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公开(公告)号：US07715527B2
公开(公告)日：2010-05-11
申请号：US11935965
申请日：2007-11-06
IPC分类号： G01N23/20
CPC分类号： G01N23/2055
摘要： A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.
摘要翻译： 分析模式的方法。 该方法包括：接收第一衍射图; 接收第二衍射图案; 接收第三衍射图; 确定所述第一和第二衍射图案之间的相似度; 确定第一和第三衍射图案之间的相似度; 确定第二和第三衍射图案之间的相似度; 以及基于所确定的相似度对所述第一和第二衍射图案执行层次聚类分析。
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公开(公告)号：US20080120051A1
公开(公告)日：2008-05-22
申请号：US11935965
申请日：2007-11-06
IPC分类号： G01R13/02
CPC分类号： G01N23/2055
摘要： A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.
摘要翻译： 分析模式的方法。 该方法包括：接收第一衍射图; 接收第二衍射图案; 接收第三衍射图; 确定所述第一和第二衍射图案之间的相似度; 确定第一和第三衍射图案之间的相似度; 确定第二和第三衍射图案之间的相似度; 以及基于所确定的相似度对所述第一和第二衍射图案执行层次聚类分析。
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公开(公告)号：US07372941B2
公开(公告)日：2008-05-13
申请号：US10635113
申请日：2003-08-06
IPC分类号： G01N23/20
CPC分类号： G01N23/2055
摘要： A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.
摘要翻译： 分析模式的方法。 该方法包括：接收第一衍射图; 接收第二衍射图案; 接收第三衍射图; 确定所述第一和第二衍射图案之间的相似度; 确定第一和第三衍射图案之间的相似度; 确定第二和第三衍射图案之间的相似度; 以及基于所确定的相似度对所述第一和第二衍射图案执行层次聚类分析。
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