摘要:
A memory circuit includes at least one memory cell for storing a charge representative of a datum. The memory cell is coupled with a word line and a first bit line. At least one bit line equalization transistor is coupled between the first bit line and a second bit line. A bit line equalization circuit is coupled with the bit line equalization transistor. The bit line equalization circuit is configured for providing a pulse to the bit line equalization transistor to substantially equalize voltages of the first bit line and the second bit line during a standby period before an access cycle of the memory cell.
摘要:
A memory circuit includes at least one memory cell for storing a charge representative of a datum. The memory cell is coupled with a word line and a first bit line. At least one bit line equalization transistor is coupled between the first bit line and a second bit line. A bit line equalization circuit is coupled with the bit line equalization transistor. The bit line equalization circuit is configured for providing a pulse to the bit line equalization transistor to substantially equalize voltages of the first bit line and the second bit line during a standby period before an access cycle of the memory cell.
摘要:
A SRAM device according to the present invention performs a stable data latch operation. The present invention provides a negative voltage generator which is coupled to the drive transistors in the SRAM device for providing negative voltage for the drive transistors during a read cycle of the SRAM device when a word line of the SRAM device is activated. The negative voltage generator includes an output terminal coupled to access transistors, a current path for discharging the output terminal up to a ground voltage level in response to control signals, and a pump for pumping the output terminal to make the output terminal be in a negative voltage level.
摘要:
A redundancy circuit of a semiconductor memory device is provided, including: a plurality of repairing word lines for repairing the normal word line connected to a failed cell; a plurality of repairing paths for selecting a random repairing word line of the repairing word lines; and at least one comparing means for enabling at least two repairing word lines in case the respective paths corresponding to the same address on the normal decoding path and the repairing path are simultaneously enabled, whereby the normal word line of the failed cell is simultaneously enabled with at least two repairing word lines.
摘要:
A bit line sense-amplifier for a semiconductor memory device and a method for driving the same do not apply a bit line precharge voltage by a switch in an equalization operation, perform an equalization operation by interconnecting a plurality of sense-amplifier lines, then perform a precharge operation by applying a bit line precharge voltage through NMOS transistor of the switch, increase a sensing speed by reducing a loading of a sense-amplifier, reduce a transient current, and minimize a power-consumption by performing a precharge operation after a bit line equalization.