Ultrasonic wafer blade vibration detecting
    1.
    发明授权
    Ultrasonic wafer blade vibration detecting 失效
    超声波晶片叶片振动检测

    公开(公告)号:US06708565B2

    公开(公告)日:2004-03-23

    申请号:US10133784

    申请日:2002-04-26

    IPC分类号: G01M122

    摘要: Detecting blade vibration via ultrasonic waves is disclosed. The blade may be part of a robot that is used in conjunction with semiconductor device fabrication. A process chamber is provided that has a sidewall and a base defining a cavity contained therein. A rotatable blade is mounted at a center of the cavity that has a base portion and a tip portion extensible from the center to the sidewall of the process chamber. One or more ultrasonic sensors are mounted on the base adjacent to the sidewall. Ultrasonic waves are sent and received toward and reflected by the tip portion of the wafer blade to determine the tip portion's position. In this way, vibrational movement of the blade can be detected.

    摘要翻译: 公开了通过超声波检测刀片振动。 刀片可以是与半导体器件制造一起使用的机器人的一部分。 提供处理室,其具有侧壁和限定其中容纳的空腔的底座。 可旋转叶片安装在空腔的中心处,该中心具有从处理室的中心延伸到侧壁的基部和尖端部分。 一个或多个超声波传感器安装在邻近侧壁的底座上。 超声波被发送并接收到晶片叶片的尖端部分并被其反射,以确定尖端部分的位置。 以这种方式,可以检测到叶片的振动。