公开(公告)号：US06208128B1

公开(公告)日：2001-03-27

申请号：US09255776

申请日：1999-02-23

申请人： Franck Braconnier ,  Anne Dez ,  Claude Grisvard ,  Daniel Pernet

发明人： Franck Braconnier ,  Anne Dez ,  Claude Grisvard ,  Daniel Pernet

IPC分类号： G01N2700

CPC分类号： G01B7/06

摘要： A probe is provided for measuring the wear of a wall in a metallurgical vessel. The probe includes at least two electrically conducting elements which extend generally mutually parallel, and a tubular sheath wherein the electrically conducting elements extend interiorly of said sheath, and are mutually insulated via a refractory insulator. The probe is adapted to be implanted in the transverse direction in the wall of a metallurgical vessel with the distal end of each of the two electrically conducting elements being disposed at the interior surface of said wall. A measurement system is connected to the opposite proximal ends of the electrically conducting elements for measuring an electrical characteristic of the circuit formed by said elements that depends on the length of the elements. The probe has a diameter less than 1 mm achieved by stretching after the components have been assembled into an intermediate assembly having a larger cross sectional area than the final cross section.

摘要翻译： 提供了用于测量冶金容器中的壁的磨损的探针。 探针包括至少两个大致相互平行延伸的导电元件和管状护套，其中导电元件在所述护套的内部延伸，并且经由耐火绝缘体相互绝缘。 探针适于在冶金容器的壁中沿横向植入，两个导电元件中的每一个的远端设置在所述壁的内表面。 测量系统连接到导电元件的相对的近端，用于测量由所述元件形成的电路的电特性，该电特性取决于元件的长度。 在组件组装成具有比最终横截面更大的横截面积的中间组件之后，探针具有通过拉伸实现的直径小于1mm的直径。