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公开(公告)号:US06888743B2
公开(公告)日:2005-05-03
申请号:US10331058
申请日:2002-12-27
Applicant: Mark A. Durlam , Thomas W. Andre , Brian R. Butcher , Mark F. Deherrera , Bradley N. Engel , Bradley J. Garni , Gregory W. Grynkewich , Joseph J. Nahas , Nicholas D. Rizzo , Saied Tehrani , Clarance J. Tracy
Inventor: Mark A. Durlam , Thomas W. Andre , Brian R. Butcher , Mark F. Deherrera , Bradley N. Engel , Bradley J. Garni , Gregory W. Grynkewich , Joseph J. Nahas , Nicholas D. Rizzo , Saied Tehrani , Clarance J. Tracy
CPC classification number: G11C11/16
Abstract: An MRAM architecture is provided that reduces the number of isolation transistors. The MRAM architecture includes magnetoresistive memory cells that are electrically coupled to form a ganged memory cell. The magnetoresistive memory cells of the ganged memory cell are formed with Magnetic Tunnel Junctions (MTJs) and formed without isolation devices, such as isolation transistors, and a programming line and a bit line are adjacent to each of the magnetoresistive memory cells. Preferably, the magnetoresistive memory cells of the ganged memory cell only include MTJs, and a programming line and a bit line are adjacent to each of the magnetoresistive memory cells.
Abstract translation: 提供了一种减少隔离晶体管数量的MRAM架构。 MRAM架构包括电耦合以形成有组合的存储单元的磁阻存储单元。 组合存储单元的磁阻存储单元由磁隧道结(MTJ)形成,并且形成为没有隔离器件,例如隔离晶体管,并且编程线和位线与每个磁阻存储器单元相邻。 优选地,联动存储单元的磁阻存储单元仅包括MTJ,并且编程线和位线与每个磁阻存储单元相邻。