Antennas
    1.
    发明授权
    Antennas 有权
    天线

    公开(公告)号:US08599072B2

    公开(公告)日:2013-12-03

    申请号:US12136240

    申请日:2008-06-10

    IPC分类号: H01Q1/24

    CPC分类号: H01Q1/246

    摘要: A broadband antenna structure has an electrically conductive enclosure with a closed end, over which a non-electrically conductive cover is placed. A radiating portion of an antenna feed layer comprising a conductive patch antenna element is placed in between the enclosure and the cover. The patch antenna element design is inherently broader band than that of conventional cavity-backed slot-radiating antennas, which are constrained in bandwidth by the need to keep the cavity formed in the enclosure small. The dielectric constant of the dielectric material of the cover reduces the required size of the conductive antenna element. The broadband antenna structure may be connected with an electronic device to form an antenna arrangement in which a portion of the antenna feed layer extends through an opening in a surface of an antenna housing, the portion being within an electronic device enclosure of the electronic device.

    摘要翻译: 宽带天线结构具有带有封闭端的导电外壳,在其上放置非导电盖。 包括导电贴片天线元件的天线馈电层的辐射部分放置在外壳和盖之间。 贴片天线元件设计固有地比传统的腔背隙隙辐射天线的宽带宽,这些天线元件通过需要将形成在外壳中的腔体保持在较小的范围内而受到带宽的约​​束。 盖的电介质材料的介电常数降低了导电天线元件所需的尺寸。 宽带天线结构可以与电子设备连接以形成天线布置,其中天线馈送层的一部分延伸穿过天线壳体的表面中的开口,该部分在电子设备的电子设备外壳内。

    System and method for matching diffraction patterns
    3.
    发明授权
    System and method for matching diffraction patterns 有权
    用于匹配衍射图案的系统和方法

    公开(公告)号:US07715527B2

    公开(公告)日:2010-05-11

    申请号:US11935965

    申请日:2007-11-06

    IPC分类号: G01N23/20

    CPC分类号: G01N23/2055

    摘要: A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.

    摘要翻译: 分析模式的方法。 该方法包括:接收第一衍射图; 接收第二衍射图案; 接收第三衍射图; 确定所述第一和第二衍射图案之间的相似度; 确定第一和第三衍射图案之间的相似度; 确定第二和第三衍射图案之间的相似度; 以及基于所确定的相似度对所述第一和第二衍射图案执行层次聚类分析。

    ANTENNAS
    4.
    发明申请
    ANTENNAS 有权

    公开(公告)号:US20090303135A1

    公开(公告)日:2009-12-10

    申请号:US12136240

    申请日:2008-06-10

    IPC分类号: H01Q1/24 H01Q1/38

    CPC分类号: H01Q1/246

    摘要: Embodiments of the invention relate to a broadband antenna structure and an antenna arrangement comprising the antenna structure and an electronic device. In one aspect, the antenna employs an electrically conductive enclosure with a closed end, over which a non-electrically conductive cover is placed. A radiating portion of the antenna feed layer comprising a conductive patch antenna element is placed in between the enclosure and the cover. This patch antenna element design is inherently broader band than that of conventional cavity-backed slot-radiating antennas, which are constrained in bandwidth by the need to keep the cavity formed in the enclosure small, so that the column elements may be arranged in an array at substantially half-wavelength spacing. The new design suffers less compromise in terms of bandwidth in achieving the same size constraint. This is achieved in part by the dielectric constant of the dielectric material of the cover reducing the required size of the conductive antenna element, compared to the size that would be required if the radiating portion were covered with a material with the dielectric constant of air. In another aspect, this broadband antenna structure is connected with an electronic device to form an antenna arrangement, wherein a portion of the antenna feed layer extends outside of the antenna housing through an opening in a surface of the antenna housing, said portion being within the electronic device enclosure of the electronic device. Connecting the electronic device directly to the antenna according to embodiments of the invention reduces the amount of coaxial cables needed or eliminates the need for coaxial cables completely. As a result the usual costs associated with coaxial cables, the RF losses introduced by the cables which can compromise the system performance, possible failure of the cables, lease costs for the space the cables occupy and lease costs for large footprint of the building or cabinet housing the electronic device are substantially reduced or eliminated.

    Methods of characterizing compositions
    6.
    发明申请
    Methods of characterizing compositions 审中-公开
    表征组合物的方法

    公开(公告)号:US20070110214A1

    公开(公告)日:2007-05-17

    申请号:US11525930

    申请日:2006-09-25

    申请人: Simon Bates

    发明人: Simon Bates

    IPC分类号: G01N23/223

    摘要: The present invention is directed to methods for characterizing the structure of compositions such as amorphous, crystalline, and combinations thereof. The methods are directed to analyzing pairwise distribution function plots of the components of the compositions and comparing them to the pairwise distribution function plot of the composition.

    摘要翻译: 本发明涉及用于表征组合物的结构的方法,例如无定形,结晶及其组合。 该方法旨在分析组合物组分的成对分布函数图并将其与组合物的成对分布函数图进行比较。

    System and method for matching diffraction patterns
    7.
    发明授权
    System and method for matching diffraction patterns 有权
    用于匹配衍射图案的系统和方法

    公开(公告)号:US07372941B2

    公开(公告)日:2008-05-13

    申请号:US10635113

    申请日:2003-08-06

    IPC分类号: G01N23/20

    CPC分类号: G01N23/2055

    摘要: A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a similarity between the first and third diffraction pattern; determining a similarity between the second and third diffraction pattern; and performing hierarchical cluster analysis on the first and second diffraction pattern based on the determined similarity.

    摘要翻译: 分析模式的方法。 该方法包括:接收第一衍射图; 接收第二衍射图案; 接收第三衍射图; 确定所述第一和第二衍射图案之间的相似度; 确定第一和第三衍射图案之间的相似度; 确定第二和第三衍射图案之间的相似度; 以及基于所确定的相似度对所述第一和第二衍射图案执行层次聚类分析。

    Method for Indexing Crystalline Solid Forms
    9.
    发明申请
    Method for Indexing Crystalline Solid Forms 审中-公开
    索引结晶固体形式的方法

    公开(公告)号:US20070270397A1

    公开(公告)日:2007-11-22

    申请号:US10577239

    申请日:2004-10-27

    IPC分类号: A01N43/00

    CPC分类号: G01N23/207

    摘要: Crystalline solid forms may be characterized by their unit cell parameters through a process known as indexing. An embodiment of the invention searches for the unit cell parameters of a crystalline solid form using a Monte-Carlo algorithm that incorporates certain rules to reduce search space. Another embodiment refines the results of the search to identify the correct unit cell parameters of the crystalline solid form. These methods may be automated, conveniently requiring little interaction from the user. The indexing method of the invention may be applied, for example, to distinguish between different crystalline solid forms of a substance.

    摘要翻译: 结晶固体形式可以通过称为分度的方法通过其单元电池参数来表征。 本发明的实施例使用包含某些规则以减少搜索空间的蒙特卡罗算法搜索结晶固体形式的晶胞参数。 另一个实施方案提炼出结晶固体形式的正确的晶胞参数的搜索结果。 这些方法可以是自动的,方便地要求用户几乎没有交互。 本发明的分度方法可以用于例如区分物质的不同结晶固体形式。