Manufacturing method of thin film transistor array panel
    2.
    发明授权
    Manufacturing method of thin film transistor array panel 有权
    薄膜晶体管阵列面板的制造方法

    公开(公告)号:US08518731B2

    公开(公告)日:2013-08-27

    申请号:US13310005

    申请日:2011-12-02

    CPC classification number: H01L29/786 H01L27/124 H01L27/1259 H01L29/78645

    Abstract: A manufacturing method of a thin film transistor array panel includes: simultaneously forming a gate conductor and a first electrode on a substrate, using a non-peroxide-based etchant; forming a gate insulating layer on the gate conductor and the first electrode; forming a semiconductor, a source electrode, and a drain electrode on the gate insulating layer; forming a passivation layer on the semiconductor, the source electrode, and the drain electrode; and forming a second electrode layer on the passivation layer.

    Abstract translation: 薄膜晶体管阵列板的制造方法包括:使用非过氧化物的蚀刻剂,在基板上同时形成栅极导体和第一电极; 在所述栅极导体和所述第一电极上形成栅极绝缘层; 在栅极绝缘层上形成半导体,源电极和漏电极; 在半导体,源电极和漏电极上形成钝化层; 以及在所述钝化层上形成第二电极层。

    THIN FILM TRANSISTOR AND MANUFACTURING METHOD THEREOF
    3.
    发明申请
    THIN FILM TRANSISTOR AND MANUFACTURING METHOD THEREOF 审中-公开
    薄膜晶体管及其制造方法

    公开(公告)号:US20120273787A1

    公开(公告)日:2012-11-01

    申请号:US13244086

    申请日:2011-09-23

    CPC classification number: H01L27/1259 G02F1/136286

    Abstract: In a thin film transistor array panel according to an exemplary embodiment of the present invention, a plasma process using a mixed gas including hydrogen gas and nitrogen gas with a ratio of a predetermined value is undertaken before depositing a passivation layer. In this manner, performance deterioration of the thin film transistor may be prevented and simultaneously, haze in a transparent electrode may be prevented. Alternatively, a first passivation layer is depsoited, then removed. A passivation layer is again re-deposited, such that little or no haze is present in the resulting passivation layer.

    Abstract translation: 在根据本发明的示例性实施例的薄膜晶体管阵列面板中,在沉积钝化层之前进行使用包括氢气和含有预定值的氮气的混合气体的等离子体处理。 以这种方式,可以防止薄膜晶体管的性能恶化,并且同时可以防止透明电极中的雾度。 或者,第一钝化层被剥离,然后除去。 再次沉积钝化层,使得在所得钝化层中存在很少或没有雾度。

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