Abstract:
A server system includes a BMC, a BIOS chip, an IPMI and a diplexer. The BMC includes a first chip-selecting signal output terminal, a second chip-selecting signal output terminal, a first updating output terminal and a controlling input terminal. The BIOS chip includes a second chip-selecting signal input terminal and an updating input terminal. The IPMI has a controlling output terminal. The diplexer includes a first input terminal and an updating output terminal. The first input terminal of the diplexer is electrically coupled to the first updating output terminal of BMC. The updating output terminal of the diplexer is electrically coupled to the updating input terminal of the BIOS chip. The controlling output terminal of the IPMI is electrically coupled to the controlling input terminal of the BMC. The second chip-selecting signal input terminal of the BIOS chip is electrically coupled to the second chip-selecting signal output terminal of the BMC.
Abstract:
A method for performing data backup using a storage device starts a backup battery when an electronic device is powered off, reads data from a memory of the electronic device by a system on chip (SoC) of the storage device, and writes the data into a field programmable gate array (FPGA) of the storage device. The method further encodes the data by the FPGA, and stores the encoded data into a flash memory of the storage device.
Abstract:
A baseboard management controller (BMC) connects with a COM serial port. The BMC includes an input queue and an output queue. If a basic input output system (BIOS) of the BMC has been initialized, the COM serial port is used by the BIOS. When a processor of the BMC sends a control command to a sharing system of the BMC, the input queue and the output queue are converted to time division multiplex (TDM) queues. The COM serial port may be used by the BIOS or by the BMC according to an ID flag of each element of the TDM queues.
Abstract:
A method for testing a random-access memory (RAM) includes six tests. The first test is performed by performing a write and read test to storage locations of the RAM. The second test is performed by testing walking 1's across each data bus of the RAM. The third test is performed by testing walking 0's across the data bus of the RAM. The fourth test is performed by testing walking 1's across each address bus of the RAM. The fifth test is performed by testing walking 0's across the address bus bit of the RAM. The sixth test is performed by performing a write and read test to random blocks in the storage locations of the RAM.
Abstract:
In a temperature adjustment system and method for a storage system, a corresponding relationship between data transfer rates of the storage system and rotational speeds of electric fans coupled to the storage system is established. Real-time data transfer rates of the storage system are measured. If there is a continuous increase or decrease in data transfer rates of the storage system, a rotational speed of the electric fans is determined according to the real-time data transfer rates and the corresponding relationship. The electric fans are controlled to run at the determined rotational speed.
Abstract:
A method for performing data backup using a storage device starts a backup battery when an electronic device is powered off, reads data from a memory of the electronic device by a system on chip (SoC) of the storage device, and writes the data into a field programmable gate array (FPGA) of the storage device. The method further encodes the data by the FPGA, and stores the encoded data into a flash memory of the storage device.
Abstract:
A testing system for an embedded system is provided. The testing system includes a plurality of devices and one or more host computers. Each device, which includes the embedded system to be tested, is connected to the host computer via a network based on the network file system protocol. The host computers are further connected with a control server, and each of the host computers comprises a root file system. The control server is configured for providing an interface for a user to set test parameters, controlling each of the host computers to invoke a test program, thereby testing the embedded system according to the test parameters, and receiving test results of the embedded system from the host computer. A related testing method is also provided.
Abstract:
A method for testing a random-access memory (RAM) includes six tests. The first test is performed by performing a write and read test to storage locations of the RAM. The second test is performed by testing walking 1's across each data bus of the RAM. The third test is performed by testing walking 0's across the data bus of the RAM. The fourth test is performed by testing walking 1's across each address bus of the RAM. The fifth test is performed by testing walking 0's across the address bus bit of the RAM. The sixth test is performed by performing a write and read test to random blocks in the storage locations of the RAM.
Abstract:
A testing system for an embedded system is provided. The testing system includes a plurality of devices and one or more host computers. Each device, which includes the embedded system to be tested, is connected to the host computer via a network based on the network file system protocol. The host computers are further connected with a control server, and each of the host computers comprises a root file system. The control server is configured for providing an interface for a user to set test parameters, controlling each of the host computers to invoke a test program, thereby testing the embedded system according to the test parameters, and receiving test results of the embedded system from the host computer. A related testing method is also provided.
Abstract:
A baseboard management controller (BMC) connects with a COM serial port. The BMC includes an input queue and an output queue. If a basic input output system (BIOS) of the BMC has been initialized, the COM serial port is used by the BIOS. When a processor of the BMC sends a control command to a sharing system of the BMC, the input queue and the output queue are converted to time division multiplex (TDM) queues. The COM serial port may be used by the BIOS or by the BMC according to an ID flag of each element of the TDM queues.