comprises an outer conductor forming an outer wall having an exterior and an interior; a non-conductive spacer forming a first wall having an exterior and an interior with the non-conductive spacer being coupled to the interior of the outer conductor; a conductive layer forming a second wall having an exterior and an interior, the conductive layer coupled to the interior of the first wall; an insulating layer forming a third wall having an exterior and an interior, the insulating layer coupled to the interior of the second wall; and an inner conductor forming an inner wall having an exterior and an interior, the inner conductor coupled to the interior of the third wall. A low capacitance measurement probe system and a method of using a low capacitance measurement probe are also disclosed.

摘要翻译： 公开了一种低电容测量探针。 低电容测量探针包括形成具有外部和内部的外壁的外部导体; 形成具有外部和内部的第一壁的非导电间隔件，其中所述非导电间隔件联接到所述外部导体的内部; 形成具有外部和内部的第二壁的导电层，所述导电层耦合到所述第一壁的内部; 形成具有外部和内部的第三壁的绝缘层，所述绝缘层耦合到所述第二壁的内部; 以及形成具有外部和内部的内壁的内部导体，所述内部导体联接到所述第三壁的内部。 还公开了低电容测量探针系统和使用低电容测量探针的方法。

公开(公告)号：US07248032B1

公开(公告)日：2007-07-24

申请号：US11458486

申请日：2006-07-19

申请人： Richard Hular ,  Liuz B. Da Silva ,  Charles L. Chase ,  Bruce W. Haughey

发明人： Richard Hular ,  Liuz B. Da Silva ,  Charles L. Chase ,  Bruce W. Haughey

IPC分类号： G01R31/02 ,  G01R27/26 ,  A61B8/14

CPC分类号： A61B5/053 ,  A61B5/6848 ,  A61B5/6849 ,  A61B2017/00026 ,  A61N1/08

摘要： A low capacitance measurement probe having an outer conductor forming an outer wall; a non-conductive spacer forming a first wall between a conductive layer and the outer conductor; the conductive layer forming a second wall coupled to the interior of the first wall; an insulating layer forming a third wall coupled to the interior of the second wall; and an inner conductor forming an inner wall coupled to the interior of the third wall. The probe may include a knob or a button in the inner conductor at a tip of the probe to increase the surface area of the inner conductor in order to the sensitivity of the probe.

摘要翻译： 一种具有形成外壁的外导体的低电容测量探针; 形成在导电层和外部导体之间的第一壁的非导电间隔物; 所述导电层形成耦合到所述第一壁的内部的第二壁; 绝缘层，形成耦合到所述第二壁的内部的第三壁; 以及形成连接到第三壁的内部的内壁的内导体。 探针可以在探针的尖端处的内部导体中包括旋钮或按钮，以增加内部导体的表面积以便于探针的灵敏度。