Silicon carbide bipolar junction transistors having a silicon carbide passivation layer on the base region thereof, and methods of fabricating same
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    发明申请
    Silicon carbide bipolar junction transistors having a silicon carbide passivation layer on the base region thereof, and methods of fabricating same 有权
    在其基极区域上具有碳化硅钝化层的碳化硅双极结型晶体管及其制造方法

    公开(公告)号:US20070145378A1

    公开(公告)日:2007-06-28

    申请号:US11315672

    申请日:2005-12-22

    IPC分类号: H01L31/0312

    摘要: A bipolar junction transistor (BJT) includes a silicon carbide (SiC) collector layer of first conductivity type, an epitaxial silicon carbide base layer of second conductivity type on the silicon carbide collector layer, and an epitaxial silicon carbide emitter mesa of the first conductivity type on the epitaxial silicon carbide base layer. An epitaxial silicon carbide passivation layer of the first conductivity type is provided on at least a portion of the epitaxial silicon carbide base layer outside the silicon carbide emitter mesa. The epitaxial silicon carbide passivation layer can be configured to fully deplete at zero device bias. Related fabrication methods also are disclosed.

    摘要翻译: 双极结型晶体管(BJT)包括第一导电类型的碳化硅(SiC)集电极层,在碳化硅集电极层上的第二导电类型的外延碳化硅基底层和第一导电类型的外延碳化硅发射极台面 在外延碳化硅基底层上。 第一导电类型的外延碳化硅钝化层设置在碳化硅发射极台面外部的外延碳化硅基底层的至少一部分上。 外延碳化硅钝化层可以被配置为在零器件偏置下完全耗尽。 还公开了相关的制造方法。