公开(公告)号：US07263888B2

公开(公告)日：2007-09-04

申请号：US10686756

申请日：2003-10-16

申请人： James Norman Barshinger ,  Thomas James Batzinger ,  Wei Li ,  John Broddus Deaton, Jr. ,  David Paul Lappas ,  Robert Snee Gilmore ,  Richard Eugene Klaassen ,  Michael John Danyluk ,  Patrick Joseph Howard ,  David Charles Copley

发明人： James Norman Barshinger ,  Thomas James Batzinger ,  Wei Li ,  John Broddus Deaton, Jr. ,  David Paul Lappas ,  Robert Snee Gilmore ,  Richard Eugene Klaassen ,  Michael John Danyluk ,  Patrick Joseph Howard ,  David Charles Copley

IPC分类号： G01N9/24 ,  G01N29/00 ,  G01N29/04

CPC分类号： G01S15/8925 ,  G01N29/262 ,  G01N2291/106 ,  G01N2291/2693 ,  G10K11/346

摘要： The present disclosure provides for the application of a two-dimensional ultrasonic phased array (100), formed of a plurality of transducers (102) arranged in a rectilinear pattern, for material and volumetric component testing. The two-dimensional array enables electronic adjustment of the focal properties and size of the aperture in both the azimuthal and elevational directions such that uniform and/or specified sound field characteristics can be obtained at any or all locations in the component being tested.

摘要翻译： 本公开提供了由以直线图案排列的多个换能器（102）形成的用于材料和体积分量测试的二维超声相控阵列（100）的应用。 二维阵列使得能够在方位角和高度方向上电子调节孔径的焦点特性和尺寸，使得可以在待测部件中的任何或所有位置获得均匀和/或指定的声场特性。

公开(公告)号：US08179132B2

公开(公告)日：2012-05-15

申请号：US12372881

申请日：2009-02-18

申请人： Yanyan Wu ,  Thomas James Batzinger ,  Nicholas Joseph Kray ,  Changting Wang ,  Haiyan Sun ,  Francis Howard Little ,  David Paul Lappas ,  David Michael Dombrowski

发明人： Yanyan Wu ,  Thomas James Batzinger ,  Nicholas Joseph Kray ,  Changting Wang ,  Haiyan Sun ,  Francis Howard Little ,  David Paul Lappas ,  David Michael Dombrowski

IPC分类号： G01N27/82

CPC分类号： G01B7/008 ,  G01B7/28 ,  G01N27/90 ,  G01N27/9046

摘要： A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.

摘要翻译： 用于集成用于测量机器部件的测量装置的方法包括提供坐标测量机（CMM）并组合涡流（EC）能力和CMM能力以形成检查探针。 该方法还包括将检查探针安装在CMM上，使得检查探针以CMM能力测量机器部件的外部边界，并且基本上同时测量机器的内部边界，内部缺陷，表面缺陷和材料特性中的至少一个 具有EC功能的组件，其直接与CMM提供的实际组件尺寸信息相关联。 检查数据可以与CAD模型同时链接和/或显示，以便能够直接比较检验数据和CAD模型上规定的标称要求。

公开(公告)号：US20100207619A1

公开(公告)日：2010-08-19

申请号：US12372881

申请日：2009-02-18

申请人： Yanyan Wu ,  Thomas James Batzinger ,  Nicholas Joseph Kray ,  Changting Wang ,  Haiyan Sun ,  Francis Howard Little ,  David Paul Lappas ,  David Michael Dombrowski

发明人： Yanyan Wu ,  Thomas James Batzinger ,  Nicholas Joseph Kray ,  Changting Wang ,  Haiyan Sun ,  Francis Howard Little ,  David Paul Lappas ,  David Michael Dombrowski

IPC分类号： G01N27/82 ,  G01B5/008

CPC分类号： G01B7/008 ,  G01B7/28 ,  G01N27/90 ,  G01N27/9046

摘要： A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.

摘要翻译： 用于集成用于测量机器部件的测量装置的方法包括提供坐标测量机（CMM）并组合涡流（EC）能力和CMM能力以形成检查探针。 该方法还包括将检查探针安装在CMM上，使得检查探针以CMM能力测量机器部件的外部边界，并且基本上同时测量机器的内部边界，内部缺陷，表面缺陷和材料特性中的至少一个 具有EC功能的组件，其直接与CMM提供的实际组件尺寸信息相关联。 检查数据可以与CAD模型同时链接和/或显示，以便能够直接比较检验数据和CAD模型上规定的标称要求。