公开(公告)号：US06353476B1

公开(公告)日：2002-03-05

申请号：US09603547

申请日：2000-06-26

Applicant: Fritz Schreyer Allen ,  Danny S. Butterfield

Inventor： Fritz Schreyer Allen ,  Danny S. Butterfield

IPC: G01J344

CPC classification number: G01N21/65 ,  G01J3/44 ,  G01J3/443 ,  G01N21/47 ,  G01N21/64

Abstract: An apparatus and method for measuring an emission. A source of all excitation beam is provided. In the path of the excitation beam, means are located for providing one or more daughter beams. The one or more daughter beams are directed at one or more substances. The substances may include one or more known qualified substances, and one or more known unqualified substances. The substances have substantially similar characterizations. Positionable adjacent to the one or more substances are means for generating one or more emission beams. A spectral analysis device is provided for collecting spectral measurements substantially simultaneously from the one or more emission beams. Means are provided for subsequently comparing the spectral measurements from the one or more substances.

Abstract translation: 用于测量发射的装置和方法。 提供所有激发光束的源。 在激励光束的路径中，设置用于提供一个或多个子光束的装置。 一个或多个子束被引导到一种或多种物质。 物质可以包括一种或多种已知的合格物质和一种或多种已知的不合格物质。 这些物质具有基本相似的特征。 可邻近于一种或多种物质定位的是用于产生一个或多个发射光束的装置。 提供了一种光谱分析装置，用于从一个或多个发射光束基本上同时收集光谱测量。 提供了用于随后比较来自一种或多种物质的光谱测量值的方法。

公开(公告)号：US6141095A

公开(公告)日：2000-10-31

申请号：US313905

申请日：1999-05-18

Applicant: Fritz Schreyer Allen ,  Jun Zhao ,  Danny S. Butterfield

Inventor： Fritz Schreyer Allen ,  Jun Zhao ,  Danny S. Butterfield

IPC: G01J3/28 ,  G01J3/44 ,  G01N21/65

CPC classification number: G01J3/44 ,  G01J3/28 ,  G01N21/65

Abstract: An apparatus for measuring and applying instrumentation correction to produce a standard Raman spectrum of a sample to be analyzed. A source of incident radiation is included. Also included are means for providing from the incident radiation an incident beam and a monitor beam. The incident beam is directed at the sample. The invention includes means for generating from the sample a Raman beam. Spectral data may be collected directly from the monitor beam and the Raman beam. Spectral data may be collected substantially simultaneously from the monitor beam and the Raman beam, or sequentially. One or more integral transforms are applied to spectral data to produce the standard Raman spectrum of the sample.

Abstract translation: 一种用于测量和应用仪器校正以产生待分析样品的标准拉曼光谱的装置。 包括入射辐射源。 还包括用于从入射辐射提供入射光束和监视光束的装置。 入射光束指向样品。 本发明包括用于从样品生成拉曼光束的装置。 光谱数据可以直接从监视光束和拉曼光束中收集。 光谱数据可以从监视光束和拉曼光束基本上同时收集，或者顺序地收集。 将一个或多个积分变换应用于光谱数据以产生样品的标准拉曼光谱。